Vertex 80v ft ir spectrometers

The hybrid composites were characterized using Vertex 80v FT-IR Spectrometers (Bruker, Billerica, USA) that provide excellent sensitivity and stability. The XRD patterns of the hybrid composites were studied using high resolution X-ray diffractometry—X’pert PRO MRD (Philips/Panalytical, Malvern, UK). FE-SEM—S-4300SE (Hitachi, Tokyo, Japan) was used to study the morphological analysis of the fabricated hybrid composite materials. FE-TEM—JEM-2100F (Jeol, Akishima, Japan) was used to characterize the hybrid composites to study its structure, thickness, and diameter. The elemental analysis of the composite was performed using X-ray photoelectron spectroscopy—K-Alpha (Thermo Fisher Scientific, Waltham, MA, USA).

FTIR spectroscopy of the hybrid composites was conducted using the Vertex 80 v FT-IR Spectrometers (Bruker, Billerica, MA, USA). XRD of the hybrid composites was investigated using an X’pert PRO MRD (Philips/Panalytical, Malvern, UK). The surface morphologies of the hybrid composites were analyzed using the FE-SEM—S-4300SE (Hitachi, Tokyo, Japan). The morphological structure, thickness, and diameter of the hybrid composites were investigated by FE-TEM—JEM-2100F (Jeol, Akishima, Japan). X-ray photoelectron spectroscopy (XPS, K-Alpha, Thermo Fisher Scientific, Waltham, MA, USA) was used to analyze the elemental composition of the composite materials. The QCM controller system (QCM200, Stanford Research System, Sunnyvale, CA, USA) was used to measure the frequency changes during adsorption and desorption.