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Uv 1800 pc uv vis spectrophotometer

Manufactured by MAPADA
Sourced in China

The UV-1800(PC) UV-vis spectrophotometer is a laboratory instrument designed to measure the absorption of light by a sample in the ultraviolet and visible light spectrum. It is capable of quantifying the concentration of chemical species in a solution by analyzing the amount of light absorbed at specific wavelengths.

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2 protocols using uv 1800 pc uv vis spectrophotometer

1

Characterization of Carbon Nanomaterials

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Transmission electron microscopy (TEM) images were taken with a JEM-1011 electron microscope (JEOL, Tokyo,, Japan) at an accelerating voltage of 100 kV. Ultraviolet-visible (UV-vis) absorption of the obtained CNPs solution was carried on a UV-1800(PC) UV-vis spectrophotometer (Mapada, Shang Hai, China). X-ray photoelectron spectroscopy (XPS) analysis was carried on a PHI 5000 Versa-probe X-ray photoelectron spectrometer (JEOL, Tokyo, Japan). All fluorescence spectra of the CDs were measured with a FluoroMax-4 spectrofluorometer (Horiba Scientific, Kyoto, Japan) with a slit width of 5 nm for both excitation and emission.
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2

Comprehensive Characterization of Carbon Dots

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Transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM) images were recorded on JEOL JEM-1011 and JEOL JSM-2100, respectively. The CDs were drop-cast onto 400-mesh carbon-coated Cu grids followed by drying in open air at room temperature. The fluorescence spectra of the CDs were recorded on a FluoroMax-4 spectrofluorometer (Horiba Scientific, Japan). X-ray diffraction (XRD) pattern was performed by using a D8 Advance X-ray diffractometer (Bruker) with Cu Kα radiation. Raman spectra were acquired on a Lab RAM Aramis spectrometer (Horiba Scientific, Japan). Fourier transform infrared (FTIR) spectra were measured on Vector-22 spectrometer (Bruker) ranging from 500 to 4000 cm−1, and the samples were dispersed in KBr pellets. Ultraviolet-visible (UV-vis) absorption of the CDs solution was obtained using an UV-1800(PC) UV-vis spectrophotometer (Mapada). X-ray photoelectron spectroscopy (XPS) measurements were performed on a PHI 5000 VersaProbe spectrometer (UlVAC-PHI, Japan). The fluorescence confocal images were obtained using a Leica TCS SP5 confocal scanning microscope (Leica Microsystems, Heidelberg GmbH, Mannheim, Germany). The specimens were excited at 488 nm, and the emission was detected from 500 to 530 nm.
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