Scanning electron micrographs were taken with an FEI Quanta 650 FEG ESEM with a beam energy of 30.0 kV. All images were taken directly from the ITO working electrode after the sample preparation.
Quanta 650 feg esem
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Quanta 650 FEG ESEM is a high-resolution field emission scanning electron microscope (ESEM) designed for advanced material characterization. It features a field emission electron source, which provides high-brightness, high-resolution imaging capabilities. The Quanta 650 FEG ESEM allows for the examination of samples in their natural state without the need for extensive sample preparation.
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Lab products found in correlation
Magellan 400l xhr sem, by Thermo Fisher Scientific (1 mentions)
Magellan 400l, by Thermo Fisher Scientific (1 mentions)
Tecnai f20, by Thermo Fisher Scientific (1 mentions)
T64000 raman spectrometer, by Horiba (1 mentions)
Nanoscope 4 controller, by Veeco (1 mentions)
Autolab 20, by Metrohm (1 mentions)
Isotemp, by Thermo Fisher Scientific (1 mentions)
11 protocols using quanta 650 feg esem
1
Scanning Electron Microscopy of ITO Electrode
2
Sediment Analysis using SEM-EDS
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For SEM analyses, a small
aliquot of sediment slurry was dried and mounted on SEM stubs. SEM
scans with energy dispersive X-ray spectra (EDS) were collected using
a FEI Quanta 650 FEG ESEM in low vacuum mode.
aliquot of sediment slurry was dried and mounted on SEM stubs. SEM
scans with energy dispersive X-ray spectra (EDS) were collected using
a FEI Quanta 650 FEG ESEM in low vacuum mode.
3
Strontium Removal in Sediments Analyzed
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At the final time point
investigating strontium removal, homogeneous sediment samples were
removed from selected microcosms and analyzed by X-ray absorption
spectroscopy (XAS) at the DIAMOND Lightsource, Harwell, UK. Sr K-edge (16,105.55 eV) X-ray absorption near edge spectroscopy
(XANES) and extended X-ray absorption fine structure (EXAFS) analyses
were conducted to determine the coordination environment of Sr2+ in the samples studied. The samples were stored at −80
°C prior to analysis on Beamline B18, where they were loaded
into a liquid N2-cooled cryostat. XANES and EXAFS data
were obtained in fluorescence mode using a 36-element solid state
Ge detector. Data were background subtracted and drift corrected using
the software package ATHENA.77 (link) EXAFS modeling
was conducted using the package ARTEMIS.77 (link) The F-test was used to statistically determine whether the addition
of a coordination path improved the fit of a model relative to the
spectral data.78 (link)Further solid-phase
characterization of the Sr-bearing precipitates within selected samples
was conducted using environmental scanning electron microscopy (ESEM)
and associated elemental mapping. This involved mounting a small quantity
of dried sediment slurry onto aluminum stubs using carbon tape. ESEM
images with energy dispersive X-ray analysis (EDS) were collected
using a FEI Quanta 650 FEG ESEM in low vacuum mode.
investigating strontium removal, homogeneous sediment samples were
removed from selected microcosms and analyzed by X-ray absorption
spectroscopy (XAS) at the DIAMOND Lightsource, Harwell, UK. Sr K-edge (16,105.55 eV) X-ray absorption near edge spectroscopy
(XANES) and extended X-ray absorption fine structure (EXAFS) analyses
were conducted to determine the coordination environment of Sr2+ in the samples studied. The samples were stored at −80
°C prior to analysis on Beamline B18, where they were loaded
into a liquid N2-cooled cryostat. XANES and EXAFS data
were obtained in fluorescence mode using a 36-element solid state
Ge detector. Data were background subtracted and drift corrected using
the software package ATHENA.77 (link) EXAFS modeling
was conducted using the package ARTEMIS.77 (link) The F-test was used to statistically determine whether the addition
of a coordination path improved the fit of a model relative to the
spectral data.78 (link)Further solid-phase
characterization of the Sr-bearing precipitates within selected samples
was conducted using environmental scanning electron microscopy (ESEM)
and associated elemental mapping. This involved mounting a small quantity
of dried sediment slurry onto aluminum stubs using carbon tape. ESEM
images with energy dispersive X-ray analysis (EDS) were collected
using a FEI Quanta 650 FEG ESEM in low vacuum mode.
4
Morphological and Elemental Analysis of MSWI Fly Ash
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The small-size blocky samples of MSWI fly ash after solidification and stabilization treatments were used to analyze the morphological structures and elemental composition information by using a scanning electron microscope (SEM) equipped with energy dispersive spectroscopic (EDS). The SEM-EDS used was a FEI Quanta 650 FEG ESEM operated in electron detection mode with high-vacuum and an acceleration voltage of 10~20 kV.
5
Characterization of Nanostructured Films
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For the
morphological and elemental characterization of the generated nanostructured
films, a Magellan 400L XHR SEM (FEI, Hillsboro, OR) instrument and
a Quanta 650 FEG ESEM (FEI, Hillsboro, OR) instrument were used for
scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy
(EDX) analysis. The MNP size distribution (calculated on an average
number of 200 MNPs) was evaluated with “ImageJ, v.1.49.p”.
X-ray photoelectron spectroscopy (XPS) measurements were performed
using a SPECS PHOIBOS 150 hemispherical analyzer (SPECS GmbH, Berlin,
Germany), with a base pressure of 5 × 10–10 mbar, using a monochromatic Al K-alpha radiation (1486.74 eV) as
the excitation source. The XPS spectral deconvolution and the identification
of the peaks were run—following the technique described by
Sen et al.31 (link)—through the Gaussian–Lorentzian
fitting method,
after smoothing and subtraction of the Shirley-shaped background.
