Mlct probe
The MLCT probe is a type of atomic force microscopy (AFM) probe designed for Bruker's line of AFM systems. It is used for measuring the topography and physical properties of sample surfaces at the nanoscale. The MLCT probe features a silicon nitride cantilever with an integrated tip for high-resolution imaging and force measurements.
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8 protocols using mlct probe
Determining Cell Stiffness via AFM
Force Spectroscopy of DSG2 Binding in Cardiac Myocytes
AFM Imaging of Native Cells
The real-time AFM studies of native cells were carried out using the method described in a previous study (Pleskova et al., 2005 (link)). The morphology was studied in the vital state. The test involved the use of MLCT probes (Bruker, USA) with the tip radius of 20 nm, front angle 15°, and resonance frequency in fluid 14 kHz. After 30 min of control scanning, the QDs were added into the Petri dish in CL50 concentration (final concentration 0.025 mg/ml and 0.04 mg/ml for CdSe/ZnS-MPA and CdSe/CdZnS/ZnS-PTVР respectively).
Calibrating Atomic Force Microscope Probes
Atomic Force Microscopy for Cell Elasticity
Atomic Force Microscopy of RBC Cytoskeleton
AFM Analysis of Nanogel Mechanical Properties
AFM-Based Quantification of Cellular Stiffness
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