S 3000n scanning
The S-3000N is a scanning electron microscope (SEM) produced by Hitachi. It is designed to provide high-resolution imaging of samples by using a focused electron beam to scan the surface of the specimen. The S-3000N is capable of magnifying samples up to 300,000 times and has a resolution of up to 3.0 nanometers.
8 protocols using s 3000n scanning
Spectroscopic Characterization of Materials
Fiber Elongation in Cotton Cultivars
Scanning Electron Microscopy of Aspergillus Conidial Adhesion
Scanning Electron Microscopy of Aspergillus-Host Interactions
Detailed Anatomical Examination of Okenia
Electron Microscopy Sample Preparation
Microcellular Structures of Natural Rubber Latex Foams
where d, ρf and ρr are the average cell diameter, the density of NRLF and the density of solid NR (0.93 g/cm3), respectively.
SEM Analysis of Cell-Seeded Membrane
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