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Uma 500

Manufactured by Bio-Rad
Sourced in United States

The UMA 500 is a laboratory-grade microplate analyzer designed for high-throughput applications. It offers precise optical detection capabilities for absorbance, fluorescence, and luminescence measurements. The core function of the UMA 500 is to provide accurate and reliable data analysis for a wide range of assays and experiments conducted in microplate formats.

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4 protocols using uma 500

1

FTIR Analysis of Restoration Margins

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The analysis of potential changes in the organic structure of restoration margins were performed by FTIR spectroscopy (UMA 500, Bio-Rad Laboratories, Hercules, CA, USA) with the infrared radiation ranging from 650 to 4000 cm−1 in wavelength number [8 (link)]. Spectra of the demineralised dentine adjacent to the restoration (n = 10 per group) were obtained by the average acquisition of data at the spatial resolution achieved with a 50 × 50 µm aperture. The ratio of the integrated area of collagen amide I absorbance between 1585 and 1720 cm−1 to that of HPO42− absorbance between 900 and 1200 cm−1 was calculated. The value of the amide I: HPO42− absorbance ratio indicated the extent of demineralisation of root dentine as a result of the activity of the cariogenic biofilm [8 (link)].
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2

Analyzing Dentine Collagen Degradation

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Eight blocks from each group were sectioned longitudinally, and the dentine collagen degradation was evaluated via FTIR spectroscopy (UMA 500, Bio-Rad Laboratories, Hercules, CA, USA) equipped with an attenuated total reflection element. The infrared radiation ranged from 650 to 4000 cm−1 in the wavelength number [25 (link)]. The spectra of the dentine carious lesions were obtained through the average acquisition of data at the spatial resolution achieved with a spot that was 32 μm in radius. The ratio of the integrated area of collagen amide I absorbance (between 1585 and 1720 cm−1) to that of HPO42− absorbance (between 900 and 1200 cm−1) was calculated. The value of the amide I: HPO42− absorbance ratio was used to evaluate the extent of the demineralisation of the dentine carious lesions [25 (link)].
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3

Mineral Analysis of Tooth-Restoration Interfaces

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Each sample was sectioned along the long axis of the tooth, midway across the restoration using a water-cooled copper disc [27] . One half of the sample was used for elemental analysis with scanning electron microscopy with energy-dispersive X-ray spectroscopy (SEM/EDX: Hitachi S-4800 FEG Scanning Electron Microscope, Hitachi Ltd., Tokyo, Japan), and the other half was used for Fourier transform infrared (FTIR) spectroscopy (UMA 500, Bio-Rad Laboratories, Hercules, CA, USA). The objective of SEM/EDX analysis was to evaluate changes in mineral content along the material-root junction. The cross-section surfaces of the restored teeth were treated with 1% acetic acid for 5 seconds and washed ultrasonically using deionized water to remove the smear layer [28] . The prepared teeth were examined under a scanning electron microscope under operating conditions of 5 kV. Lines with 500 µm length [28] and 50 µm away from the root surfaces with analysis commencing at the restoration-root junction. The lines were analyzed by means of line-scan in terms of phosphorus, calcium, fluoride and silver ion levels.
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4

Mineral Analysis of Tooth-Restoration Interfaces

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Each sample was sectioned along the long axis of the tooth, midway across the restoration using a water-cooled copper disc [27] . One half of the sample was used for elemental analysis with scanning electron microscopy with energy-dispersive X-ray spectroscopy (SEM/EDX: Hitachi S-4800 FEG Scanning Electron Microscope, Hitachi Ltd., Tokyo, Japan), and the other half was used for Fourier transform infrared (FTIR) spectroscopy (UMA 500, Bio-Rad Laboratories, Hercules, CA, USA). The objective of SEM/EDX analysis was to evaluate changes in mineral content along the material-root junction. The cross-section surfaces of the restored teeth were treated with 1% acetic acid for 5 seconds and washed ultrasonically using deionized water to remove the smear layer [28] . The prepared teeth were examined under a scanning electron microscope under operating conditions of 5 kV. Lines with 500 µm length [28] and 50 µm away from the root surfaces with analysis commencing at the restoration-root junction. The lines were analyzed by means of line-scan in terms of phosphorus, calcium, fluoride and silver ion levels.
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