X-ray powder diffraction (XRD) experiments were carried out using a Rigaku TTRIII X-ray diffractometer (Rigaku D/max-3B, Tokyo, Japan) with Cu Kα radiation. The Brunauer–Emmett–Teller (BET) surface area was measured on a Micromeritics Tristar II Surface Area and Porosity Analyzer (Micromeritics, Norcross, GA, USA). A pore size distribution was obtained by Barrett–Joyner–Halenda (BJH) method using nitrogen desorption data measured at 77 K. Scanning electron microscopy (SEM) images were taken by FEIQuanta200FEG microscope (FEI, Eindhoven, The Netherlands) at an accelerating voltage of 15 kV. The transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM) images were obtained by JEM Fas-TEM-3010 electron microscope instrument (JEOL, Tokyo, Japan) at the accelerating voltage of 200 kV. UV–Vis diffuse reflectance spectra (UV–Vis DRS) were measured by UV-2401PC photometer (Shimadzu, Kyoto, Japan) using BaSO4 as a reflectance standard. X-ray photoelectron spectroscopy (XPS) measurements were performed using a Thermo Scientific K-Alpha XPS system (Thermo Fisher Scientific, Waltham, MA, USA) equipped with a monochromatic Al Kα source.
Ttriii x ray diffractometer
Manufactured by Rigaku
Sourced in Japan
The TTRIII is a Rigaku X-ray diffractometer designed for the analysis of crystalline materials. It utilizes X-ray diffraction techniques to identify and characterize the atomic and molecular structure of samples. The TTRIII provides accurate and reliable data for a wide range of applications in materials science, chemistry, and mineralogy.
Automatically generated - may contain errors
Lab products found in correlation
Tristar 2 surface area and porosity analyzer, by Micromeritics (1 mentions)
Thermo scientific k alpha xps system, by Thermo Fisher Scientific (1 mentions)
Uv 2401pc photometer, by Shimadzu (1 mentions)
Jsm it300lv, by JEOL (1 mentions)
Nicolet model 6700, by Thermo Fisher Scientific (1 mentions)
Dpx 400 spectrometer, by Bruker (1 mentions)
Multimode 8 system, by Bruker (1 mentions)
Tem 2010 electron microscope, by JEOL (1 mentions)
Tensor 37 spectrometer, by Bruker (1 mentions)
Uv 550 spectrophotometer, by Jasco (1 mentions)
Evo 18, by Zeiss (1 mentions)
Jem 2200f, by JEOL (1 mentions)
Jsm 7500f, by JEOL (1 mentions)
Gemini 7, by Micromeritics (1 mentions)
Sta449f3, by Netzsch (1 mentions)
Jem 2100f, by JEOL (1 mentions)
Vario el 3 elemental analyzer, by Elementar (1 mentions)
Icap 7000, by Thermo Fisher Scientific (1 mentions)
Jsm 6360lv, by JEOL (1 mentions)
Nicolet 6700 spectrophotometer, by Thermo Fisher Scientific (1 mentions)
7 protocols using ttriii x ray diffractometer
1
Comprehensive Characterization of Materials
2
Characterization of Materials by IR, XRD, and SEM
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The infrared spectrometer of the Nicolet 6700 model was made by Thermo Fisher Scientific Corporation of the United States of America. The test spectral range was 4000 cm−1 to 450 cm−1 and the resolution was 4 cm−1. The instrument used in this paper is a TTR III X-ray diffractometer from Rigaku Corporation, Japan. The radiation source is Cu Kα (λ = 1.54056 Å) with a test range of 10–80°, and the scanning speed is 5° min−1. The morphology of the materials was tested by a scanning electron microscope (SEM, JEOL JSM-IT300LV).
3
Petrographic Analysis of Welded Tuff
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The petrographic features of the tuff were achieved by thin section identification. The samples of the welded tuff were cut into thin slices that were 30 μm thick and then polished. These slices were analyzed using a polarized light microscope Leica DM4P to identify the mineralogical and textural features. Meanwhile, the samples were powdered, passed through a 200-mesh sieve, and analyzed by a multifunctional Rigaku TTRIII X-ray diffractometer to characterize their mineralogical compositions. The weight percentage of the minerals was measured according to the standard analysis method (SY/T 5163-2018) for clay minerals and ordinary non-clay minerals in sedimentary rocks by X-ray diffraction [40 ].
4
Spectroscopy and Microscopy Characterization
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A JASCO UV-550 spectrophotometer was used
for the measurements of UV–vis spectra. 1H NMR spectra
(1H-400 MHz) were recorded on a Bruker DPX 400 spectrometer.
