The surface and internal morphology of CS/PVA hydrogels were investigated using a Quanta 200 Scanning Electron Microscope (FEI Company, Bruno, Czech Republic) and a Verios G4 UC Scanning Electron Microscope (Thermo Scientific, Bruno, Czech Republic) equipped with an energy dispersive X-ray spectrometer (EDS, EDAX Octane Elect Super SDD detector, Ametek, Mahwah, NJ, USA) with a better magnification that allowed the visualization of AgNPs. The samples were coated with 10 nm platinum using a Leica EM ACE200 Sputter coater to provide electrical conductivity and to prevent charge buildup during exposure to the electron beam.
Verios g4 uc scanning electron microscope
Manufactured by Thermo Fisher Scientific
Sourced in Czechia, United States
The Verios G4 UC Scanning Electron Microscope is a high-performance imaging system designed for advanced microscopy applications. It features a high-resolution electron column, precise sample manipulation, and a comprehensive suite of analytical tools.
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Lab products found in correlation
Em ace200 sputter coater, by Leica (8 mentions)
Edax octane elect super sdd detector, by Ametek (2 mentions)
Quanta 200 scanning electron microscope, by Thermo Fisher Scientific (2 mentions)
Octane elect super sdd detector, by Ametek (2 mentions)
High tech ht7700 microscope, by Hitachi (1 mentions)
Nanoscope v614r1, by Digital Instruments (1 mentions)
Silicon tip cantilever, by Bruker (1 mentions)
Nanoscope iiia type multimode, by Digital Instruments (1 mentions)
Lumos ftir microscope spectrometer, by Bruker (1 mentions)
Ht7700 transmission electron microscope, by Hitachi (1 mentions)
17 protocols using verios g4 uc scanning electron microscope
1
Characterization of CS/PVA Hydrogels
2
Morphological Characterization of CS-AgNps
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The morphology of CS-AgNps was analyzed by transmission electron microscopy (TEM) using a Hitachi High-Tech HT7700 microscope (Japan) operated in “high contrast” mode and at a 100 kV acceleration potential. Samples were applied from aqueous suspension (1 mg/mL) to 300 mesh copper grids, coated with carbon and dried under vacuum.
The morphology of films (surface and cross-sections) was observed by SEM through a Verios G4 UC Scanning Electron Microscope (Thermo Scientific, Bruno, Czech Republic) equipped with an energy dispersive X-ray spectrometer (EDS, EDAX Octane Elect Super SDD detector, Ametek, Mahwah, NJ, USA). The samples were coated with 10 nm platinum using a Leica EM ACE200 Sputter coater to provide electrical conductivity and to prevent charge buildup during exposure to the electron beam.
The visualization of the surface films (unloaded and IBF-loaded F #3 sample) was carried out by atomic force microscopy (AFM) using Nanoscope IIIa-type Multimode (Digital Instruments, Tonawanda, NY, USA) equipped with an “E”-type scanner. Amplitude- and height-mode images were captured at room temperature in the air using the tapping mode with a silicon tip cantilever (Bruker Corporation, Billerica, MA, USA) operated at a resonance frequency of 275–300 kHz and at a scan rate of 1.2 Hz. The images were evaluated with the Nanoscope V614r1 software (Digital Instruments, Buffalo, NY, USA).
The morphology of films (surface and cross-sections) was observed by SEM through a Verios G4 UC Scanning Electron Microscope (Thermo Scientific, Bruno, Czech Republic) equipped with an energy dispersive X-ray spectrometer (EDS, EDAX Octane Elect Super SDD detector, Ametek, Mahwah, NJ, USA). The samples were coated with 10 nm platinum using a Leica EM ACE200 Sputter coater to provide electrical conductivity and to prevent charge buildup during exposure to the electron beam.
