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Mira3 feg sem

Manufactured by TESCAN
Sourced in Czechia, United States, Australia

The MIRA3 FEG-SEM is a field emission scanning electron microscope (FEG-SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a Schottky field emission gun that provides high brightness and stability, enabling detailed observation and characterization of materials at the nanoscale level.

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67 protocols using mira3 feg sem

1

Characterization of Mesoporous Silica Nanoparticles

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The surface modifications and the functional groups of the structures were verified using FT-IR spectroscopy (Bruker Optik GmbH, Ettlingen, Germany) in the range of 500–4000 cm−1. The morphology and size of MMSNPs were evaluated by typical TEM using Carl Zeiss, LEO 906E (Germany) microscope. The surface morphology of MMSNP was investigated by field emission scanning electron microscope (FESEM) using MIRA3 FEG-SEM (Tescan, Czechia). The ξ-potential and size of MMSNPs were measured by a DLS analyzer Zetasizer, Nanotrac wave (Microtrac Inc., Montgomeryville, PA, USA). Additionally, the PDI was evaluated to illustrate the size distribution of nanoparticles. The elemental composition of materials was established by EDX using MIRA3 FEG-SEM (Tescan, Czechia).
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2

Characterization of Synthesized Nanocrystals

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Morphology and structure of the synthesised nanocrystals and scaffolds were determined by SEM (MIRA3 FEG-SEM-Tescan, Czech). The pore sizes of porous scaffolds and the size of nano hydroxyapatite particles were determined from SEM micrographs using Image J software (NIH, USA, version 1.52n) as described previously [20] . Moreover, The elemental composition of the synthesized nano-hydroxyapatite particles and PCL-PEG-PCL-Col/nHA hydrogels were analyzed using energy-dispersive X-ray (EDX) attached to the field emission scanning electron microscope (FE-SEM) (MIRA3 FEG-SEM -Tescan, Czech).
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3

Morphological Characterization of Molds

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The morphological characterization of the molds was performed on a Field Emission Gun Scanning Electron Microscope (TESCAN FEG SEM MIRA3). Previous to the analysis, the molds were metalized with approximately 20 nm gold layer with a sputtering evaporator (Quorum Q150R ES). SEM measurements were carried out at 7 kV and the quantitative measurements were made with the MIRA TC software version 4.2.24.0. Profilometry measurements were performed on a Dektak XT profilometer from Bruker. Analyses were carried out with Vision 64 software. Linear scans were performed with a 25 μm radius tip, at a scan speed of approximately 90 μm s−1 a sampling rate of 0.01 Hz mm−1. Before characterization, the molds were blown with nitrogen gas to remove dust and then were ultrasonically cleaned in ethanol (70% v/v) for ten minutes (this step was repeated 5 times). Afterward, the molds were dried in an oven at 40 °C for 1 hour. AFM images were acquired in ScanAsyst mode at ambient conditions by using a cantilever of spring constant at 0.71 N m−1. The average roughness (Ra) parameter was determined by applying the Nanoscope Analysis 1.8 software to multiple images taken at random positions in scan areas of 50 × 50 μm2. AFM images reported in this work were reproducible over at least five points on the sample surface.
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4

Characterization of Laser-Induced Protoplasts

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The characterization of the laser made incision and the released protoplast was performed using a high-resolution field emission gun scanning electron microscope (FEGSEM-Mira3, TESCAN). The samples were prepared for SEM according to the standard protocol with paraformaldehyde fixation followed by drying in a critical point drying chamber (K850, Quorum Technologies, Laughton, UK) as previously described in ref. 69 (link). The samples were sputter-coated with 10 nm of gold/palladium using a Quorum sputter coater to make them conductive for SEM analysis.
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5

Synthesis and Characterization of Silver Nanoparticles

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Typically, 1 mL (100 ppm) of aqueous extract was mixed with 10 mL (0.001 M) silver nitrate in a test tube. The mixture was shaken for 5 min then kept for 1 h at room temperature in a dark place. A change from colourless to brown colour was a primary indicator of the AgNPs existence. Another two sets of AgNPs were synthesised using 2 mL and 3 mL of the extracts. X-ray diffractometer (XRD, type PANalytical X'Pert PRO, Almelo, Netherlands) was utilized to evaluate the crystalline structure of the samples. The test was performed with Cu-Kα radiation (λ = 1.54178 Å), at a power of 40 kV and 40 mA over 2θ range from 10 ° to 80 ° . The morphology and the particle size of the synthesised AgNPs were investigated using scanning electron microscopy (SEM; FEG-SEM MIRA3 TESCAN, Czech Republic). The energy-dispersive X-ray analysis was carried out using the same SEM. Finally, the surface plasmon resonance (SPR) of the silver nanoparticles was characterised using a UV–vis spectrum, Shimadzu UV-1800/Visible spectrophotometer.
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6

