SEM observations were obtained using a field-emission scanning electron microscopy (FESEM, SU8010, Japan). The fine structure of the GF–LiF–Li composites was obtained by tomography analyses of focused-ion-beam scanning electron microscopy (FIB-SEM, Scios, FEI). Atomic force microscopy (AFM, Dimension Icon, BRUKER) was used to investigate the surface morphology and analyze the mechanical properties of the SEI layer on bare Li and on the GF–LiF layer. The reduced modulus of surface layers was obtained in peak force QNM mode with sharp AFM tips (BRUKER RTESPA-150). The topographic images of the bare Li SEI layer and the GF–LiF layer were recorded using tapping-mode imaging with sharp AFM tips (BRUKER RTESPA-150). The scan area size was for AFM 2 × 2 μm. The in situ surface viewed on bare Li and GF–LiF–Li electrodes was conducted in a metallurgical microscope (Caikon Optical Instrument DMM-330C) with 8.9-mm extra-long working distance 10× objectives. Surface elemental analysis was performed with X-ray photoelectron spectroscopy (XPS). Measurements were conducted in an ultra-high-vacuum ESCALAB 250 setup equipped with a monochromatic Al Kα X-ray source (1486.6 eV; anode operating at 15 kV and 20 mA). In situ X-ray diffraction investigations were recorded with an X-ray powder diffractometer (D8 ADVANCE, Bruker AXS GmbH Co., Ltd).
Rtespa 150
Manufactured by Bruker
Sourced in United States
The RTESPA-150 is a lab equipment product from Bruker. It is designed for research and analysis applications. The core function of the RTESPA-150 is to provide a platform for various analytical techniques, but a detailed description cannot be provided while maintaining an unbiased and factual approach.
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Lab products found in correlation
Dimension icon, by Bruker (3 mentions)
Rtespa 525, by Bruker (1 mentions)
Nanoscope 4 electronics, by Veeco (1 mentions)
Icon3 afm, by Bruker (1 mentions)
Nanoscope analysis software, by Bruker (1 mentions)
Solver pro m, by NT-MDT (1 mentions)
Dimension fastscan afm, by Bruker (1 mentions)
Peakforce hirs f a, by Bruker (1 mentions)
Bioscope catalyst atomic force microscope, by Bruker (1 mentions)
11 protocols using rtespa 150
1
Structural and Compositional Analysis of GF-LiF-Li Composites
2
Copolymer Nanostructure Characterization
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Height
and phase characterizations
were performed with an NT-MDT Solver Next SPM in the semicontact (tapping)
mode using the Bruker silicon tips, RTESPA-150 as well as PEAKFORCE-HIRS-F-A.
The RTESPA-150 were in general used for revealing the larger scale
and have a typical spring constant of 6 N/m, a resonance frequency
of 150 kHz, and a tip radius size of 8 nm. The PEAKFORCE-HIRS-F-A
were applied for higher resolution and have a typical spring constant
of 0.35 N/m, a resonance frequency of 165 kHz, and a tip radius size
of 1 nm.
The sample was prepared as follows: 50 mg·mL–1 copolymer dispersions in a water–ethanol mixture
containing a water volume fraction of ϕW = 0.3 were
first heated to T = 70 °C and then cooled to
room temperature overnight. The solution was then diluted 100 times
with a ϕW = 0.3 water–ethanol mixture, deposited
on a silicon wafer, and dried with a nitrogen flow.
The cross-sectional
diameter of the cylinders was determined by
averaging the cross-sectional height (seeFigure 4 a for an example) of three different cylinders.
For each cylinder, the cross-section was measured at four different
locations.
and phase characterizations
were performed with an NT-MDT Solver Next SPM in the semicontact (tapping)
mode using the Bruker silicon tips, RTESPA-150 as well as PEAKFORCE-HIRS-F-A.
The RTESPA-150 were in general used for revealing the larger scale
and have a typical spring constant of 6 N/m, a resonance frequency
of 150 kHz, and a tip radius size of 8 nm. The PEAKFORCE-HIRS-F-A
were applied for higher resolution and have a typical spring constant
of 0.35 N/m, a resonance frequency of 165 kHz, and a tip radius size
of 1 nm.
The sample was prepared as follows: 50 mg·mL–1 copolymer dispersions in a water–ethanol mixture
containing a water volume fraction of ϕW = 0.3 were
first heated to T = 70 °C and then cooled to
room temperature overnight. The solution was then diluted 100 times
with a ϕW = 0.3 water–ethanol mixture, deposited
on a silicon wafer, and dried with a nitrogen flow.
