X ray diffractometer with cu kα radiation

The surface morphologies of the samples were characterized by scanning electron microscopy (SEM) (Carl Zeiss AG., Germany). The Brunauer–Emmett–Teller (BET) surface area and the total pore volume were measured from N₂ isotherms using a surface area and porosimetry analyzer (Quantachrome Instruments, USA). Surface chemical composition of the samples was confirmed by X-ray photoelectron spectroscopy (XPS) (Thermo Fisher Scientific, USA). The Fourier transform infrared spectroscopy (FTIR) of the samples was measured on a spectrophotometer (Thermo Fisher Scientific, USA) using KBr pellets in the range of 400–4000 cm⁻¹. The X-ray diffraction (XRD) patterns of the samples were examined by an X-ray diffractometer with Cu Kα radiation (Rigaku Corporation, Japan). The zeta potential was measured at a range of 1–5 using a zeta potential analyzer (Malvern Instruments Ltd., United Kingdom). The magnetization measurement of E-CMBC was performed using a vibrating sample magnetometer (VSM) (Lake Shore Cryotronics, Inc. USA).