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Emitech sc7620

Manufactured by Quorum Technologies
Sourced in United Kingdom

The Emitech SC7620 is a sputter coater used for the deposition of thin conductive films on samples for scanning electron microscopy (SEM) and other analytical techniques. It operates by generating a plasma discharge that sputters material from a target, which is then deposited onto the sample surface.

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16 protocols using emitech sc7620

1

Fracture Analysis via Stereomicroscopy and SEM

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Fracture analysis was firstly performed by means of a binocular stereomicroscope (Discovery V20, Carl Zeiss, Göttingen, Germany) for determination of the spatial relationships of the observed fracture features [33 ,34 ]. The fragments were then cleaned in an ultrasonic bath (Ultrasonic CD-4820, Shenzhen Codyson Electrical Ltd, Guangdong, China) with isopropyl alcohol for 10 min, dried, and coated by gold-sputtering (Emitech SC7620, Quorum Technologies Ltd, Laughton, UK). They were then analyzed by scanning electron microscopy (INSPECT S50, FEI, Brno, Czech Republic).
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2

Morphological Characterization of Fibreboards

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The fibreboards were morphologically characterized at two levels. Optical images of both the surface/appearance and fractures (from impact tests) were collected in a stereoscopic microscope Olympus model SZX7 (Barcelona, Spain) with a maximum magnification of 56×. Detailed images of fractured samples from impact tests were observed by scanning electron microscopy (SEM) in a Phenom microscope from FEI Company (Eindhoven, The Netherlands) at an acceleration voltage of 5 kV. Samples were subjected to a metallization process with gold in a sputter-coater Emitech SC7620 from Quorum Technologies (East Sussex, UK).
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3

Characterizing Composite Morphology via FESEM

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In order to know more about the structure of the composites, the morphology of fractured samples from impact tests was studied. To obtain the correct information, field emission scanning electron microscopy (FESEM) in a ZEISS ULTRA 55 microscope supplied by Oxford Instruments (Abingdon, UK) was used. Samples were sputtered before the observation. To this effect, a vacuum chamber EMITECH SC7620 from Quorum Technologies, Ltd. (East Sussex, UK) was employed to apply a thin coating with a gold-palladium alloy. The FESEM was operated at an acceleration voltage of 2 kV. For MAS particle observation, the same conditions were employed. For the size characterization of the particles, ImageJ software was employed for the measurements (https://imagej.net, accessed on 18 May 2023).
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4

NP-Functionalization of Medical-Grade EVA

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Specimens of medical grade EVA (Data Plastics, Witney, Oxfordshire, UK), measuring 7×7×3 mM, were coated with the NPs as follows: 200 mL of the colloidal suspension was prepared using freshly prepared reagents (to prevent hydrolysis of the HMP which may occur during lengthy storage). Each polymer specimen was cleaned by 10 minutes ultrasonication in industrial methylated spirits (IMS) and dried in air, then immersed in the rapidly stirred colloid for 30 seconds, removed and immersed in deionized water for 10 seconds to rinse, blotted using absorbent tissue to remove excess liquid, and allowed to dry in air.
The NP-functionalized specimens were examined using tapping mode atomic force microscopy (AFM; Nanoscope III; Digital Instruments, Santa Barbara, CA, USA). Specimens were subsequently coated with gold-palladium alloy using a sputter coating unit (Emitech SC7620; Quorum Technologies, Lewes, UK) and subjected to scanning electron microscopy (SEM; Phenom, Eindhoven, Netherlands).
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5

Morphological Characterization of RCF

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Morphology of RCF was analyzed in a stereomicroscope system SZX7 model from Olympus (Tokyo, Japan) using an ocular magnifying glass of 50×. This was equipped with a KL1500-LCD light source. Fracture surfaces of the pieces after the impact tests were observed by FESEM in a CARL ZEISS Ultra-55 FESEM microscope from Oxford Instruments (Abingdon, UK). To provide conducting properties, the samples were previously covered with a with a 5–7 nm gold-palladium layer in vacuum conditions in a cathodic sputter-coater Emitech SC7620 from Quorum Technologies LTD (East Sussex, UK). The acceleration voltage during FESEM analysis was set to 2.0 kV.
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6

Morphology Analysis of PBS/ASF/MLO Composites

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The morphology of PBS/ASF/MLO composites was studied by field emission scanning electron microscopy (FESEM) in a FESEM model ZEISS ULTRA 55 from Oxford Instruments (Abingdon, UK). Fractured samples from impact tests were subjected to a sputtering process with an aurum-palladium alloy inside a sputter coater model EMITECH SC7620 from Quorum Technologies (East Sussex, UK).
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7

Ultrastructural Visualization of Parasitic Worms

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Adult worms were fixed in 3% (w/v) ultra-pure glutaraldehyde (Sigma-Aldrich, USA), and immersed in 50 mM PBS pH 7.4 for 3 h at 4 °C, then five times rinsed with PBS during 30 min. Subsequently, worms were re-fixed in 1% (w/v) osmium tetroxide (Sigma-Aldrich, USA) in 50 mM PBS pH 7.4 for two hours, then washed and overnight remained in PBS. Parasites were gradually dehydrated using ethanol solutions, immersed in xylene and dried with critical point dryers (K850, Quorum, UK). Worms were stored under desiccation at 23±2 °C until further processing for SEM. Specimens were mounted onto stubs by conductive double-sided adhesive tape, sputter-coated with a thin layer of gold by Emitech SC7620 (Quorum, UK) and viewed by SEM (AIS2100, Seron, South Korea) (22 , 23 (link)).
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8

Fracture Surface Analysis of Impact Specimens

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Field emission scanning electron microscopy (FESEM) from the fracture surface of the impact specimens was carried out on a Carl Zeiss AG Ultra 55 microscope (Oberkochen, Germany) at 1 kV, displaying a resolution of 1.7 nm. Prior to investigations, each sample was sputter-coated with a thin layer of gold to avoid electrostatic charging under the electron beam with of a Sputter Mod Coater Emitech SC7620 from Quorum Technologies (East Sussex, UK).
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9

Fracture Surface Analysis of Injection-Molded Samples

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The fracture surfaces of the injection-molded samples after the impact test were covered with a thin metal layer to provide the conducting properties for analysis by field emission scanning electron microscopy (FESEM). The sputtering process was carried out in a cathodic sputter-coater Emitech SC7620 from Quorum Technologies LTD (East Sussex, UK). Subsequently, the morphologies were observed in a CARL ZEISS Ultra-55 FESEM microscope from Oxford Instruments (Abingdon, UK). The acceleration voltage was set to 2.0 kV.
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10

Scaffold Characterization by SEM and XPS

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The morphology of the COL/PCL, COL/PCL/nHA, COL/PCL-SBF, and COL/PCL/nHA-SBF scaffolds was studied by scanning electron microscopy (Siron 200; FEI, Hillsboro, OR, USA) after sputter coating with gold (Emitech SC7620; Quorum Technologies Ltd, Ashford, UK). The elemental composition of each type of scaffold was examined by energy dispersive X-ray spectroscopy (Edax, Phoenix, AZ, USA).
The hydrophilic/hydrophobic nature of the two types of mineralized scaffold was measured using a water contact angle measuring instrument (JJ2000B2; Powereach, Shanghai, People’s Republic of China). Deionized water was dropped onto the scaffolds in three different positions and average readings were taken.
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