The cross-sectional
diameter of the cylinders was determined by
averaging the cross-sectional height (see
For each cylinder, the cross-section was measured at four different
locations.
3
Atomic Force Microscopy of Peptide Fibrils
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AFM imaging was performed on a Bruker Multimode 8 AFM and a Nanoscope V controller. Tapping mode imaging was used throughout, with antimony (n)-doped silicon cantilevers having approximate resonant frequencies of 525 or 150 kHz and spring constants of either 200 or 5 Nm−1 (RTESPA-525, Bruker or RTESPA-150, Bruker). No significant differences were observed between cantilevers. 50 µL aliquots of the peptide (either at 1 or 5 mg mL−1) were drop cast onto freshly cleaved muscovite mica disks (10 mm diameters) and incubated for 20 min before gently rinsing in MQ water and drying under a nitrogen stream. All images were flattened using the first order flattening algorithm in the nanoscope analysis software and no other image processing occurred. Statistical analysis of the AFM images was performed using the open-source software FiberApp33 (link) from datasets of no less than 900 fibres.
4
Characterizing Thin Film Surface Morphology
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Atomic force microscopy topographic images of the films formed on the gold sensors were acquired in an air tapping mode using a Multimode AFM controlled by Nanoscope IV electronics (Veeco, Santa Barbara, CA, United States) under ambient conditions. The gold sensors were glued to the AFM holders using and adhesive paste (Nural 27, Pattex) to reduce the influence of the sensors irregular bottom surface. Rectangular AFM probes with antimony (n) doped silicon cantilevers were used (RTESPA-150, Bruker) with a nominal spring constant of 5 N m–1 and a resonant frequency of 150 kHz. Images were acquired at 1 Hz line frequency and at minimum vertical force to reduce sample damage. Images were processed using Nanoscope Analysis 1.8 software.
5
Atomic Force Microscopy of Teicoplanin-BSM Interactions
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A Dimension ICON (Bruker Nano, Santa Barbara, CA, USA) using dedicated software (Nanoscope 9.4) was used to image 3 independent 500 nm × 500 nm areas of teicoplanin (1.25 mg/mL), BSM (1 mg/mL), and teicoplanin-BSM at increasing teicoplanin concentrations of 0.125 mg/mL, 1.25 mg/mL, and 12.5 mg/mL. All specimens were prepared by depositing 10 µL on cleaved mica and left to air dry at room temperature for 24 h before imaging. RTESPA-150 (Bruker Nano, Santa Barbara, CA) cantilevers were used across all samples, imaging in Tapping mode™ operating at a resonance frequency of 150 kHz in air at room temperature. Particle size analysis was performed using Nanoscope Analysis Version 1.9 monitoring height (nm) and diameter (nm) across all analysed samples. Statistical analysis between teicoplanin and BSM-teicoplanin at increasing teicoplanin concentrations was performed using a series of Kruskal–Wallis ANOVAs.
6
Single Particle Imaging of Cellulose Nanocrystals
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Single particles
were imaged with the Icon3 AFM (Bruker) in soft tapping mode using
silicon tips (RTESPA-150, Bruker). Later, the images were flattened,
and artifacts were removed with NanoScope analysis software from Bruker.
The samples preparation for the AFM analysis was conducted based on
the process described by Arcari et al.56 (link) Briefly, the modified and unmodified CNC were dispersed in Milli-Q
water to reach a final concentration of 2 mg L–1. Freshly cleaved mica was attached with double-sided tape to a glass
slide. Twenty μL of an acqueous solution containing 0.05 vol
% of (3-aminopropyl) triethoxysilane (APTES) were deposited on the
mica to achieve a positive surface charge. After 60 s the mica was
rinsed thoroughly with Milli-Q water and dried with a pressurized
air gun. Successively, the mica was covered by the 2 mg/L CNC suspensions.
After 30 s the mica was rinsed again thoroughly with Milli-Q water
and dried with pressurized air. The samples were kept under vacuum
in a desiccator before the measurements to prevent any contamination.
Measurements of diameters of CNC were based on the vertical cantilever
displacement, while length were extracted from the images with the
NanoScope analysis software.
were imaged with the Icon3 AFM (Bruker) in soft tapping mode using
silicon tips (RTESPA-150, Bruker). Later, the images were flattened,
and artifacts were removed with NanoScope analysis software from Bruker.