PDMS Stamp Characterization Workflow

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Before characterization, the PDMS stamp was blown with nitrogen gas to remove dust, followed by an ultrasonic bath in ethanol (70% v/v) for 10 min (repeated 5 times) and finally dried in an oven for 1 h at 40 °C. Morphological characterization was carried out using a Field Emission Gun Scanning Electron Microscope (TESCAN FEG SEM MIRA3, Brno, Czech Republic). The molds were previously metalized with a 20 nm gold layer, and SEM micrographs were taken at 5 kV to avoid damaging the samples. In addition, profilometry measurements were carried out with a Dektak XT profilometer from Bruker (Billerica, MA, USA). Linear scans were conducted at a scan speed of 22.75 µm/s with a 25 µm radius tip and a sampling rate of 0.01 Hz/mm. The analysis was performed with Vision 64 software.
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7

Characterization of Silver Nanoparticles

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UV–Vis absorption spectra were obtained by Shimadzu UV-2450 UV–visible spectrophotometer (Tokyo, Japan). Zeta potential, dynamic light scattering (DLS, Malvern particle size analyzer, Malvern, UK) and field emission scanning electron microscopy (FESEM) images (FEG-SEM MIRA3 TESCAN, Brno, Czech Republic) were employed to characterize the size and morphology of the prepared AgNPs, respectively. Also, Fourier transforms infrared (FTIR) spectrum was applied by a Shimadzu model FTIR prestige 21 spectrophotometers (Tokyo, Japan).
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8

Characterization of Nanoparticles using FESEM, EDX, and TGA

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The Field Emission Scanning Electron Microscopy (FESEM) images and Energy Dispersive X-ray (EDX) were recorded with FEG-SEM MIRA3 TESCAN, Czech Republic at 1000 kV. Spectra were obtained by Thermo-Nicolet Nexus 670 FT-IR instrument (Thermo Fisher Scientific, Waltham, MA, USA). The X-ray Diffractometer Infrared, used to study the crystallinity of the NPs, was X'PertPro, Holland radiation (30 kV, 15 mA). The measurement was conducted at 2 theta angles between 10 and 80. Thermal gravimetric analysis (TGA) was recorded by SDT Q600, US. PM particle number concentration was detected by Purific Y09-301, China.
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9

Characterization of Nanomaterial Synthesis

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Philip Harris C4954718 was used to melting point measurement. Fourier transform infrared (FT-IR), spectras were obtained by Thermo-Nicolet Nexus 670 instrument. Thin layer chromatography (TLC) on Merck's silica plates were used to the monitoring of the reaction progress. The Field Emission Scanning Electron Microscopy (FE-SEM) images and Energy Dispersive X-ray (EDX) were recorded with FEG-SEM MIRA3 TESCAN, Czech Republic at 1000 kV. Brunauer–Emmett–Teller (BET) was recorded by Micromeritics NOVA 2000 (Florida, USA) apparatus at 77 K using nitrogen as the adsorption gas.
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10

Comprehensive Characterization of Symmetric Supercapacitors

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We have
used SEM to characterize the morphological features of all samples
by employing a FEG-SEM MIRA 3 (Tescan, Czech Republic). Due to the
high electrical conductivity of the samples, no previous metal-sputtering
treatment was necessary (except for the pure ESM, where a fine gold
layer was deposited). Raman spectra were obtained in the 800–2000
cm–1 region by using a microscopic confocal Raman
spectrometer (LabRAM Aramis; HORIBA Jobin Yvon, France), with a 633
nm He–Ne laser. The electrochemical testing of the prototype
symmetric SCs was carried in a two-electrode configuration. The devices
were mounted in a Solartron 12962A sample holder between two carbon
cloth electrodes. All electrochemical (cyclic voltammetry, galvanostatic
CD, and electrochemical impedance) measurements were carried out at
room temperature using Autolab PGSTAT302N (Metrohm, Switzerland).
FTIR measurements were performed using the KBr method in IR Prestige-21
Fourier Transform Infra-Red Spectrometer (Shimadzu, Japan).
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