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S 4160

Manufactured by Philips

The S-4160 is a scanning electron microscope (SEM) produced by Philips. It is designed to provide high-resolution imaging of samples at the nanoscale level. The S-4160 utilizes a focused electron beam to scan the surface of a sample, generating detailed images that reveal the sample's topography and composition.

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2 protocols using s 4160

1

Characterization of Nanocatalyst using Spectroscopic and Microscopic Techniques

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Infrared spectra were recorded using a Nicolet 100 Fourier Transform IR spectrometer in the range of 500–4000 cm−1 with a KBr disk. X-ray powder diffraction (XRD) measurements were performed using a Philips X'pert diffractometer with monochromatic Cu-Kα radiation (λ = 1.54056 Å). The Mercury software prepared the simulated XRD powder pattern based on single-crystal data. The sonicator used in this study was a Samkoon Sonicator with adjustable power output (maximum 400 W at 20 kHz). The elemental composition of the nanocatalyst was studied by EDX analysis using a TESCAN4992. The samples were characterized using a scanning electron microscope (SEM) (Philips XL 30 and S-4160) with gold coating. Transmission electron microscopic (TEM) images were provided using a Zeiss EM 900 electron microscope (Germany) operating at 80 kV. UV-visible DRS spectra were recorded using a Shimadzu MPC-2200 spectrophotometer. Fluorescence emission was performed using a Cary Eclipse MY13250011 (λexc = 245 nm). The electrochemical measurements were carried out using a Metrohm Autolab PGSTAT204.
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2

Hydrothermal Synthesis of ZnO Nanoparticles

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ZnO NPs were synthesized using hydrothermal method as follows [10] . First, 60 ml of 1 M Zinc acetate and 30 mL of 0.5 M citrate were mixed in a baker, then 50 mL distilled water and 60 ml of 1 M sodium hydroxide were added dropwise to the mixed solution along with sonication. The obtained white solution was incubated at room temperature for 24 h, and then the resulting pellet was washed with distilled water several times, and lyophilized to give nanopowder. The size and morphology of ZnO NPs were determined by SEM (Hitachi S-4160) and TEM (Philips CM 120).
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