Mira3 feg sem
The MIRA3 FEG-SEM is a field emission scanning electron microscope (FEG-SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a Schottky field emission gun that provides high brightness and stability, enabling detailed observation and characterization of materials at the nanoscale level.
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67 protocols using mira3 feg sem
Characterization of Mesoporous Silica Nanoparticles
Characterization of Synthesized Nanocrystals
Morphological Characterization of Molds
Characterization of Laser-Induced Protoplasts
Synthesis and Characterization of Silver Nanoparticles
PDMS Stamp Characterization Workflow
Characterization of Silver Nanoparticles
Characterization of Nanoparticles using FESEM, EDX, and TGA
Characterization of Nanomaterial Synthesis
Comprehensive Characterization of Symmetric Supercapacitors
used SEM to characterize the morphological features of all samples
by employing a FEG-SEM MIRA 3 (Tescan, Czech Republic). Due to the
high electrical conductivity of the samples, no previous metal-sputtering
treatment was necessary (except for the pure ESM, where a fine gold
layer was deposited). Raman spectra were obtained in the 800–2000
cm–1 region by using a microscopic confocal Raman
spectrometer (LabRAM Aramis; HORIBA Jobin Yvon, France), with a 633
nm He–Ne laser. The electrochemical testing of the prototype
symmetric SCs was carried in a two-electrode configuration. The devices
were mounted in a Solartron 12962A sample holder between two carbon
cloth electrodes. All electrochemical (cyclic voltammetry, galvanostatic
CD, and electrochemical impedance) measurements were carried out at
room temperature using Autolab PGSTAT302N (Metrohm, Switzerland).
FTIR measurements were performed using the KBr method in IR Prestige-21
Fourier Transform Infra-Red Spectrometer (Shimadzu, Japan).
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