Jspm 5200

The morphologies were investigated by SEM (Hitachi SU8010), AFM (JEOL JSPM‐5200), and field emission transmission electron microscope (FE‐TEM, G2 60–300, FEI) equipped with EDS (Super‐X). The chemistry information was examined by XRD (Bruker D2 Phaser X‐Ray Diffractometer with Cu Kα radiation) and Raman spectroscopy (a Kr‐Ar ion laser at 633 nm produced by Spectra‐Physics Beamlok 2060‐RS laser combining Symphony CCD‐1LS detection system). The nitrogen adsorption–desorption isotherms were measured with a Quantachrome Autosorb AS‐6B system. The near surface chemical state of different elements was also done via XPS (ESCALAB 250 Xi). TGA was conducted by SDT Q600 (TA Instruments) in air with a ramp rate of 10 °C min⁻¹.

Atomic force microscopy (AFM) was used to investigate the morphology of the GD and Al monolayers. A commercial 1.5 kV-AFM microscope (JSPM-5200; JEOL Ltd., Tokyo, Japan) and JEOL-original SPS mapping software (vol.54) in contact mode using a 10 μm tube-type scanner were employed. Both vertical and lateral deflections were detected by an optical beam deflection method with a four-segment photodetector to observe topographic and frictional forces, respectively. The resolution of the AFM image was about a mica atomic image. An HOPG (highly oriented pyloric graphite) substrate of area 20 × 20 mm² was attached to the tip of the auto-elevation system and dipped into the water phase in a glass dish. The GD and Al monolayers were formed on the water surface, and after more than 45 min following the completion of monolayer formation, the HOPG substrate in water was horizontally scooped from below the monolayer using the scooping-up method [13 ,14 (link),15 (link),19 (link)]. With a 1 mm/min transfer velocity, the monolayer was transferred to the substrate at 26 ± 1 °C.

SEM-EDS were recorded on a Hitachi S-4300. The polarized reflectivity spectra were recorded on a JASCO MSV-5300YMT. The reflectance (%R) was obtained from the quotient of the sample and the Al deposition mirror as a standard. STM current images were recorded using a JEOL JSPM-5200 with a Pt/Ir(20%) (ϕ = 0.3 mm) probe under atmospheric pressure at room temperature. All data were summarized in an Excel file for the Source Data.

The magnetic domains and topography analysis of the surface of the nanoparticles were performed using Scanning Probe Microscope JEOL, JSPM-5200 in Magnetic Force Microscopy mode (MFM). All powder samples were confined separately in carbon adhesive tape. A magnetic tip NSC18, Co-Cr/Al Micromasch, with an uncoated radius of 8 nm, coated radius <60 nm, and full tip cone angle of 40°, was used. This tip was magnetized with a neodymium magnet 5 min prior to the characterization. The 2D and 3D images, profiles, and domain measurements were processed with Gwyddion 2.62 software.

Transmission electron microscopy (TEM) investigation was performed with an ARM 200F Cold FEG TEM/STEM equipped with a GIF Quantum ER (JEOL, Japan). Scanning electron microscopy (SEM) analyses were carried out with a JSM-840 (JEOL, Japan) or SUPRA 55 apparatus equipped with an energy-dispersive X-ray (EDX) microanalyzer (Zeiss, Germany), and the high-resolution SEM micrographs were obtained with the model JSM-IT500HR apparatus (JEOL). Atomic force microscopy (AFM) analysis was performed with Asylum JEOL JSPM-5200. Raman spectroscopy measurements were carried out with a RenishawinVia spectrometer with a green light laser (532 nm). X-ray diffraction (XRD) pattern was obtained using the Nanoviewer from Rigaku (CuK α radiation) at a scanning rate of 5 °C/min.

Morphology of the synthesized graphene was characterized by both scanning electron microscopy (SEM, JSM-6500F/JSM-7001F, JEOL) and transmission electron microscopy (TEM, JEM-2100, JEOL). Atomic force microscopy (AFM) samples were prepared by spin-coating the rGO dispersion on a Si wafer. AFM measurements were conducted with a scanning probe microscope (JSPM-5200, JEOL) using the tapping mode. The structure was also examined by using powder X-ray diffraction (XRD, Rigaku SmartLab using Cu-Kα radiation with λ = 1.5418 Å) and Raman spectroscopy (Nanophoton Raman Plus, λ = 532 nm). The functional groups on GO and graphene were characterized with X-ray photoelectron spectroscopy (XPS, ULVAC-PHI Quantera SXM) and Fourier transform infrared spectroscopy (FTIR, Shimadzu, IRTracer-100). Elemental analyses were performed with energy-dispersive X-ray spectroscopy (EDS, JED-2300, JEOL). Nitrogen adsorption–desorption data (Quantachrome Autosorb iQ) were collected to calculate the specific surface area by the Brunauer–Emmett–Teller (BET) method and the distribution of pore sizes was obtained using density functional theory (DFT) calculations.