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Silicon afm tips

Manufactured by Bruker

Silicon AFM tips are used as probes in atomic force microscopy (AFM) instruments. They are designed to provide high-resolution imaging and measurement capabilities for various surfaces and materials at the nanoscale level.

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2 protocols using silicon afm tips

1

Multimodal Nanoparticle Characterization

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Temperature controlled dynamic light scattering (DLS) was performed on a Zetasizer Nano ZS90 (Malvern Instruments, Malvern UK). Negative staining transmission electron microscopy(TEM) was carried out on a Hitachi H-7500 transmission electron microscope at an accelerating voltage of 75 kV. AFM measurements were performed on a “FastScan Bio” AFM (Bruker, USA) in a closed liquid cell with the ability to control the temperature of the solution from room temperature to 55 °C. Silicon AFM tips (Bruker)with a tip radius of curvature = 12 nm were used to image the sample in peak-force tapping mode.
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2

Multimodal Nanoparticle Characterization

Check if the same lab product or an alternative is used in the 5 most similar protocols
Temperature controlled dynamic light scattering (DLS) was performed on a Zetasizer Nano ZS90 (Malvern Instruments, Malvern UK). Negative staining transmission electron microscopy(TEM) was carried out on a Hitachi H-7500 transmission electron microscope at an accelerating voltage of 75 kV. AFM measurements were performed on a “FastScan Bio” AFM (Bruker, USA) in a closed liquid cell with the ability to control the temperature of the solution from room temperature to 55 °C. Silicon AFM tips (Bruker)with a tip radius of curvature = 12 nm were used to image the sample in peak-force tapping mode.
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