Powder XRD patterns were recorded on a Bruker D8 advance diffractometer with Cu Kα radiation over the 2θ range of 10–80°. Thermogravimetric analyses (TGA) were carried out in a Netzsch SDT449F3 thermal analyzer in air atmosphere with a heating rate of 5 °C min−1. The SEM and TEM images of the prepared samples were obtained through field emission scanning electron microscopy (FESEM, Hitachi S-4800 microscope) and transmission electron microscopy (TEM, JEOL, JEM-2100F). The chemical composition and elemental distribution of the prepared catalysts were examined by Energy-dispersive X-ray spectroscope (EDX) attached to the FESEM instrument. ICP-OES was used to determine the Cu/Co atomic ratio of CuxCo3−xO4. The X-ray photoelectron spectroscopy (XPS) spectra were collected on Thermo ESCALAB 250 Xi spectrometer. N2 adsorption–desorption isotherm were obtained by a Micromeritics ASAP 2020 analyzer at 77 K. H2-temperature-programmed reduction (H2-TPR) experiments were performed under a 10 vol% H2/Ar mixture with a flow rate of 50 mL min−1 over 60 mg of catalyst by a Micromeritics Chemisorb 2920 apparatus and the temperature was increased from ambient temperature to 800 °C at a ramp rate of 1 °C min−1. Prior to each analysis, the catalysts were purged in a flow of pure argon at 200 °C for 2 hours to remove traces water.
S 4800 microscope
Manufactured by JEOL
The S-4800 is a high-resolution field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-quality imaging and analytical capabilities for a wide range of applications. The S-4800 features a field emission electron source, which delivers high-brightness and high-resolution imaging. The microscope offers a range of advanced features, including high magnification, low-voltage operation, and various detection systems.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250xi spectrometer, by Thermo Fisher Scientific (1 mentions)
Jem 2100f, by JEOL (1 mentions)
D8 advance diffractometer, by Bruker (1 mentions)
Asap 2020 analyzer, by Micromeritics (1 mentions)
Lambda 750 uv vis nir spectrophotometer, by PerkinElmer (1 mentions)
Rf 5301 pc fluorescence spectrofluorophotometer, by Shimadzu (1 mentions)
Ihr550 imaging spectrometer, by Horiba (1 mentions)
D8 x ray diffractometer, by Bruker (1 mentions)
Tem 2100, by JEOL (1 mentions)
2100 microscope, by JEOL (1 mentions)
Multimode 8, by Bruker (1 mentions)
4 protocols using s 4800 microscope
1
Comprehensive Characterization of Cu-Co Oxide Catalysts
2
Comprehensive Characterization of Synthesized Photocatalysts
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Investigation of crystalline nature of as synthesized materials was done using D8 Bruker X-ray Diffractometer varying the incident angle from 20° to 80° using Cu-Kα radiation (λ = 1.5418 nm). XPS measurements were performed in ultra-high vacuum conditions using standard Omicron system equipped with monochromatic Al Kα 1486.7 eV X-ray source operated at 15 KeV at constant analyzer energy of 100 eV for survey scans and 20 eV for detailed scans. Morphology of fabricated photocatalysts was examined by scanning electron microscope (Hitachi S-4800 microscope operated at 20 kV) and JEOL-2100 TEM. The SEM was fitted with EDAX for elemental mapping of the synthesized materials. Raman spectroscopy was performed with a home-made confocal setup fitted with a 532 nm laser. The measurements were performed at 1 mW of excitation power and spectra recorded using an iHR550 imaging spectrometer (from Horiba Scientific). Surface area was calculated through nitrogen physisorption with Nova 2200e (Quantachrome). Diffuse reflectance was recorded in the wavelength ranging from 200 to 800 nm with PerkinElmer, Lambda 750 UV–Vis–NIR spectrophotometer, equipped with integrating sphere. Energy band gap of synthesized photocatalysts were calculated by Kubelka-Munk equation. Room Temperature PL spectra were measured with RF-5301 PC Fluorescence Spectrofluorophotometer (Shimadzu, Japan).
3
Cryogel Pore Size Characterization by SEM
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SEM imaging, control (0% CaO2 in 4% HAGM) and antimicrobial (supplemented with 0.1% or 0.2% CaO2) square-shaped cryogel samples (dimensions: 4 mm × 4 mm × 1 mm) were fabricated, lyophilized, and sputter-coated with platinum to a thickness of 5 nm. Then, the cryogels were observed under a JEOL S 4800 microscope operating at a 15 kV voltage and 20 µA current. The average pore size of the cryogels was calculated by averaging the diameters of the pores as observed by SEM.
4
Characterization of Polystyrene Particles
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Scanning electron microscopic (SEM) and transmission electron microscopic (TEM) images were recorded using Hitachi S-4800 microscope and JEOLJEM-2100 microscope, respectively. The particle size distribution of the PS particles dispersed in water was determined by dynamic light scattering technique (DLS, Zetasizer Nano ZS, Malvern Panalytical Company). Atomic force microscopy (AFM) was conducted on Bruker Multimode 8. FT-IR spectra of the as-prepared PS particles were recorded by Nicolet Fourier transform infrared spectrometer (NEXUS 670) using the KBr technique. The images of water contact angles were obtained using JC2000D1 contact angle analyzer (Powereach, China) with ultrapure water droplet size of 8 μL at room temperature. All the contact angle values were determined as averages of measurements from at least five different points on each sample surface, using the Laplace–Young fitting mode.
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