The samples preparation for the AFM analysis was conducted based on
the process described by Arcari et al.56 (link) Briefly, the modified and unmodified CNC were dispersed in Milli-Q
water to reach a final concentration of 2 mg L–1. Freshly cleaved mica was attached with double-sided tape to a glass
slide. Twenty μL of an acqueous solution containing 0.05 vol
% of (3-aminopropyl) triethoxysilane (APTES) were deposited on the
mica to achieve a positive surface charge. After 60 s the mica was
rinsed thoroughly with Milli-Q water and dried with a pressurized
air gun. Successively, the mica was covered by the 2 mg/L CNC suspensions.
After 30 s the mica was rinsed again thoroughly with Milli-Q water
and dried with pressurized air. The samples were kept under vacuum
in a desiccator before the measurements to prevent any contamination.
Measurements of diameters of CNC were based on the vertical cantilever
displacement, while length were extracted from the images with the
NanoScope analysis software.
7
Nanoparticle Characterization by AFM
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A sample of 10 µL of SO-NC (diluted 1/10 in ultrapure water) was deposited onto freshly cleaved mica and analyzed in atomic force microscopy (AFM). The samples were purged with argon and imaged in Tapping® mode on a Dimension Icon multimode AFM (Bruker) using soft Tapping® mode AFM probes (RTESPA-150 from Bruker). Diameter and height analyses were performed using the ‘‘particle analyses’’ program of the Nanoscope Analysis 1.7 system.
8
Preparation and Characterization of C60 Fullerene Aqueous Solution
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To obtain C60 fullerene aqueous solution (C60FAS), a method based on the transfer of C60 molecules (Sigma Cat. No. 379646) from toluene into the water followed by ultrasound treatment was applied [23 , 24 ]. The mechanism of C60 molecule dispersal in an aqueous solution could be explained by a formation of a covalent bond between hydroxyls and carbons in the C60 fullerene cage as a result of ultrasound treatment, which culminates in consequent easy C60 molecule dissolution [25 (link)]. The obtained C60FAS at a maximum concentration of 0.15 mg mL−1 was stable for 18 months at +4 °C.
The structural state of C60FAS was studied by the atomic force microscopy (AFM) technique [26 (link)]. To do this, a drop of C60FAS was applied to the atomically smooth surface of the substrate, and the measurements were carried out after the complete evaporation of water. Freshly cleaved mica surface (muscovite, grade V1) was used as a substrate for AFM research. Measurements were carried out on the system “Solver Pro M” (NT-MDT, Russia) in tapping mode using AFM probes RTESPA-150 (Bruker, USA).
The structural state of C60FAS was studied by the atomic force microscopy (AFM) technique [26 (link)]. To do this, a drop of C60FAS was applied to the atomically smooth surface of the substrate, and the measurements were carried out after the complete evaporation of water. Freshly cleaved mica surface (muscovite, grade V1) was used as a substrate for AFM research. Measurements were carried out on the system “Solver Pro M” (NT-MDT, Russia) in tapping mode using AFM probes RTESPA-150 (Bruker, USA).
9
Atomic Force Microscopy of Hookworm Larvae
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Prior to imaging microscopy slides containing sheathed, partially exsheathed and exsheathed L3 larva were equilibrated to room temperature to remove surface water, acquired during refrigeration. To prevent movement during imaging slides were fixed to the AFM stage using adhesive tape. Samples were imaged with a Bruker Dimension FastScan AFM, using a Bruker cantilever (RTESPA-150, resonant frequency 150 kHz, spring constant 6 N/m and tip radius 8 nm), and FastScan Icon head. N. americanus L3 larva, partially exposed cuticle and sheathes were imaged using scan sizes of 75x75 μm, 10x10 μm and 5x5 μm at 1024 force curves/line and scan rate of 0.5 Hz (n = 3). It is important to note the difference in image features between the AFM images for the worm, Fig 2Ai , and sheath, Fig 2Aii , is due to the 6-fold difference in height. Bearing this in mind the data shown for Fig 2Aiii has been extracted from comparable regions of interest that overcome height differences. Adhesion measurements were conducted using tips functionalised with poly-L-lysine (0.01% w/v, 5 minutes, followed by ultra-pure deionised water rinsing) on comparable regions of interest (10 μm2, n = 3). Data was processed and analysed using open source Gwyddion software (version 2.41).
10
Surface Topology Characterization of GO Films
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The topography of both sets of composites were measured via a Bruker Dimension Icon™ in tapping mode to measure the surface topology of the dried GO films and GO paper. Silicon cantilevers (RTESPA-150, Bruker, USA) with a nominal stiffness of 6N/m were and nominal probe radius of 8 nm were used. The mounted samples were systematically scanned and then rescanned at different levels of applied strain so that the development of the GO film or GO paper topology as a function of strain could be observed. The images captured at each level of applied strain were then analyzed with to determine the development of surface topology as a function of strain.
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