The morphology and microstructure of QDs were characterized by a JEM-2100F transmission electron microscope (TEM, Japan). The crystalline structure of QDs was studied by a D/Max-2500 powder X-ray diffractometer (XRD, Rigaku, Japan). Ultraviolet (UV) spectra were measured on a UV-29100 ultraviolet/visible (UV/vis) spectrophotometer (Shimadzu, Japan). Resonance light scattering (RLS) spectra were recorded on the same spectrofluorometer by simultaneous scanning of excitation and emission monochromators (Δl = 0) from 200 to 700 nm. Phosphorescence was measured by a Cary Eclipse fluorescence spectrophotometer (Varian, USA) equipped with a plotter unit and a quartz cell (1 × 1 cm2) in the phosphorescence mode. In addition, zeta potential was measured by a ZS90 Zetasizer Nanoscale device, and pH was tested by a pH meter (Jinpeng Analytical Instruments, China).
D max 2500 x ray powder diffractometer
Manufactured by Rigaku
Sourced in Japan
The D/max 2500 is an X-ray powder diffractometer manufactured by Rigaku. It is designed to analyze the crystalline structure of materials through the diffraction of X-rays. The instrument features a high-intensity X-ray source, a precise goniometer for sample positioning, and a sensitive detector to collect the diffracted X-rays. It is capable of performing a wide range of X-ray diffraction measurements and analyses.
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5 protocols using d max 2500 x ray powder diffractometer
1
Characterization of Quantum Dot Morphology
2
Rheological and Thermal Analysis of AlN Ceramics
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A stress-controlled rotational rheometer (MCR302, Anton Par GmbH, Graz, Austria) with a cone (the diameter is 20 mm) was used to characterize the rheological properties of the photocurable AlN suspensions. Curing depth was determined by collecting the thickness of three independent printed samples. X-ray diffraction (XRD) measurements were performed in reflection mode on a Rigaku D/max 2500 powder X-ray diffractometer (Tokyo, Japan). The microstructures of green bodies, degreased samples, and sintered AlN ceramics were examined using fracture surfaces by scanning electron microscopy (SEM; Magellan 400, FEI, Columbia, MD, USA). Sintered AlN samples were tested using a laser thermal conductivity analyzer (LFA467 HyperFlash, Netzsch, Germany) to determine their thermal diffusivity and thermal conductivity at room temperature. The density of AlN ceramics was measured using the Archimedes method.
3
Comprehensive Characterization of Material
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X-ray diffraction (XRD) patterns were measured using Rigaku D/max 2500 X-ray powder diffractometer with Cu Kα-radiation (λ = 0.15405 nm). The morphology was displayed via scanning electron microscopy (SEM, FEI Nova Nano SEM). Transmission electron microscopy (TEM, Tecnai G2 F20) was used to investigate high-resolution TEM (HRTEM) images, selected area electron diffraction (SAED) patterns, and energy dispersive spectrometer (EDS) element mappings. X-ray photoelectron spectroscopy (XPS) spectra were collected through an ESCALAB 250 Xi X-ray photoelectron spectrometer (Thremo Fisher). Differential scanning calorimetry (DSC) and thermogravimetric (TG) analysis curves were collected by the instrument (Netzsch STA449 C, Germany) in air at a heating ramp rate of 10 ◦C min−1.
4
X-ray Diffraction Analysis of Crystallinity
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The X-ray diffraction was conducted using a Rigaku D/max 2500 X-ray powder diffractometer (Rigaku, Tokyo, Japan) with Cu radiation run at 40 kV and 30 mA with 0.15406 nm light wavelength. The scanning rate of 2° min−1 in the range of diffraction angle 10° to 40° at room temperature was used to scan the samples. The crystallinity index (CI) was computed using the subsequent Segal expression, Equation (4):
where I002 and Iam represent peak intensities of the crystalline and amorphous fractions, respectively. The crystallite size (CS) was determined using Scherrer’s formula as shown in Equation (5),
where k = 0.89 (Scherrer’s constant), λ = 0.1541 nm is the radiation wavelength, β is the peak’s full-width at half-maximum in radians, and θ is the corresponding Bragg angle.
where I002 and Iam represent peak intensities of the crystalline and amorphous fractions, respectively. The crystallite size (CS) was determined using Scherrer’s formula as shown in Equation (5),
where k = 0.89 (Scherrer’s constant), λ = 0.1541 nm is the radiation wavelength, β is the peak’s full-width at half-maximum in radians, and θ is the corresponding Bragg angle.
5
Characterizing Amorphous Drug Transformation
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The molecular transformation of the drug from crystalline to amorphous state was determined. The samples were measured with a D/max 2500 X-ray powder diffractometer (Rigaku, Tokyo, Japan). A Cu Kα radiation was used at 40 kV and 100 mA. The samples were scanned in the reflection mode from 3° to 40° with a scanning step size of 0.02°.
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