Model jsm 6700f

FESEM of optimized NLs was done by using electron microscope (Model-JSM-6700F; JEOL, Tokyo, Japan). Lyophilized formulation was spread on to a carbon tape over a stub and a platinum coating of about 5 nm was applied at an accelerating voltage of 10 kV and 10 mA current with the help of a platinum coater (JEOL, Tokyo, Japan).

FESEM was used to investigate the surface morphology of NLs. The lyophilized NLs were placed on an adhesive tape of carbon over a stub by spreading smoothly and then dried through vacuum and coated with platinum using a platinum coater instrument (JEOL, Tokyo, Japan). After that the samples were observed at various magnifications with the help of FESEM (Model-JSM-6700F; JEOL, Tokyo, Japan) (Dey et al., 2016 (link)).

Investigations were conducted on the effects of irradiation on the optical, morphological, and structural characteristics of the green synthesized BaO NPs utilizing XRD, FTIR, UV–vis–NIR spectrophotometer technique and FESEM. The thermally annealed sample was analyzed using an X-ray diffractometer (3040-X'Pert PRO, Philips) using CuKα radiation of wavelength 1.54056 Å, where 2θ = 10°–80°, operating voltage = 40 kV, current = 30 mA, and scanning speed = 1° min⁻¹. FTIR (Model: FTIR-ATR PerkinElmer Spectrum Two) was used to conduct functional group and phase stability studies for wavenumbers between 2000 and 400 cm-1. FESEM (Model-JSM-6700F, JEOL Ltd., Tokyo, Japan) was utilized to look into the distribution of particle sizes and morphological properties of BaO NPs. The UV–Vis–NIR spectroscopy data (Model: PerkinElmer UV–Vis_NIR spectrometer Lambda 1050) data were used to calculate the optical bandgap using the reflected spectra in the 200–800 nm wavelength range.

Spectroscopic analysis was conducted with an FT-IR spectrometer (Model Nicolet 380, Thermo Scientific, Waltham, MA, USA), and microscopic observation was done with a scanning electron microscope (Model JSM 6700F, JEOL Ltd., Tokyo, Japan,) and a microscope (Model iMegascope, Sometech, Seoul, Korea).

The variations in the surface roughness and surface potential of the SLG on the substrate were monitored using non-contact AFM and simultaneous KPFM (FlexAFM, Nanosurf AG), respectively, by applying an AC voltage of 1 V at a frequency of 18 kHz to a Pt/Ir-coated silicon tip. To calibrate the work function of the SLG studied here, highly oriented pyrolytic graphite (HOPG, ZYB, Optigraph GmbH) was used as a reference surface. The microscopic morphology of the device was observed by field emission scanning electron microscopy (SEM, Model JSM-6700F, JEOL Co.).
The device performance of the Gr-VOLET was measured using a chroma meter (CS-2000, Konica Minolta) in conjunction with two source meters (2636 A, Keithley). The emission characteristics of the devices were also investigated using an LED measurement system (LCS-100, SphereOptics Inc.) with an integrating sphere. For the operation of the Gr-VOLETs, source-drain voltage V_SD ( = −V_DS) on the Al drain and gate voltage, V_GS, were applied with respect to the SLG source electrode, held at ground potential.