The S-4700 FESEM is a field emission scanning electron microscope (FESEM) manufactured by Hitachi. It provides high-resolution imaging capabilities for a wide range of applications. The S-4700 FESEM utilizes a field emission electron source to generate a focused electron beam, which is used to scan the surface of a sample. The interactions between the electron beam and the sample produce signals that can be detected and converted into digital images, allowing for detailed analysis of the sample's surface topography and composition.
Example 2
Scanning Electron Microscopy of the Construct
The construct was applied to conductive carbon tape on an aluminium SEM stub and then coated to 0.8 nm thickness using an Agar High Resolution Sputter Coater using a platinum/palladium target and imaged with a Hitachi S-4700 FESEM scanning electron microscope.
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