The topography of the surface of the PMMA discs was probed using an Asylum Research Cypher atomic force microscope (AFM; Asylum Research, Oxford Instruments, High Wycombe, UK) in AC mode using a standard AFM probe (Opus 160AC-NA; MikroMasch, Sofia, Bulgaria). Topographical surface data were acquired in phase and height profiles with scan sizes of 30 × 30 and 2 × 2 µm2 at a rate of 2.0 Hz. The set point and the drive amplitude were adjusted at 775 and 266 mV, respectively. Surface roughness was calculated based on a 30 × 30-µm2 scan size (n = 8 per group).
Asylum research cypher atomic force microscope
Manufactured by Oxford Instruments
Sourced in United Kingdom, United States
The Asylum Research Cypher atomic force microscope is a high-resolution imaging and measurement system that uses a sharp, nanometer-scale tip to scan the surface of a sample. It provides detailed information about the topography and properties of the sample at the nanoscale level.
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Lab products found in correlation
2 protocols using asylum research cypher atomic force microscope
1
PMMA Disc Surface Topography Characterization
2
Atomic Force Microscopy Imaging of Solid Lipid Nanoparticles
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Sample preparation involved depositing 10 µL of optimized PSE SLNPs on a silicon wafer substrate. After drying for 24 hours at ambient temperature, images were collected. An Asylum Research Cypher atomic force microscope (AFM, Oxford Instruments, Santa Barbara, CA, US) in tapping mode was used to record topographic and phase images of SLNPs. AFM images were obtained by measurement of the interaction forces between the silicon tip of a high resonant frequency cantilever and the sample surface. The experiments were performed in air at ambient temperature. The topographical AFM images were processed by Proprietary Scanning Probe Image Processor (SPIP) software version 6.64 (Image Metrology, Copenhagen, Denmark).
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