Labram aramis raman spectrometer

X-ray diffraction (XRD) patterns were obtained from a powder X-ray diffractometer (D8 Advance, Bruker AXS GmbH, Karlsruhe, Germany) with Cu Ka radiation (l = 0.154056 nm). Scanning electron microscopy (SEM) images were received from a scanning electron microscope (EVO10, ZEISS, Jena, Germany) operated at an acceleration voltage of 20.0 kV. Raman spectra were performed on a LabRAM Aramis Raman spectrometer (HORIBA Jobin Yvon, Paris, France). Transmission electron microscope (TEM) images were recorded with a transmission electron microscope (JEOL JEM-2100, Tokyo, Japan). X-ray photoelectron spectroscopy (XPS) was obtained on a Thermo Electron ESCALAB250 XPS Spectrometer (X-ray Source: Al). Fourier transform infrared spectroscopy (FTIR) spectra were recorded on an IRPrestige-21 Fourier transform infrared spectrometer (Shimadzu Corp., Kyoto, Japan). A traditional three-electrode system (unmodified or modified GCE (id = 3.0 mm)) was used as the working electrode, platinum wire as the counter electrode and saturated calomel electrode (SCE) as the reference electrode for all electrochemical tests. Second derivative linear sweep voltammetry (SDLSV) was performed on a JP-303E polarographic analyzer (Chengdu instrument factory, Chengdu, China).

The UV–vis absorption spectra of CuSCN and acceptor films were recorded using Cary 5000 spectrophotometer in the range 250–1100 nm. Fluoromax-4 spectrofluorometer from HORIBA Scientific was used to collect the steady-state PL. Temperature-dependent PL data of neat acceptors were recorded using LabRam Aramis Raman spectrometer from Horiba Jobin Yvon following 633 nm (for EH-IDTBR, Y6, IT-M, ITIC, IT-2Cl, IT-4F, and IDIC) and 473 nm (for PC₇₁BM, and SF-PDI₂) laser excitations. The PL quantum yield measurements of the acceptor films were carried out using an Edinburgh Instruments integrating sphere with an FLS920-s fluorescence spectrometer. The optical constants n and k for the active layers were collected by variable angle spectroscopic ellipsometry (VASE) with an M-2000 ellipsometer (J.A. Woolam Co., Inc). The VASE measurements were performed with incident angles being varied from 50° to 75° in steps of 5° relative to the samples. Transfer matrix modeling was used to simulate the maximum theoretical J_SC plots as a function of active layer thickness (thickness range: 0–200 nm); the model assumes 100% internal quantum efficiency (IQE). The transfer matrix code for these simulations was developed by George F. Burkhard and Eric T. Hoke; code available from: transfermatrix/index.html.

Raman spectra were recorded on a Jobin Yvon/HORIBA LabRam ARAMIS Raman spectrometer (Tokyo, Japan) equipped with an integral BX 41 confocal microscope (Tokyo, Japan). Radiation from an air‒cooled internal HeNe laser (632.8 nm) and an external cavity diode laser (785 nm) were used as the excitation source. The FT‒IR spectra of ninhydrin were recorded as KBr disks at room temperature by a Bruker IFS‒66V FT‒IR spectrometer (Karlsruhe, Germany), equipped with a DTGS detector (Karlsruhe, Germany) at a resolution of 4 cm⁻¹.

Raman scattering measurements were performed in the backscattering geometry using a Jobin Yvon/HORIBA LabRam ARAMIS Raman Spectrometer (Horiba Jobin Yvon, Edison, NJ, USA), equipped with a confocal microscope and a Peltier-cooled charge coupled device (CCD) detector (DU420A, ANDOR). Measurements were performed using an internal HeNe (633 nm) laser, an external 785 nm diode laser (Melles Griot, Carlsbad, CA, USA), and a 532 nm diode pump solid-state (DPSS) laser (mpc6000, Laser Quantum, Stockport, UK). All spectra were collected at room temperature in air with 15 s exposure time and ten accumulations.

The crystal phases and structures of these samples were characterized by XRD (D8 Advance diffractometer, Bruker, Germany) with Cu Kα radiation (λ = 1.5406 Å). The composition and element chemical state of elements were determined by X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi, ThermoFisher Scientific, USA). The specified surface areas were measured using BET method with a Builder 4200 instrument (Tristar II 3020 M, Micromeritics Co., USA). Representative high-angle dark-field scanning transmission electron microscopy (HADDF-STEM) images with energy-dispersive EDX elemental mapping was conducted to characterize the dispersion and configuration of the catalysts, as well as to map the abundance of C, O, and Co in the catalyst. The insets of HRTEM were carried out via a JEM 2100F field emission transmission electron microscope at an accelerating voltage of 200 kV to characterize the morphological and textural properties. Raman spectra were recorded with a LabRAM Aramis Raman spectrometer (Horiba Scientific) with an Ar laser at 532 nm. The powdered sample was pressed into the sample holder and then placed into a home-built high-temperature reaction cell for in situ Raman measurements.