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Model d max rc x ray diffractometer

Manufactured by Thermo Fisher Scientific

The Model D/max-rC X-ray diffractometer is a laboratory instrument designed for the analysis of crystalline materials. It utilizes X-ray diffraction technology to identify and characterize the atomic and molecular structure of various solid-state samples. The instrument's core function is to provide detailed information about the crystal structure, phase composition, and other structural properties of the analyzed materials.

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2 protocols using model d max rc x ray diffractometer

1

Comprehensive Characterization of Material Samples

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The morphology and particle size of the samples were investigated using a JEOL JEM-2010 transmission electron microscopy (TEM) operated at an accelerating potential of 200 kV. Scanning electron microscopy (SEM) images were captured on a Hitachi S-4800 scanning electron microscope, operating at 5 kV. X-ray diffraction (XRD) patterns were performed on Model D/max-rC X-ray diffractometer using Cu Kα radiation source (λ = 1.5406 Å) and operating at 40 kV and 100 mA. X-ray photoelectron spectroscopy (XPS) measurements were carried out on a Thermo VG Scientific ESCALAB 250 spectrometer with a monochromatic Al Kα X-ray source (1486.6 eV photons). The binding energy was calibrated with respect to C1s at 284.6 eV. The compositions of the catalysts were determined using the energy dispersive X-ray (EDX) technique. The Brunauer-Emmett-Teller (BET) specific surface area and pore size distribution were measured at 77 K using a Micromeritics ASAP 2050 system. Fourier transform infrared (FTIR) spectrum was recorded with a Nicolet 520 SXFTIR spectrometer. The UV-vis spectra were recorded at room temperature on a UV3600 spectrophotometer. Thermal analysis was performed on a Perkin Elmer thermogravimetric analyzer under air atmosphere with a heating rate of 10 °C min−1.
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2

Characterization of Catalytic Nanomaterials

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Transmission electron microscopy (TEM) images and energy-dispersive X-ray spectroscopy (EDX) elemental mapping patterns were taken using a JEOL JEM-2100F transmission electron microscopy operated at 200 kV. The samples were prepared by placing a drop of the colloidal solution or catalyst powder dispersion in ethanol solution (99%) on a carbon film coated Cu grid (3 mm, 300 mesh), followed by drying under ambient conditions. X-ray diffraction (XRD) patterns were obtained on a Model D/max-rC X-ray diffractometer using Cu Ka radiation source (λ = 1.5406 Å) and operating at 40 kV and 100 mA. High-resolution X-ray photoelectron spectroscopy (XPS) was carried out on a Thermo VG Scientific ESCALAB 250 spectrometer with an Al Kα radiator. The binding energy was calibrated by means of the C 1s peak energy of 284.6 eV.
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