Cells were harvested, washed twice in 0.1 M phosphate buffer (pH 7.0), and fixed in 2% (w/v) glutaraldehyde in the same solution. Subsequently, cells were suspended in 2% (w/v) OsO4 for 1 h, gradually dehydrated in ethanol [50%, 70%, 80%, 90%, and 99.5% (v/v); 15 min each], and embedded in Quetol651. Ultrathin sections (thickness 70 nm) were cut with a microtome using a Diatome diamond knife. The sections were collected using 400-mesh cupper grids coated with a carbon layer and observed in a Jeol‐2010 electron microscope (Jeol Ltd., Akishima, Japan).
2010 electron microscope
Manufactured by JEOL
Sourced in Japan
The JEOL-2010 is a high-resolution transmission electron microscope (TEM) designed for advanced materials analysis. It features a LaB6 electron gun and a robust, stable design to provide high-quality imaging and analytical capabilities. The JEOL-2010 is capable of delivering a maximum accelerating voltage of 200 kV and has a wide range of magnification options to suit various research and applications.
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Lab products found in correlation
Escalab 250 spectrometer, by Thermo Fisher Scientific (2 mentions)
Zetasizer nano zs instrument, by Malvern Panalytical (1 mentions)
Jem 100cx 2 electron microscope, by JEOL (1 mentions)
Nicolet is10, by Thermo Fisher Scientific (1 mentions)
Uv 2450, by Shimadzu (1 mentions)
Jsm 7800f field emission scanning electron microscope, by JEOL (1 mentions)
Spectrum two infrared spectrometer, by PerkinElmer (1 mentions)
Ls 55 fluorescence spectrometer, by PerkinElmer (1 mentions)
Lambda 35 spectrophotometer, by PerkinElmer (1 mentions)
Fls980 fluorescence spectrometer, by Edinburgh Instruments (1 mentions)
Uv 2100 spectrophotometer, by Shimadzu (1 mentions)
Fluoromax 4 spectrophotometer, by Horiba (1 mentions)
5 protocols using 2010 electron microscope
1
Ultrastructural Cell Analysis Protocol
2
Spectroscopic Characterization of IL-CDs
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The high-resolution transmission electron microscopy (HRTEM) images of IL-CDs in both absence and presence of TBA were recorded using a JEOL-2010 electron microscope (Japan) operating at 200 kV. For negative-staining transmission electron microscopy (NS-TEM) observations, samples were placed on a carbon-coated copper grid and then stained with 1% uranyl acetate, and further observed on a JEM-100 CXII electron microscope (JEOL, Japan) at an accelerating voltage of 120 kV. UV-vis absorption spectra of the obtained IL-CDs were recorded on a UV-vis spectrophotometer (UV-2450, Shimadzu, Japan). The Fourier transform infrared (FT-IR) spectra of IL-CDs were recorded in the range of 500–4000 cm−1 using a NICOLET iS10 (Thermo Fisher, America) spectrometer. The X-ray diffraction (XRD) measurements of IL-CDs were performed on a Rotating Anode X-ray Powder Diffractometer (D/max-2550VB/PC, Rigaku) in the absence and presence of AOT. The X-ray photoelectron spectra (XPS) of the IL-CDs were performed on an ESCALAB 250 spectrometer (Thermo Fisher, America). Zeta potential of IL-CDs in solutions with and without the presence of AOT was measured to show the surface charge by a Malvern Zetasizer NanoZS instrument (Southborough, MA) equipped with a laser Doppler velocimeter using a folded capillary cell with a gold electrode.
3
Characterization of Boron Nitride Nanosheets
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The morphology, diameter, thickness, energy-dispersive X-ray spectra (EDS), and size distribution of BN NSs were characterized by Shanghai Yanxi Analysis and Testing Technology Co. Ltd. (Shanghai, China). A scanning electron microscopy (SEM, Zeiss Merlin Compact, Jena, Germany) was used to study the morphology, diameter, thickness, and EDS of BN NSs; a Zetasizer Nano ZS ZEN3600 particle size analyzer (Malvern, UK) was used to perform the dynamic light scattering (DLS) to study the size distribution of BN NSs. A JEOL-2010 electron microscope from JEOL Ltd. recorded transmission electron microscopy (TEM, Tokyo, Japan) characterization.
4
Comprehensive Nanoparticle Characterization Protocols
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Transmission electron microscopy (TEM) images were observed under a JEOL-2010 electron microscope (JEOL, Tokyo, Japan) operating at 200 kV. Scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) was performed on a JSM-7800F field-emission scanning electron microscope (JEOL, Tokyo, Japan) with an X-Max50 energy spectrometer (Oxford Instruments, Oxford, UK). Nanoparticle size and zeta potential were determined using a Malvern Zetasizer 3000HSA instrument (Malvern Instruments, Malvern, UK). Fourier transform infrared spectra (FT-IR) were obtained on a spectrum two infrared spectrometer (Perkinelmer, Walsham, MA, USA) using pressed KBr discs. UV absorption spectra were carried out using a LAMBDA 35 spectrophotometer (Perkinelmer, Walsham, MA, USA). The fluorescent spectra were recorded on a LS-55 fluorescence spectrometer (Perkinelmer, Walsham, MA, USA). Luminescence decay curves were obtained using an FLS-980 fluorescence spectrometer (Edinburgh Instruments, Scotland, UK). The excitation light source for obtaining the fluorescence photos was a ZF1-2 UV analyzer (Shanghai Precision Instrument, Shanghai, China) with UV light (254 nm and 365 nm) and simulated sunlight.
5
Characterization of Nanocluster Elements
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Fluorescence measurements were carried out with a FluoroMax-4 spectrophotometer (HORIBA Scientific). UV-Vis absorption spectra were recorded using a Shimadzu UV-2100 spectrophotometer. pH measurements were performed by using a PHS-3C pH meter (Shanghai Leici Chuangyi Apparatus & Instrument Co. Ltd. Shanghai, China). Transmission electron micrograph (TEM) images were recorded using a JEOL-2010 electron microscope (JEOL Ltd, Tokyo, Japan) operating at an accelerating voltage of 200 kV and using Energy Dispersive Spectrometer matched with the transmission electron microscope, the EDS spectrum of the nano-cluster elements is obtained according to the X-ray characteristic wavelength of each element.
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