E 112

X-ray diffraction (XRD) patterns of all samples were collected in the range 10–80° (2θ) using a RigakuD/MAX 2550 diffractometer (Cu K radiation, λ = 1.5406 Å), operated at 40 kV and 100 mA. The morphologies were characterized by transmission electron microscopy (TEM, JEM2000EX). The instrument employed for X-ray photoelectron spectroscopy (XPS) studies was a Perkin-Elmer PHI 5000C ESCA system with Al Kα radiation operated at 250 W. The shift of the binding energy due to relative surface charging was corrected using the C1s level at 284.4 eV as an internal standard. The X-band electron paramagnetic resonance (EPR) spectra were recorded at room temperature (Varian E-112).Raman measurements were performed at room temperature using a ViaReflex Raman spectrometer with the excitation wavelength of 514 nm. The UV-vis absorbance spectra were obtained for the dry-pressed disk samples using a Scan UV-vis spectrophotometer (Varian, Cary 500) equipped with an integrating sphere assembly, using BaSO₄ as the reflectance sample. The spectra were recorded at room temperature in air within the range 200–800 nm.

Phase purity and crystallite size of synthesized products were analyzed by Bruker D8 Advance powder X-Ray Diffractometer (Bruker AXS GmbH, Karlsruhe, Germany) with CuKa source. The morphology and particle size of synthesized products were examined using Transmission Electron Spectroscopy (TEM). TEM has been recorded employing JEOL JEM 3010 electron microscope (JEOL Ltd., Tokyo, Japan). Photoluminescence spectrum (PL) was recorded using Hitachi F-7000 Fluorescence spectrophotometer with 150 W Xe lamp as excitation source. The slit width at excitation and emission were 5 nm. UV-Visible spectra were recorded at room temperature using Jasco V 570 UV-Vis spectrophotometer. X-Ray photoelectron spectroscopic analysis was done using K-Alpha instrument (XPS K-Alpha surface analysis, Thermo fisher scientific, UK). X-band EPR was recorded using Varian E 112 at room temperature. Total Organic Content (TOC) was measured using Shimadzu TOC-L.