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Ultima 3 xrd

Manufactured by Rigaku
Sourced in Japan, United States

The Ultima III XRD is a versatile X-ray diffractometer designed for materials analysis. It is capable of performing a range of X-ray diffraction techniques to characterize the crystal structure and phase composition of various materials.

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3 protocols using ultima 3 xrd

1

Comprehensive Nano-Material Characterization

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UV–visible spectra were recorded (200–400 nm) using Shimadzu UV–visible 1800 Spectrophotometer for preliminary confirmation of nanoparticle formation. FTIR was performed by KBr pellet method in the region of 400–4000 cm−1, to identify the functional groups in the nanoparticles using Nicolet 560 FTIR spectrophotometer. Particle size, surface charge and poly dispersity index (PDI) were analyzed by DLS using Zetasizer (Malvern, UK) at 25 °C in triplicate. The nanoparticle size and surface morphology were examined by HRTEM (JOEL model, 1200 Ex) and SEM (Zeiss, Evo 18, Germany) respectively. X-ray diffraction studies were performed in X-ray diffractometer (Rigaku Ultima III XRD) with a CuKα1 radiation to determine the structure of the sample. The X-ray source was operated at 40 kV and 40 mA. Diffraction intensity was measured in the reflection mode at a scanning rate of 2/min for 2θ = 10°–70°.
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2

X-ray Diffraction Analysis of Samples

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With the Rigaku Ultima III XRD, the PXRD patterns of samples were studied (Rigaku Co., Ltd., Tokyo, Japan). PXRD was conducted using a Kb filter and Cu Energy at a current of 30 kV and a current of 15 mA. In a prestacked PC software, the samples were successfully spun and inspected at a rate of 1°/min throughout a 2 range of 5–80° (results displayed at 5–40°).
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3

Characterization of Silver-Coated Carbon Nanotubes

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Silver-coated single-walled carbon nanotubes (SWCNT-Ag) and pegylated SWCNT (pSWCNT-Ag) were prepared and characterized by Chaudhari et al. [25 (link)] as previously described. The prepared pSWCNT-Ag had positive zeta potential (8.99) and more positive charges than SWCNT-Ag (− 41.9). The pSWCNT-Ag exhibited bigger size (54 nm vs. 6 nm in diameter; TEM imaging) and high hydrophilicity than the SWCNT-Ag [25 (link)]. In the present study, both nanocomposites were further characterized using the X-ray diffraction (XRD—Rigaku’s Ultima III XRD; The Woodlands, TX, USA) operated under 40 kV and 44 mA (scan range_10°–90°, step size_0.02°, and scan speed_1°/min). The JEM 2100 TEM (Jeol USA, Inc.; Peabody, MA, USA) coupled with the energy dispersive X-ray spectroscopy (EDS—Oxford Instrument’s X-Max 80T EDS detector) was also used.
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