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8 protocols using rtespa 525

1

Atomic Force Microscopy of Peptide Fibrils

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AFM imaging was performed on a Bruker Multimode 8 AFM and a Nanoscope V controller. Tapping mode imaging was used throughout, with antimony (n)-doped silicon cantilevers having approximate resonant frequencies of 525 or 150 kHz and spring constants of either 200 or 5 Nm−1 (RTESPA-525, Bruker or RTESPA-150, Bruker). No significant differences were observed between cantilevers. 50 µL aliquots of the peptide (either at 1 or 5 mg mL−1) were drop cast onto freshly cleaved muscovite mica disks (10 mm diameters) and incubated for 20 min before gently rinsing in MQ water and drying under a nitrogen stream. All images were flattened using the first order flattening algorithm in the nanoscope analysis software and no other image processing occurred. Statistical analysis of the AFM images was performed using the open-source software FiberApp33 (link) from datasets of no less than 900 fibres.
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2

Nanohybrid Imaging via Atomic Force Microscopy

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The samples were dried onto Muscovite mica sheets
for AFM analysis. To image the nanohybrids and the ThrC7 nanoassemblies,
AFM was conducted in the ScanAsyst mode on a Bruker Multimode 8HR
AFM. The tip used was a Bruker model RTESPA-525 made of 0.01–0025
Ω cm antimony (n) doped Si with a resonant frequency of 525
kHz and a spring constant of 200 N/m.
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3

Atomic Force Microscopy Imaging of TiNMs

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For atomic force microscopy (AFM) imaging a drop of samples’ suspension (5 μL) was placed on hydrophilic freshly cleaved mica, attached to the metal disc. To remove unattached TiNMs the samples were washed with UPW after 10 min and left to dry in the air. AFM imagining in tapping mode under ambient conditions in the air was performed by a MultiMode probe atomic force microscope with a Nanoscope IIIa controller and a “J” scanner with a vertical engagement (JV) of 125 μm (Veeco Instruments, Bruker, Santa Barbara, CA, USA). A silicon tip (R-TESPA-525, Bruker, nom. freq. 525 kHz, nom. spring constant 100 N m−1) was used. The linear scanning rate was optimized between 1.0 and 1.5 Hz at the scan angle of 0°. For the analysis of the images the offline AFM NanoScope software (Bruker Corporation, Billerica, MA, USA), version 1.7, was used.
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4

Nanomechanical Characterization of Cell Walls

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The cell wall material was prepared by grinding the AIR into powder. Next, the powder solution (0.1% w/w) was drop deposited onto microscope slides and left to dry for 72 hours. For each variant of sample, at least 250 nano-indentations were carried out. The Young modulus of cell wall material was estimated by means of the Hertz contact model52 (link) using Nano Plot v1.1. software53 . The nano-indentation was carried out using Bioscope Catalyst II (Bruker, Billerica, MA, USA), equipped with a silicon cantilever RTESPA-525 (Bruker, Billerica, MA, USA). The cantilever was calibrated prior to the experiments according to the protocols described by Zdunek and Kurenda52 (link).
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5

Nanoscale Stiffness Mapping with AFM

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A JPK AFM Nanowizard Cellhesion 200 (JPK Instruments AG, Berlin, Germany) interfaced with a motorized XY stage was used to conduct nano-indentation measurements and extract stiffness maps. A stiff cantilever with a sharp tip (RTESPA-525, Bruker, nominal spring constant of 200 N/m) was used. Exact cantilever spring constant was determined using a direct method of a reference cantilever. The AFM setup was mounted on an Olympus inverted microscope and a CCD camera allowed monitoring of the position of the cantilever over defined regions of the sample. Forcedistance curves were taken with an approach speed of 2 µm/s and a set force of 200 µN by an automated raster scan using a motorized stage with 10 µm step size. Prior to indentation tests, the sensitivity of the cantilever was set by measuring the slope of a force-distance curve acquired on Sapphire substrate (PFQNM-SMPKIT-12M kit, Bruker). Using JPK Data Processing software, the contact point was found. The stiffness values Stiffness=E/(1-ʋ 2 ) were extracted from the forcedistance curves by fitting the contact portion of curves to a Hertz contact model between a sharp triangular tip and an infinite half space, where E is the elastic modulus and ʋ the Poisson ratio as previously demonstrated in literature [36] .
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6

Quantitative Nanomechanical Characterization of Cross-Sectioned Samples

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Similar to the FIB-SEM specimen-preparation procedure, eight embedded specimens were mechanically polished using diamond lapping films (3M) and argon-ion polished (SM-090101 Cross-Section Polisher, JEOL). The SPM system employed was a Bruker MultiMode 8 SPM equipped with a Nanoscope V controller and Nanoscope analysis software (Bruker Nano Surface Business, Santa Barbara, CA, USA). Cross-sectioned surfaces were quantitatively characterized using the PeakForce QNM (Quantitative NanoMechanics) SPM module under ambient conditions. Elastic modulus (EM) was calculated by Nanoscope analysis software using the Derjaguin-Muller-Toropov (DMT) model (Derjaguin et al., 1975; Wang et al., 2013) . Samples were scanned using a probe (RTESPA-525, Bruker) with a nominal radius of 8 nm and a nominal spring constant of 200 Nm -1 with 0.501 Hz scan rates, a 250-mV amplitude set point and a 150-nm peak force amplitude. After SPM, the samples were observed by SEM (JSM-6701F, JEOL).
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7

Characterization of Electrode Surface Morphology and Composition

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A field emission scanning electron microscope (SEM, Tecnai G2 F30, FEI, Japan) was employed to obtain deposition morphology under different gravity conditions. X-ray photoelectron spectroscopy (XPS, axis Supra, Kratos, Japan) was performed to characterize the chemical composition of the SEI. Atomic force microscope (AFM, Dimension ICON) was used to analyze the roughness and Young’s modulus of the sample surface, and force curves were conducted in the glove box to avoid sample oxidation. AFM tips (BRUKER RTESPA-525) with spring constant of 121 N m−1 was used. The value of Young’s modulus can be obtained after fitting by Nova-Px-AFM software. The Time-of-flight secondary-ion mass spectroscopy (ION-TOF GmbH, Germany) was applied to observe the distribution of secondary ions on the electrode surface.
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8

Mechanical Characterization of Flax and Aramid Fibers

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Mechanical characterization was performed with a Multimode AFM instrument (Bruker Corporation, USA) using PF-QNM imaging mode and a RTESPA-525 (Bruker) probe with a spring constant of 139 N/m. The probe was calibrated using the so-called Sader method (http://www.ampc.ms.unimelb.edu.au/afm) with a Scanning Electron Microscope (Jeol JSM 6460LV) for measurements of the cantilever length and width. The tip radius, 32 nm, was tuned during measurement on a Highly Oriented Pyrolytic Graphite (HOPG) standard from Bruker, providing an indentation modulus of around 18 GPa. The applied maximum load was set at 200 nN for all the measurements. As the measurements are longer and more subjected to artefact and drift with this technique, a reduced number of fibres have been measured compared to nanoindentation (i.e., 5 developing flax bast fibres, 5 mature flax fibres and 5 aramid fibres).
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