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Fls980 pl spectrometer

Manufactured by Edinburgh Instruments

The FLS980 PL spectrometer is a high-performance photoluminescence (PL) measurement system designed for a wide range of applications. It provides precise and sensitive detection of luminescence signals across a broad spectral range. The core function of the FLS980 PL spectrometer is to measure and analyze the luminescence properties of various materials and samples.

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3 protocols using fls980 pl spectrometer

1

Photoluminescence Characterization of Ceramics

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PL
emission spectra at room temperature were recorded on an Edinburgh
Instruments FLS 980 PL spectrometer equipped with a double grating
monochromator system on both excitation and emission arms. A continuous
wave 450 W ozone-free Xe-arc lamp was used as an excitation light
source. The front-facing sample holder measuring assembly was chosen
to detect emission from the same side of illumination with an R928P
PMT detector from Hamamatsu operating at 253 K for optimal dark count
reduction. Excitation wavelengths of 270 and 340 nm were chosen to
access AEO-specific emission features30 (link) by using a slit width of 1 nm for both excitation and emission slits
to record the emission signal in steps of 2 nm up to 800 nm. High-vacuum
tight-fused silica cells equipped with optical cuvettes allow for
a final re-annealing step of ceramic fragments up to 1173 K under
defined gas atmospheres [p(O2) < 10–5 mbar, p(O2) = 650 mbar]
to purify and dehydroxylate the external surfaces without breaking
the vacuum prior to optical measurements. In order to investigate
surface excitonic luminescence, the ceramic specimens were measured
under both static high vacuum conditions [p(O2) < 10–5 mbar] and pure oxygen [p(O2) = 100 mbar] as a PL quencher.
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2

Characterization of ZnO Nanoparticles by PL and FT-IR

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Photoluminescence (PL) emission spectra were recorded on a FLS980 PL spectrometer from Edinburgh Instruments. Two different measuring assemblies, i.e. the standard right angle geometry for liquid dispersions as well as a front-facing sample holder suitable for powder samples, were used.
FT-IR spectra of ZnO nanoparticle powders were measured in transmission mode using a high-vacuum cell developed by J.T. Yates Jr. and coworkers [27 ]. The sample powders were pressed into a tungsten grid that subsequently was mounted in the high-vacuum cell. The cell was aligned in the optical path of the IR beam of a Bruker Tensor 27 spectrometer system. The resolution was 3 cmτ and 20 interferograms were averaged for a reasonable signal-to-noise ratio.
For IR measurements of aqueous solutions, we used a glass cell in contact with the ZnSe prism that was placed in an ATR reflection unit (PIKE Technologies, Veemax II). This unit was attached to a Bruker Vertex 70 FT-IR spectrometer equipped with a MCT detector. Measurements were performed at an incident angle of 55° using unpolarized light. Spectra were obtained by averaging 100 scans at a resolution of 4 cmτ and are represented as — log(R/R0), where R0 and R correspond to the reflectance values of the reference and the sample, respectively.
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3

Characterization of ZnO Nanoparticles by PL and FT-IR

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Photoluminescence (PL) emission spectra were recorded on a FLS980 PL spectrometer from Edinburgh Instruments. Two different measuring assemblies, i.e. the standard right angle geometry for liquid dispersions as well as a front-facing sample holder suitable for powder samples, were used.
FT-IR spectra of ZnO nanoparticle powders were measured in transmission mode using a high-vacuum cell developed by J.T. Yates Jr. and coworkers [27 ]. The sample powders were pressed into a tungsten grid that subsequently was mounted in the high-vacuum cell. The cell was aligned in the optical path of the IR beam of a Bruker Tensor 27 spectrometer system. The resolution was 3 cmτ and 20 interferograms were averaged for a reasonable signal-to-noise ratio.
For IR measurements of aqueous solutions, we used a glass cell in contact with the ZnSe prism that was placed in an ATR reflection unit (PIKE Technologies, Veemax II). This unit was attached to a Bruker Vertex 70 FT-IR spectrometer equipped with a MCT detector. Measurements were performed at an incident angle of 55° using unpolarized light. Spectra were obtained by averaging 100 scans at a resolution of 4 cmτ and are represented as — log(R/R0), where R0 and R correspond to the reflectance values of the reference and the sample, respectively.
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