A confocal Raman spectrometer alpha300r (WITec, Ulm, German) equipped
with a 488 nm laser, using a 1.5 mW laser power, a grating 600 g/nm,
and objective 50×, was employed, using an exposure time of 10
s and three accumulations for each spectrum.
morphological and elemental characterization of the generated nanostructured
films, a Magellan 400L XHR SEM (FEI, Hillsboro, OR) instrument and
a Quanta 650 FEG ESEM (FEI, Hillsboro, OR) instrument were used for
scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy
(EDX) analysis. The MNP size distribution (calculated on an average
number of 200 MNPs) was evaluated with “ImageJ, v.1.49.p”.
X-ray photoelectron spectroscopy (XPS) measurements were performed
using a SPECS PHOIBOS 150 hemispherical analyzer (SPECS GmbH, Berlin,
Germany), with a base pressure of 5 × 10–10 mbar, using a monochromatic Al K-alpha radiation (1486.74 eV) as
the excitation source. The XPS spectral deconvolution and the identification
of the peaks were run—following the technique described by
Sen et al.31 (link)—through the Gaussian–Lorentzian
fitting method,
after smoothing and subtraction of the Shirley-shaped background.
A confocal Raman spectrometer alpha300r (WITec, Ulm, German) equipped
with a 488 nm laser, using a 1.5 mW laser power, a grating 600 g/nm,
and objective 50×, was employed, using an exposure time of 10
s and three accumulations for each spectrum.
6
Multimodal Characterization of Nanomaterials
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Atomic force microscope topographical images were obtained using a Nanoscope IV controller and a Dimension 3100 head (Veeco). SEM images were taken in the FEI Quanta 650FEG ESEM and the FEI MAGELLAN 400L. Raman scattering measurements were performed using the Horiba T64000 Raman spectrometer and a 532 nm laser (cobolt). The Raman spectra at each point was obtained at the same incident laser power (0.3 mW) and integrated for the same amount of time (180 s). Elphy Quantum (Inspect F50 FEI SEM based system) was used for EBL. High-resolution imaging of the structure and morphology of the samples was obtained using the FEI Tecnai F20 in TEM and scanning TEM (STEM) modes.
7
Electrochemical In Situ Cell Culture
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Thermostatic bath ISOTEMP was purchased from Fisher Scientific (Spain). Incubator NU-5100E/GCO2 was purchased from Nuaire (USA). A BIOII A/P biosecurity cabinet (from Telstar, Spain) was used for cells manipulation. TC Flask 75 cm², Multiple Well Cluster Plate, TC-Treated, Sterile, Stripettes individual 25, 10, 5, 2 mL were purchased from Cultek (Spain).
The homemade screen-printed carbon (SPCEs) used as transducers were prepared following the experimental procedure detailed at the Supplementary Material. The experimental set-up for the in situ cell culture/electrochemical detection (AAO membranes assembled to SPCEs) is detailed at the Supplementary Material. Electrochemical measurements were performed with an Autolab 20 (Eco-chemie, The Netherlands) connected to a PC. All the measurements were carried out at room temperature with a working volume of 200 µL, which was enough to cover the three electrodes contained in the SPCEs connected to the potentiostat by a homemade edge connector module. Olympus IX71 (Spain) inverse microscope and Scanning Electrochemical Microscopy FEI Quanta 650 FEG ESEM (The Netherlands) were used for the optical characterizations.
The homemade screen-printed carbon (SPCEs) used as transducers were prepared following the experimental procedure detailed at the Supplementary Material. The experimental set-up for the in situ cell culture/electrochemical detection (AAO membranes assembled to SPCEs) is detailed at the Supplementary Material. Electrochemical measurements were performed with an Autolab 20 (Eco-chemie, The Netherlands) connected to a PC. All the measurements were carried out at room temperature with a working volume of 200 µL, which was enough to cover the three electrodes contained in the SPCEs connected to the potentiostat by a homemade edge connector module. Olympus IX71 (Spain) inverse microscope and Scanning Electrochemical Microscopy FEI Quanta 650 FEG ESEM (The Netherlands) were used for the optical characterizations.
8
Particle Size Analysis Using SEM
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The particle size of the drug in the sieved PFS and the UFS was determined using a scanning electron microscope (Quanta FEG 650 ESEM, FEI Company, Hillsboro, OR, USA). The PFS and UFS were dispensed onto a carbon tape and gold-sputtered (EMS Sputter Coater, Hatfield, PA, USA). The samples were then loaded onto the SEM sample stage and images were captured using a 10 kV accelerated voltage, and 15 µÅ emission current. The working distance for the analysis was maintained at 10 mm, and the spot size was set to 3. To demonstrate the particle size of the drug, the images for the two feedstocks were taken of varying magnifications i.e., 400× for the UFS and 2000× for the PFS. Images of the samples at comparative magnifications can be found in our previously published work [40 (link)].
9
Surface Drug Distribution Analysis
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The drug distribution on the tablet surface was characterized by Quanta FEG 650 ESEM (FEI company, Hillsboro, OR, USA). Before observation, the blank and drug-loaded samples were coated with conductive material by EMS Sputter Coater under vacuum (Hatfield, PA, USA). The images were taken under 200x magnification, and 10 kV accelerated voltage. The element analysis was carried out with the embedded EDX spectroscopy and analyzed by Esprit 2.1 software.
10
Quantitative Cell Morphology Imaging
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The cell morphology of different samples was directly imaged by Quanta FEG 650 ESEM (FEI Ltd., USA) at 200 Pa, 5 ℃ or −5 ℃ with magnification of 20000 × .
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