Phenom g1
The Phenom G1 is a compact desktop scanning electron microscope (SEM) designed for high-resolution imaging of a variety of samples. It provides a simple and intuitive user interface for easy operation and features a built-in electron gun and sample chamber for efficient sample analysis.
10 protocols using phenom g1
Characterizing Nanofibers and Cell Morphology
Scanning Electron Microscopy of Scaffolds
Scanning Electron Microscopy of Sterilized Fibers
SEM images were used for fiber diameter measurement. n = 100 fiber diameter was measured using Fiji software [49 (link)] per each sterilized and unsterile material. Distribution of fiber diameters before and after sterilization was presented in the form of a box chart.
Morphological Analysis of Cylindrical Structures
For selected the materials, the surfaces and cross-sections were analyzed with a stereoscopic microscope (Leica, Wetzlar, Germany). The internal diameter was measurement manually using ImageJ.
Scanning Electron Microscope Analysis
Characterization of Nanoparticle Properties
Synthesis and Characterization of (In+Nb) Co-doped TiO2
The phase of samples was characterized by X-ray diffraction (XRD, X’PERT PRO MPD, Holland).X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi, USA) was used to analyze the valence state of different elements. The microstructure was investigated by scanning electron microscopy (SEM, FEI PHENOM G1). The dielectric properties and the impedance spectroscopy were measured using Agilent 4980 A in PPMS (Physical Property Measurement System) and stove at low and high temperature, respectively.
SEM Imaging of Chitosan Particles
Mosquito Morphometrics for Electrical Cloth Design
Aedes aegypti head morphometrics was used to design the physical structure of the MRC (structure and principle of function for the MRC are described in more detail later). Mosquito morphometrics (head diameter and proboscis length and diameter) were measured with a digital microscope (Monozoom-7 Zoom Microscope, Bausch and Lomb, Bridgewater, NJ, USA) and a Phenom G1 desktop scanning electron microscope (SEM; Thermo Fisher Scientific Inc., Waltham, MA, USA) in the Phenom SEM and Forensic Textile Microscopy Laboratory at North Carolina State University, Raleigh, NC, USA.
Scanning Electron Microscopy of Yarn Degradation
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