Jsm 6510 lv sem microscope
The JSM-6510 LV SEM Microscope is a low-vacuum scanning electron microscope (SEM) produced by JEOL. It is designed to provide high-quality imaging and analysis of a wide range of samples, including non-conductive and moisture-containing materials. The microscope features a tungsten thermionic electron gun, a variable pressure chamber, and a secondary electron detector for acquiring images. The JSM-6510 LV SEM Microscope is a versatile tool for various applications in materials science, nanotechnology, and other related fields.
Lab products found in correlation
5 protocols using jsm 6510 lv sem microscope
Scanning Electron Microscopy of Sputtered Samples
Scanning Electron Microscopy Elemental Analysis
Scanning Electron Microscopy Protocol
Mite Identification and Measurement Protocol
X-ray Photoelectron Spectroscopy and Scanning Electron Microscopy Characterization
Scanning electron microscopy (SEM) images were obtained using a JEOL JSM-6510 LV SEM Microscope (JEOL Ltd., Tokyo, Japan) equipped with an X–Act EDS-detector by Oxford Instruments, Abingdon, Oxfordshire, UK (an acceleration voltage of 20 kV was applied). Prior to SEM analysis, the samples were coated with an Au/Pd thin film (4–8 nm) in a sputtering machine (SC7620, Quorum Technologies, Lewes, UK).
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