1 cm × 1 cm silicon wafer was immersed in 1 ml sample solution overnight. After fixation and dehydration process, wafer with samples were imaged under FEI XL30 SEM-FEG scanning electron microscope with 10kV accelerating voltage. Images were obtained at ultra-high resolution, using the secondary electron imaging mode. All these parameters were kept the same between experiments.
Xl30 sem feg scanning
Manufactured by Thermo Fisher Scientific
The XL30 SEM-FEG is a scanning electron microscope equipped with a field emission gun. It provides high-resolution imaging and analysis capabilities for a wide range of materials and applications.
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Lab products found in correlation
2 protocols using xl30 sem feg scanning
1
Silicon Wafer SEM Imaging Protocol
2
Silicon Wafer SEM Imaging Protocol
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