The visualization of the surface films (unloaded and IBF-loaded F #3 sample) was carried out by atomic force microscopy (AFM) using Nanoscope IIIa-type Multimode (Digital Instruments, Tonawanda, NY, USA) equipped with an “E”-type scanner. Amplitude- and height-mode images were captured at room temperature in the air using the tapping mode with a silicon tip cantilever (Bruker Corporation, Billerica, MA, USA) operated at a resonance frequency of 275–300 kHz and at a scan rate of 1.2 Hz. The images were evaluated with the Nanoscope V614r1 software (Digital Instruments, Buffalo, NY, USA).
3
Microscopic Analysis of AMWP/LLDPE Composites
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The tensile cross-section morphology of microscopic AMWP and AMWP/LLDPE composites was examined by scanning electron microscopy (SEM) using a Verios G4, UC, Scanning Electron Microscope (Thermo Fisher Scientific Inc., Waltham, MA, USA). Briefly, after spraying the samples with gold, the surface morphology was observed under various magnifications while using a 20 kV accelerating voltage. Additionally, by turning the element Ca red, the Ca element distribution in the AMWP/LLDPE composites was ascertained. In this way, it was possible to determine the feature of AMWP dispersion in the AMWP/LLDPE composites.
4
Characterization of Chitosan-Based Membranes with Plant Extracts
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Attenuated total reflection Fourier transform infrared (ATR-FTIR) spectra of the chitosan-based membranes with or without plant extracts were recorded using a Bruker LUMOS FTIR microscope spectrometer (Bruker Corporation, Karlsruhe, Germany) equipped with an ATR reflection module (Attenuated Total Reflection) and a diamond crystal. The previously prepared samples were cut into small pieces, placed directly on the ATR crystal and subjected to IR investigation. All the spectra were collected in the range 500–4000 cm−1, and the measurements were made by averaging 64 scans at a resolution of 2 cm−1. The spectra were recorded at room temperature.
The surface morphology of the chitosan-based membranes with or without plant extracts was studied by scanning electron microscopy (SEM). The samples were cut into small pieces, mounted on a stub, coated with a thin layer of platinum in a sputtering device and then examined on a Verios G4 UC scanning electron microscope (Thermo Scientific, Waltham, MA, USA) equipped with an energy-dispersive X-ray spectroscopy analyzer (Octane Elect Super SDD detector (AMETEK, Tokyo, Japan)).
The surface morphology of the chitosan-based membranes with or without plant extracts was studied by scanning electron microscopy (SEM). The samples were cut into small pieces, mounted on a stub, coated with a thin layer of platinum in a sputtering device and then examined on a Verios G4 UC scanning electron microscope (Thermo Scientific, Waltham, MA, USA) equipped with an energy-dispersive X-ray spectroscopy analyzer (Octane Elect Super SDD detector (AMETEK, Tokyo, Japan)).
5
Characterization of Hydrogel and ZnONPs
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The morphological characteristics of the hydrogels were determined by scanning electron microscopy (SEM) using a Quanta 200 Scanning Electron Microscope (FEI Company, Bruno, Czech Republic). The hydrogels were analyzed in the dry state. This analysis gave us information on the porosity and homogeneity of hydrogels.
The shape and size of ZnONPs were assessed using a HITACHI-HT7700 Transmission Electron Microscope (Hitachi High-Technologies Corporation, Tokyo, Japan).
The elemental composition of the hydrogels and the presence of ZnONPs were demonstrated using a Verios G4 UC Scanning Electron Microscope from Thermo Scientific (Bruno, Czech Republic) equipped with an Octane Elect Super SDD detector (an energy-dispersive X-ray spectrometer from EDAX (Ametek, Mahwah, NJ, USA).
To provide electrical conductivity and to prevent charge buildup during exposure to the electron beam, the samples were coated with 6 nm platinum using a Leica EM ACE200 Sputter coater.
The shape and size of ZnONPs were assessed using a HITACHI-HT7700 Transmission Electron Microscope (Hitachi High-Technologies Corporation, Tokyo, Japan).