Elemental analyses were carried out with an Elementary Vario El. IR
spectra were recorded using a Bruker Tensor 37 spectrometer. The TEM
measurements were achieved by using a JEOL TEM-2010 electron microscope
(Japan) equipped with a charge-coupled device camera, operated at
200 kV. SEM images were obtained using a JEOL JEM-6510A scanning electron
microscope at 10 kV. The AFM images were recorded from a Bruker Multimode
8 system with a silicon cantilever by using tapping mode. XRD was
measured on a Rigaku TTRIII X-ray diffractometer (Japan) with Cu Kα
radiation (λ = 1.54 Å), which was operated at 45 kV, 100
mA. F-4500 FL spectrophotometer and JASCO J-815 CD spectropolarimeter
were used for fluorescence spectral measurements and CD spectral measurements,
respectively. For photodegradation measurements, a 500 W xenon arc
lamp (CEL-LAX-500 W, Beijing Aulighttech Co. Ltd, China) served as
the light source. In addition, the photodegradation experiment was
performed on a photocatalytic reactor which came from Beijing Aulighttech
Co. Ltd, China.
for the measurements of UV–vis spectra. 1H NMR spectra
(1H-400 MHz) were recorded on a Bruker DPX 400 spectrometer.
Elemental analyses were carried out with an Elementary Vario El. IR
spectra were recorded using a Bruker Tensor 37 spectrometer. The TEM
measurements were achieved by using a JEOL TEM-2010 electron microscope
(Japan) equipped with a charge-coupled device camera, operated at
200 kV. SEM images were obtained using a JEOL JEM-6510A scanning electron
microscope at 10 kV. The AFM images were recorded from a Bruker Multimode
8 system with a silicon cantilever by using tapping mode. XRD was
measured on a Rigaku TTRIII X-ray diffractometer (Japan) with Cu Kα
radiation (λ = 1.54 Å), which was operated at 45 kV, 100
mA. F-4500 FL spectrophotometer and JASCO J-815 CD spectropolarimeter
were used for fluorescence spectral measurements and CD spectral measurements,
respectively. For photodegradation measurements, a 500 W xenon arc
lamp (CEL-LAX-500 W, Beijing Aulighttech Co. Ltd, China) served as
the light source. In addition, the photodegradation experiment was
performed on a photocatalytic reactor which came from Beijing Aulighttech
Co. Ltd, China.
5
Characterization of Aluminum Powder Coatings
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The XRD patterns of the specimen coatings were recorded with a Rigaku TTRIII X-ray diffractometer equipped with a Cu Kα radiation source (λ = 0.15405 nm). The diffraction patterns of XRD were analyzed using the software of Crystallographic Search-Match. The Al powders and the coatings were observed with SEM (Zeiss EVO 18, special edition) and analyzed with affiliated energy-dispersive X-ray spectroscopy (EDS). In order to prevent the characterized aluminum powders from being sucked into the SEM vacuum system, either spherical or flaky Al powders was first dispersed in a drop of silica sol solution and then painted on a polished surface of a steel sheet of 10 × 10 mm to form a coating before the SEM observation. Some gold powder was then sprayed on the coating surface to increase the conductivity.
6
Comprehensive Materials Characterization Protocol
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XRD patterns were recorded on a Rigaku TTRIII X-ray diffractometer operated at 40 kV and 200 mA with Cu Kα radiation with a wavelength of 1.5406 Å. The field emission scanning electron microscopy (FESEM) images were obtained on a JSM-7500F (JEOL) microscope operating at 15 kV. Transmission electron microscopy (TEM) and high-resolution TEM images were recorded on a JEM-2200FS (JEOL) operating at 200 kV. The energy dispersive X-ray spectroscopic (EDS) elemental mapping and spectrum were investigated by the TEM attachment. The specific surface area was estimated from the Brunauer-Emmett-Teller (BET) measurements by using a Micromeritics Gemini VII apparatus (Surface Area and Porosity System).
7
Characterization of Inorganic Samples
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The morphology of samples was explored by a scanning electron microscope JEOL JSM-6360LV and a transmission electron microscope JEOL JEM-2100F. Powder X-ray diffraction (XRD) patterns were collected on a Rigaku TTR-III X-ray diffractometer with Cu Kα radiation (λ = 0.15406 nm). Bruker AXS Smart Apex II Single Crystal X-ray diffractometer was used to collect single crystal X-ray diffraction data. SHELX software was used to solve and refine the single crystral structure. Fourier transform infrared (FTIR) spectra of samples were recorded by a KBr pellet technique using a Thermo Fisher Nicolet 6700 spectrophotometer in the wavenumber range of 400–4000 cm−1. The percentage composition of C, H, N elements present in samples was determined using an Elementar Vario EL III elemental analyzer. The contents of nickel in solid samples and reaction solutions were determined by ICP-AES instrument (ICP, Thermo Scientific, iCAP 7000). Thermogravimetric (TG) analysis was determined on Netzsch STA-449F3 TG/DTG instrument within a temperature range of 30 °C to 600 °C with a heating rate of 10 °C min−1 under an argon atmosphere.
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