Nicolet 5700 infrared spectrometer

Attenuated total reflectance Fourier transformed infrared spectroscopy (ATR-FTIR) measurements were obtained using a Thermo Nicolet 5700 Infrared Spectrometer (Waltham, MA, USA) in the wavenumber range of 4000–400 cm⁻¹, with a resolution < 0.5 cm⁻¹. X-ray diffraction patterns were collected using a Bruker D8 Advance laboratory diffractometer (Billerica, MA, USA), operated in the reflection Bragg–Brentano geometry and configured in the θ/θ mode to always maintain a horizontal sample position. The data were collected at room temperature, using Cu-Kα (λ = 1.5418 Å). The degree of crystallinity was calculated by applying Equation (3): $$X_c=\frac{A_c}{A_T}\times 100\%$$
where A_c is the total crystallinity area and A_T represents the total area of the XRD deconvoluted plot (the sum of the amorphous and crystalline area) using OriginPro software. The Gaussian function mode was employed to fit the XRD spectra.