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Jsm 6510 lv sem microscope

Manufactured by JEOL
Sourced in Japan

The JSM-6510 LV SEM Microscope is a low-vacuum scanning electron microscope (SEM) produced by JEOL. It is designed to provide high-quality imaging and analysis of a wide range of samples, including non-conductive and moisture-containing materials. The microscope features a tungsten thermionic electron gun, a variable pressure chamber, and a secondary electron detector for acquiring images. The JSM-6510 LV SEM Microscope is a versatile tool for various applications in materials science, nanotechnology, and other related fields.

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5 protocols using jsm 6510 lv sem microscope

1

Scanning Electron Microscopy of Sputtered Samples

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Scanning electron microscopy (SEM) images were obtained using a JEOL JSM-6510 LV SEM Microscope (JEOL Ltd., Tokyo, Japan) equipped with an X-Act EDS-detector by Oxford Instruments, Abingdon, Oxfordshire, UK (an acceleration voltage of 5 kV was applied). The specimens were sputtered with an Au-Pd thin film (4–8 nm) using a mini sputter coater SC7620 from Quorum Technologies LTD (Kent, UK).
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2

Scanning Electron Microscopy Elemental Analysis

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Scanning electron microscopy (SEM) images were obtained using a JEOL JSM-6510 LV SEM Microscope (JEOL Ltd., Tokyo, Japan) equipped with an X-Act EDS detector by Oxford Instruments, Abingdon, Oxfordshire, UK (an acceleration voltage of 20 kV was applied) for elemental and mapping analysis. The specimens were sputtered with an Au-Pd thin film (4–8 nm) using a mini sputter coater SC7620 from Quorum Technologies LTD (Kent, UK).
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3

Scanning Electron Microscopy Protocol

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Scanning electron microscopy (SEM) is a rapid and accurate method for examining the surface morphology and microstructures of a material. SEM pictures and energy-dispersive X-ray spectroscopy (EDX) data were acquired using TESCAN VEGA COMPACT SEM with Tungsten Filament as electron source and attached EDX detector JEOL JSM-6510 LV SEM Microscope (Kohoutovice, Czech Republic). The SEM was operated at a voltage of 10 kV.
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4

Mite Identification and Measurement Protocol

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Mites were collected from ants or ant nests and mounted in Hoyer’s medium. The terminology of idiosoma and legs follows Lindquist (1986) ; the nomenclature of subcapitular setae and the designation of cheliceral setae follow Grandjean (1944 , 1947 ), respectively. The system of Pygmephoroidea follows Khaustov (2004 , 2008 ). All measurements are given in micrometers (μm). For leg chaetotaxy the number of solenidia is given in parentheses. The studied material is deposited in the mite collection of the Tyumen State University Museum of Zoology, Tyumen, Russia. SEM photographs were made with the aid of JEOL–JSM-6510LV SEM microscope.
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5

X-ray Photoelectron Spectroscopy and Scanning Electron Microscopy Characterization

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X-ray photoelectron spectroscopy (XPS) measurements were performed in an ultrahigh vacuum at a base pressure of 7 × 10−9 mbar with a SPECS GmbH spectrometer equipped with a monochromatic MgKa source (hv = 1253.6 eV) and a Phoibos-100 hemispherical analyzer (Berlin, Germany). The spectra were collected in normal emission and the energy resolution was set to 1.16 eV to minimize measuring time. The spectral analysis, including a Shirley background subtraction and a peak deconvolution employing mixed Gaussian-Lorentzian functions, was performed in a least squares curve-fitting program (WinSpec) developed at the Laboratoire Interdisciplinaire de Spectroscopie Electronique, University of Namur, Namur, Belgium.
Scanning electron microscopy (SEM) images were obtained using a JEOL JSM-6510 LV SEM Microscope (JEOL Ltd., Tokyo, Japan) equipped with an X–Act EDS-detector by Oxford Instruments, Abingdon, Oxfordshire, UK (an acceleration voltage of 20 kV was applied). Prior to SEM analysis, the samples were coated with an Au/Pd thin film (4–8 nm) in a sputtering machine (SC7620, Quorum Technologies, Lewes, UK).
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