Escalab220i xl electron spectrometer

The scanning electron microscopy (SEM) measurements were carried out using a Hitachi S–4800 system. The energy dispersive X–ray spectroscopy (EDX) was measured with a Horiba EMAX X–act energy dispersive spectroscopy that was attached to the Hitachi S–4800 system. The transmission electron microscopy (TEM) of the nanomaterials was measured with a JEOL–2100F, which was operated with an accelerating voltage of 200 kV. X–ray diffraction (XRD) measurements were performed on a PANalytical X'Pert PRO instrument with Cu Kα radiation. The catalytic reduction of 4–NP was monitored by measuring the real–time UV–vis spectra of the catalytic systems using a Hitachi U–3010 spectrometer. JASCO IR–660 spectrometer was employed for the FT–IR spectral measurements. X–ray photoelectron spectroscopy (XPS) was performed on an ESCALab220i–XL electron spectrometer from VG Scientific using 300 W Al Kα radiation. The binding energies were referenced to the C1s line at 284.8 eV from adventitious carbon. Zeta potential measurements of our GO aqueous solutions were performed using a Zetasizer Nano ZS ZEN3600 (Malvern) instrument. All the measurements were carried out under ambient conditions.

Morphology of all the products was characterized by scanning electron microscope (SEM, Hitachi S4800) and transmission electron microscope (TEM, JEOL JEM-2200FS). Fourier transform infrared (FTIR) spectra were recorded on a Bruker Equinox 55 spectrometer in the range of 400–4000⁻¹ cm at room temperature. UV-vis spectra were measured on a Shimadzu 1601PC UV-vis spectrophotometer. X-ray diffraction (XRD) experiment was carried out on a Micscience M-18XHF (with CuKa radiation) instrument. X-ray photoelectron spectroscopy (XPS) analysis was carried out on an ESCALab220i-XL electron spectrometer from VG Scientific. Al-Kα radiation was used as the X-ray source and operated at 300W. Pore structure of the samples was characterized by physical adsorption of N₂ at 77 K (TriStar II 3020). The surface specific area was obtained by the Brunauer Emmett Teller method. Raman spectra were studied from a LabRAM HR800 with a 532 nm wavelength laser.

X-ray diffraction measurements were conducted on a Bruker D2 and D8 diffractometer using Cu KR radiation at a wavelength of 1.5406 Å. SEM and EDS were acquired by a Thermo Scientific (Waltham, MA) Quattro S scanning electron microscope. A JEOL JEM-2100F (JEOL, Tokyo, Japan) field emission transmission electron microscope was used to collect TEM and high-resolution TEM images. The spherical aberration–corrected HAADF-STEM images and EDS elemental mappings were obtained on a JEOL ARM200F with cold field emission gun and double hexapole Cs correctors (CEOS GmbH, Heidelberg, Germany). Raman spectra were recorded on the LabRAM HR Raman spectrometer with laser excitation at 514.5 nm from an Ar ion laser source. XPS analysis was based on a ESCALAB 220i-XL electron spectrometer from VG Scientific (Waltham, MA) using 300 W Al KR radiation (base pressure <10⁻⁵ mbar). X-ray absorption spectroscopy was conducted in a transmission mode at beamline X-ray absorption fine structure for catalysis of a Singapore Synchrotron Light Source (Singapore) operated at 700 MeV with a beam current of 200 mA.

X-ray diffraction (XRD) pattern was carried out on a Rigaku D/Max-2500 diffractometer equipped with a Cu Kα1 radiation (λ = 1.54 Å). Scanning electron microscopic images (SEM) were collected on a JEOL scanning electron microscope (S-4800, Japan). Transmission electron microscopic images (TEM) were obtained by a JEM-2100F microscope (JEOL, Japan) equipped with an EDS detector (Oxford Instrument, UK). X-ray photoelectron spectroscopy (XPS) was performed on an ESCALab220i-XL electron spectrometer (VG Scientific, UK) with a monochromatic Al Kα source. The gas products for CO₂ reduction were measured on a gas chromatography (GC, Agilent Technologies 7890B). The liquid products were analyzed with a Bruker AVANCE 600 using dimethyl sulphoxide (DMSO) as an internal standard.

In order to determine the structure and composition of the composite material prepared at room temperature, a scanning electron microscope (Hitachi S-4300) was used to obtain the surface features and element distribution of the fresh samples, and SEM images and EDS data were obtained.
Besides, the XRD data of the Al–Ga composite material with different ratios were measured with an X-ray diffractometer (D8 focus). The XPS data were obtained using an ESCALab220i-XL electron spectrometer (VG Scientific) and 300 W Al Kα radiation. The binding energies were referenced to the C 1s line at 284.6 eV from adventitious carbon.
In addition, DSC (DSC 200 F3 Maia, Netzsch Scientific Instrument Trading Co. Ltd, Germany) was used as a tool to measure the melting temperature of the composite materials, and 35.25 mg of the Al₁₀Ga₉₀ composite, 71.48 mg of the Al₂₀Ga₈₀ composite and 24.74 mg of the Al₄₀Ga₆₀ composite were analysed. The test temperature ranged from −20 °C to 60 °C, and the heating and cooling rates were both selected as 5 °C min⁻¹. Each sample went through three temperature cycles. The DSC curves were analysed to calculate the melting point (T_m), freezing point (T_s), unit heat quantity absorbed during melting (H_m) and that released during solidification (H_s) using the NETZSCH Proteus thermal analysis software.