The elemental composition of the hydrogels and the presence of ZnONPs were demonstrated using a Verios G4 UC Scanning Electron Microscope from Thermo Scientific (Bruno, Czech Republic) equipped with an Octane Elect Super SDD detector (an energy-dispersive X-ray spectrometer from EDAX (Ametek, Mahwah, NJ, USA).
To provide electrical conductivity and to prevent charge buildup during exposure to the electron beam, the samples were coated with 6 nm platinum using a Leica EM ACE200 Sputter coater.
6
Scanning Electron Microscopy Analysis of Electrospun Fibers
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Scanning electron microscopy (SEM) investigations for the obtained electrospun fibers were performed on a Verios G4 UC Scanning Electron Microscope (Thermo Scientific, SEM, FEI Company, Brno, Czech Republic). The electrospun PEEK/PI-1 fibers were coated prior examination with 6 nm platinum using a Leica EM ACE200 Sputter coater in order to increase the signal-to-noise ratio throughout SEM imaging and the electrical conductivity of the samples, and also to reduce the charging effects which appear during exposure to the electron beam. Therefore, high-resolution images can be achieved using this tool. SEM analyses were conducted in High Vacuum mode using a secondary electron detector (Everhart-Thornley detector, ETD) with 10 kV accelerating voltage. The diameters of the electrospun fibers were measured by means of the Image J program. At least 25 electrospun PEEK/PI-1 fibers from each sample, were taken into consideration to obtain the average diameters.
7
Fingernail Surface Morphology Analysis
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Healthy and diseased fingernail surface morphology was examined with a Verios G4 UC Scanning Electron Microscope (Thermo Fisher Scientific, Waltham, MA, USA) at 30 kV. The samples were platinum coated and fixed with double adhesive tape on cylindrical Al conducting supports. Images from the dorsal surface of the fingernail were taken at randomly selected locations.
8
Characterization of Freeze-Dried Samples
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The PL, XG, and composite PL/XG samples were frozen at −55 °C and dried using a freeze drier (BenchTop Pro with Omnitronics TM, SP Scientific) for 48 h. Dry samples were coated with a 6 nm platinum layer using a Leica EM ACE200 Sputter coater prior to microscopic examination to improve the electrical conductivity and prevent charge buildup. The morphology was analyzed using a Verios G4 UC Scanning Electron Microscope (Thermo Scientific, Brno, Czech Republic), operating at 10 kV in high-vacuum mode with a backscatter electron detector, ABS (Angular Backscattered Detector). The SEM images were observed at various magnifications.
9
Characterization of Electrospun Nanofibers
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The surface morphology of PCurd/PVA electrospun nanofibres was investigated using a Verios G4 UC Scanning Electron Microscope (Thermo Scientific, Brno, Czech Republic). The samples were coated with 10 nm platinum, at 30 mA, using a Leica EM ACE200 Sputter coater to provide electrical conductivity and to prevent charge build-up during exposure to the electron beam. Image J software was used to determine the size and size distribution of the nanofibre diameter, considering at least 100 random points from the SEM images at 25k× magnification level.
10
SEM Analysis of Platinum-Coated Samples
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Scanning electron microscopy (SEM) was performed on a Verios G4 UC Scanning Electron Microscope (Thermo Scientific, Brno, Czech Republic). The samples were coated before examination with 6 nm platinum using a Leica EM ACE200 Sputter coater in order to increase electrical conductivity and reduce charge buildup which can occur during exposure to the electron beam. SEM investigations were performed in High Vacuum mode using a detector for high-resolution images (Through Lens Detector, TLD, Jeol, Freising, Germania) at an accelerating voltage of 5 kV, the magnification being indicated on the micrographs. The Verios G4 UC microscope is equipped with an X-ray detection system (Energy Dispersive X-ray Spectroscopy analyzer—EDX) for qualitative elemental composition and map distribution of the elements in the sample.
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