Jsm 7610f
The JSM-7610F is a field emission scanning electron microscope (FE-SEM) manufactured by Hitachi. It is designed to provide high-resolution imaging of samples at the nanoscale level. The JSM-7610F utilizes a field emission electron gun to generate a stable and high-brightness electron beam, enabling detailed observation of a wide range of materials.
Lab products found in correlation
9 protocols using jsm 7610f
Comprehensive Characterization of CuCrO2 Thin Films
Electrochemical Characterization of Copper Tungstate
Char Characterization of Coatings
Comprehensive Characterization of Synthesized Materials
Surfactant Adsorption Morphologies Analyzed
adsorption morphologies of the surfactants were observed by AFM (Multimode
8) in tapping mode. The oleophilic core surface was obtained as described
earlier. The samples were prepared by immersing the oleophilic cores
into 0.3 wt % LDEA and 0.1 wt % HLDEA (near the CMC) at 75 °C
for 10 min and dried by nitrogen flow. The morphologies were characterized
for comparison.
A gold-plated probe (NPG-10) was functionalized
with a 5 wt % N-dodecanethiol solution in ethanol
via Au–S bonding to fabricate the dodecane-functionalized hydrophobic
probe.30 (link) Straight-chain alkanes were used
to simulate the hydrophobic components of crude oil. Successful preparation
of the hydrophobic probe was confirmed with scanning electron microscopy
(SEM, JSM-7610F) and energy-dispersive spectrometry (EDS, S-4800 Hitachi),
as shown in
environment, the adhesive forces between the hydrophobic probe and
oleophilic cores treated with 0.3 wt % LDEA and 0.1 wt % HLDEA (near
the CMC) were measured in force-volume mode.
Comprehensive Characterization of MAPbI3 Perovskite
Characterization of Hydrothermally Synthesized Nanocomposites
Evaluating Coating Cracking Resistance
Comprehensive Analysis of Cu/Ni/TiO2/MWCNTs Nanocomposites
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