AFM experiments were conducted directly on the carbon-coated copper grid used for TEM analysis. AFM images were recorded with a Cypher ES (Asylum Research, CA, USA). The images of the cylindrical micelle were acquired in tapping mode in ambient environment.
Cypher es
Manufactured by Oxford Instruments
Sourced in United States, United Kingdom
The Cypher ES is a high-performance atomic force microscope (AFM) designed for research and development applications. It provides high-resolution imaging and nanoscale characterization capabilities across a wide range of sample types and environments.
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35 protocols using cypher es
1
Analyzing Cylindrical Micelles via AFM
2
Characterization of Zinc Anodes in Potassium Titanium Niobate Batteries
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The coin cells were disassembled to obtain the cycled anodes. The protective layers on the cycled Zn anodes were removed by methyl‐2‐pyrrolidinone (NMP) to dissolve PVDF binder before characterization. The phase structure of t‐KTN crystal was determined by X‐ray diffractometry (XRD, Bruker D8) with Cu Kα radiation (λ = 1.5406 Å). The morphologies of the obtained t‐KTN and Zn anodes were examined using SEM (ZEISS Supra 40) equipped with an energy dispersive X‐ray (EDX) spectrometer. TEM, high angle annular dark‐field scanning transmission electron microscopy (HAADF‐STEM) were performed using FEI Titan G2 80–200 microscope operating at 200 kV. The polarization microscope images were observed by a polarizing microscope (Axioskop40, Zeiss). The vertical piezo‐response force microscopy (V‐PFM) images were obtained by using a commercial microscope (Cypher ES, Asylum Research) with conductive Pt/Ir‐coating probes (EFM, Nanoworld). The applied voltage was 500 mV. Contact angle measurements were conducted by using a KRUSS DSA100 machine. The CLSM images of samples have been collected on Keyence VK‐X200 microscope.
3
Bacterial Cell Morphology Characterization
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S. pneumonia ATCC49619 cells and S. pneumonia 16167 cells were grown in MHB at 37°C under constant shaking at 220 rpm, respectively. The cultures were collected during the exponential phase by centrifugation at 3,000 rpm for 10 minutes and were resuspended in peptone water. Bacterial cells were incubated with 1× MIC of PEGylated Nano-BA12K at 37°C. The negative control was run with MHB, whereas Penicillin G was used as a positive control. After incubation, the bacterial cells were collected by centrifugation at 3,000 rpm for 10 minutes. The cell pellets were then harvested, washed thrice with 10 mM PBS, and resuspended in PBS. Images of the cells were visualized directly in air with a tapping mode AFM (Cypher™ ES; Asylum Research, Abingdon, UK). The height and size information were acquired using Imaging software.
4
AFM Imaging and Layer Scratching
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AFM imaging was performed with a Cypher ES (Asylum Research) system at 32 °C in tapping mode at the air/solid interface. OMCL-AC160TS-R3 probes (spring constant ∼26 N/m) with a resonance frequency around 100 kHz were used. OMCL-AC240TS-R3 probes (spring constant ∼2 N/m) with a resonance frequency around 70 kHz were used for scratching the functionalized layer.
5
Piezoelectric Characterization of PTFE Membranes
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PTFE powders are difficult to pretreat with tensile and electric field, and on top of this powders are not suitable for PFM analysis. Thus, a PTFE membrane was used instead of PTFE powder for the PFM characterization experiments. A piece of 20 mm diameter PTFE membrane was put through a range of treatments including ultrasound irradiation, compaction, tensile testing, and electric field prior to PFM analysis. The PTFE and PVDF membrane piezoelectric properties were obtained using a commercial piezoresponse force microscopy (PFM) (Asylum Research Cypher-ES). PFM is a modification of atomic force microscopy (AFM), with application of a 1.0 V alternating drive voltage on the conductive AFM tip.
6
AFM-based Photoinduced Surface Potential
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A fiber-coupled
LED (M365FP1, Thorlabs Inc.) was used for illuminating the sample
(wavelength 365 nm). The light beam was introduced in the optical
path of a Cypher ES (Asylum Research, Oxford Instruments) AFM head
through a dichroic hot mirror. We checked the consistency and stability
of the PtIr tip work function by performing AP-KPFM measurements on
graphite because the CPD is insensitive to light exposure when the
metal coating is intact. The illumination calibration was performed
with the silicon photodiode (UV extended) S120VC from Thorlabs. More
details can be found in theSupporting Information (section 13).
LED (M365FP1, Thorlabs Inc.) was used for illuminating the sample
(wavelength 365 nm). The light beam was introduced in the optical
path of a Cypher ES (Asylum Research, Oxford Instruments) AFM head
through a dichroic hot mirror. We checked the consistency and stability
of the PtIr tip work function by performing AP-KPFM measurements on
graphite because the CPD is insensitive to light exposure when the
metal coating is intact. The illumination calibration was performed
with the silicon photodiode (UV extended) S120VC from Thorlabs. More
details can be found in the
7
Structural and Piezoelectric Analysis of ZnO Nano/Microwires
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The morphology of nano/microwires and the thickness of HfO2 layer deposited on ZnO were characterized by transmission electron microscopy (TEM) (JEM-2100F) and scanning electron microscopy (SEM) (SU8020, Hitachi). The X-ray diffraction spectrum of materials were characterized by Bruker D8 ADVANCE. The piezoelectricity of ZnO nano/microwires was investigated using AFM (Cypher ES, Asylum Research) with PFM (piezoresponse force microscopy) modes.
8
Characterizing Surface Properties of Protein Complexes
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HR1, HR2 (10 µM) or their mixture was incubated with 10 µM Kae at room temperature for 30 min. The control samples were incubated with DMSO. Then, the sample was dropped onto freshly pealed mica slices and left to air dry at room temperature. The surface properties of the samples were characterized by AFM (Cypher ES, Asylum Research, Oxford Instruments, Santa Barbara, CA, USA) in the tapping mode in air. The images were analyzed using Asylum Research Real Time software (version 18.04.23).
9
Characterization of ZnO Nanostructures
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The morphology of nanowires and the thickness of the HfO2 layer deposited on ZnO were characterized utilizing a TEM (JEM-2100F) and a SEM (SU8020, Hitachi). The X-ray diffraction spectra of materials were characterized by Bruker D8 ADVANCE. The piezoelectricity of ZnO nano/microwire was investigated by AFM (Cypher ES, Asylum Research) with PFM (piezoresponse force microscopy) mode.
10
Multiscale Microscopic Analysis of Samples
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The morphology and surface of the samples were examined by an optical microscope (Carl Zeiss Microscopy, Germany), SEM (5 kV, Hitachi SU8010, Japan) and AFM (Cypher ES, Asylum Research, USA). Raman and PL spectra were collected using 532 nm laser excitation with a beam size of ∼1 μm (Horiba LabRAB HR Evolution Japan). Chemical elemental analyses of the samples were conducted by XPS (monochromatic Al Kα X-rays, 1486.6 eV, PHI VersaProbe II, Japan). HAADF-STEM images were taken by an aberration-corrected TEM (FEI Titan Cube Themis G2 with a field emission gun at 60 kV, USA), with a resolution of 0.8 Å. The acquisition parameters were set as below, i.e. probe size of 9, condenser lens aperture of 50 μm, and camera length of 145 mm.
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