Jsm 7100f field emission scanning electron microscope
The JSM-7100F is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of a wide range of materials and samples. The FE-SEM uses a field emission gun to produce a high-brightness electron beam, which allows for high-resolution imaging at low accelerating voltages. The instrument is equipped with various detectors, such as secondary electron and backscattered electron detectors, to capture different types of information about the sample surface.
6 protocols using jsm 7100f field emission scanning electron microscope
Nanoparticle Characterization using SEM and TEM
Scanning Electron Microscopy of Fungal Co-Cultures
Characterizing CaCO3 Crystal Structures
the dried powder onto carbon tape upon the aluminum sample stub to
image their internal structure, and the crystals were cracked via mechanical force. Capsule samples were prepared via depositing 30 μL of coated-crystal suspension
onto a circular glass slide, followed by the addition of 30 μL
of 50 mM EDTA pH 7.0 for capsule formation (the same conditions for
typical capsule preparation throughout the study). The resulting capsules
were then washed with water repeatedly and frozen for freeze-drying.
The slides with resulting freeze-dried capsules were sputtered with
10 nm of gold and imaged using the JSM-7100F field-emission scanning
electron microscope (JEOL, USA). Both crystals and capsules were imaged
using a probe current of 1 μA and an accelerating voltage of
2 kV.
MDCK Cell Monolayer Preparation for SEM
Cell Morphology Examination via SEM
Biopolymer Characterization Using SEM
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