Tg165

Optical images of the metal mesh were captured through an optical microscope (DSX510, OLYMPUS, Japan; Phenix MC‐D500U(C), China). The microstructure and cross‐section of the metal mesh was characterized via field‐emission SEM (MERLIN Compact, Zeiss, Germany). The printing process of the embedded metal mesh was captured by a high‐speed camera (i‐SPEED221, IX Cameras, UK). The embedded metal mesh was conductivity‐treated in a vacuum drying oven (DHG‐903385‐III, Shanghai Shengke Instrument Equipment Co., Ltd., China). The optical transmittance of the metal mesh was measured with a UV–vis spectrophotometer (UV‐6100, Metash, China). The heating performance of FTE was captured by infrared thermal imaging (TG165, FLIR Systems. USA). The R_s of the FTE is measured by a milliohmmeter (AT516, Applent Instruments Co., Ltd., China). The damp heat test of embedded metal mesh was measured by constant temperature and humidity test chamber (Dongguan Seth Testing Equipment Co., Ltd., China). The bending fatigue test was completed via a self‐developed test system.

The surface tension of the sacrificial solvents was measured using a surface tension analyzer (DST-60, SEO Co.). To visualize and measure temperature, a thermographic camera (TG-165, FLIR Co.) was used. The microstructure was characterized using field-emission scanning electron microscope (FE-SEM: S-4800, Hitachi Co.). To determine the physical form of the PDMS nanocomposites, X-ray diffraction (XRD: D/Max-2000, Rigaku Co.) analysis was performed. An in-house motorized system controlled via LabVIEW was used to test the TENGs. The contact force of the TENGs was measured using a load cell (UMM-K20, Dacell Co.). The applied contact force was recorded through a data acquisition board (PXIe-4330, National Instruments Co.) mounted on a PXI chassis with a controller (PXIe-8135 and PXIe-1082, National Instruments Co.). For all evaluation of TENGs, the applied force and frequency were fixed to 6 N and 2 Hz, respectively. An oscilloscope (MDO-3012, Tektronix Co.) and a preamplifier (SR570, Stanford Research Systems Co.) were used to measure voltage and current, respectively.

Scanning electron microscopy (SEM) was performed to observe the micromorphology of PCPM with a Hitachi S4800 cold field emission SEM at an accelerating voltage of 4 kV. Energy-dispersive X-ray spectroscopy (EDS) was used to obtain cross section element information of PCPM at an acceleration voltage of 8 kV. The wettability of the membrane was performed on the contact angle measuring instrument (OCA20, America) at room temperature. Five different positions were measured for each sample. When characterization of the sensing performance of the PCPM, an Instron 5567 universal testing machine was used to stretch PCPM rectangular specimens (20 × 5 mm²) with one end fixed and the other end linearly elongated at a constant speed. Resistance measurements were carried out by connecting the two ends of the PCPM to an Electrochemical Workstation (CH Instruments, CHI660E.Chenhua Co., Shanghai, China), with conductive copper wires to record the real-time current (I) flowing through the film under a constant voltage (U₀) of 1 V, while the real-time resistance (R) was calculated by the equation R = U₀/I. The IR images of the PCPM smart umbrella were measured by an infrared thermal imager (TG165, FLIR, US). AFM measurements were conducted using Dimension ICON SPM (Bruker, USA) in a PeakForce tapping mode.