The morphologies of the samples were observed by a JSM-6700F electron microscope (JEOL, Japan) with an acceleration voltage of 30 kV. The FTIR spectrums of the samples were surveyed using Nicolet 5700 FTIR spectrometer with a resolution of 4 cm−1 through KBr method. Raman spectra were measured on InVia Raman Microscope. Excitation was by means of the 488 nm line of an argon ion laser with an output power in the range of 200 to 300 mw. The instrument is equipped with a microscope with a focal spot size in the range of a few micrometers. The adsorption-desorption isotherms of nitrogen were measured at 77 K by using a Micromeritics ASAP 2420 analyzer. The EDS spectra (JEOL JSM-6700F, Japan) were also used to analyze the composition of the samples. XPS spectrum was collected on a Thermo ESCALAB 250. The morphology and structure of the samples were analyzed by TEM using a FEI Tecnai G2 F20 s-twin D573 operated at 200 kV.
Asap 2420 analyzer
Manufactured by Micromeritics
Sourced in United States
The ASAP 2420 is a surface area and porosity analyzer manufactured by Micromeritics. It utilizes the static volumetric technique to measure the surface area and pore size distribution of a wide range of materials. The instrument is capable of determining the physical characteristics of solids, powders, and porous materials.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250, by Thermo Fisher Scientific (3 mentions)
Jsm 6700f electron microscope, by JEOL (1 mentions)
Tecnai g2 f20 s twin d573, by Thermo Fisher Scientific (1 mentions)
Jsm 6700f, by JEOL (1 mentions)
Escalab xi, by Thermo Fisher Scientific (1 mentions)
Zen 3600 zetasizer, by Malvern Panalytical (1 mentions)
Ultrospec 2100 pro spectrophotometer, by Cytiva (1 mentions)
Jem 2100f tem microscope, by JEOL (1 mentions)
Smartlab x ray diffractometer, by Rigaku (1 mentions)
Su8010, by Hitachi (1 mentions)
Vertex 70, by Bruker (1 mentions)
5 protocols using asap 2420 analyzer
1
Comprehensive Material Characterization
2
Detailed Structural and Compositional Analysis
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X-ray diffraction (XRD) were recorded on a Panalytical X’pert PRO diffraction-meter (40 kV, 40 mA) using Cu Kα radiation source (λ = 1.540598 Å) at a scanning step of 1.2° min−1 in the 2θ range from 4° to 80°. N2 adsorption-desorption isotherms were measured using Micromeritics ASAP-2420 analyzer at 77 K. Prior to N2 adsorption, all of the samples were evacuated under a vacuum for 3 h at 423K. Brunauer-Emmett-Teller (BET) method was adopted to calculate the total surface area (SBET). Total pore volume (Vtot) was determined by a single point method from the volume adsorbed at p/p0 = 0.95. The micropore surface area (Smic), external surface area (Sext) and the micropore volume (Vmic) was calculated by the t-plot method. The elementary composition was measured by inductively Coupled Plasma Optical Emission Spectrometer Agilent 5110 (ICP). Transmission electron micrographs (TEM) were taken on a FEI Tecnai G2 F20 X-Twin electron microscopes operating at 200 kV. XPS was collected on a Thermo Scientific Escalab Xi+ with an Al Kα = 1486.60 eV and the binding energies were calibrated by referencing the C 1s peak (284.8 eV) to reduce the sample charge effect.
3
Characterization of Lindlar Catalyst
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Commercial Lindlar catalyst composed
of metallic palladium (4–5% according to the producer) deposed
on calcium carbonate deactivated with lead oxide (PbO) was purchased
from Sigma-Aldrich. The catalyst is in reduced form (Pd0) and is maintained in this state thanks to the reductive atmosphere
in the reactor.
The catalyst is characterized by ICP–AES
analysis and BET and BJH methods for surface area and porosity.
Elementary analysis of the Lindlar catalyst was determined by a VARIAN
720-ES ICP–AES. The solid sample was attacked with a strong
acid and then diluted with deionized water, before being nebulized
into an analytical nebulizer onto the plasma flame.
The sample
(150 mg, 50 μm < dp < 100
μm) was degassed in the degassing unit of a Micromeritics ASAP
2420 analyzer at 100 °C for 8 h with ramp program of 10 °C/min.
In the same apparatus, N2 adsorption and desorption isotherms
at −196 °C were recorded and specific surface area (SBET) and volume (VBJHdes and VBJHads) were calculated. For the
average pore size of the sample, both the BJH distribution and the
average value assuming homogeneous cylindrical pores are reported.
of metallic palladium (4–5% according to the producer) deposed
on calcium carbonate deactivated with lead oxide (PbO) was purchased
from Sigma-Aldrich. The catalyst is in reduced form (Pd0) and is maintained in this state thanks to the reductive atmosphere
in the reactor.
The catalyst is characterized by ICP–AES
analysis and BET and BJH methods for surface area and porosity.
Elementary analysis of the Lindlar catalyst was determined by a VARIAN
720-ES ICP–AES. The solid sample was attacked with a strong
acid and then diluted with deionized water, before being nebulized
into an analytical nebulizer onto the plasma flame.
The sample
(150 mg, 50 μm < dp < 100
μm) was degassed in the degassing unit of a Micromeritics ASAP
2420 analyzer at 100 °C for 8 h with ramp program of 10 °C/min.
In the same apparatus, N2 adsorption and desorption isotherms
at −196 °C were recorded and specific surface area (SBET) and volume (VBJHdes and VBJHads) were calculated. For the
average pore size of the sample, both the BJH distribution and the
average value assuming homogeneous cylindrical pores are reported.
4
Characterization of PCN-222 Nanosheets
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Transmission Electron Microscopy (TEM) images were collected using a JEOL JEM-2100F TEM microscope. Scanning Electron Microscopy (SEM) images were obtained using a JEOL Field Emission SEM microscope. The ultraviolet–visible (UV-vis) absorbance levels of PCN−222 and PCN−222@ICG were measured using an Ultrospec 2100 Pro spectrophotometer (Amersham Biosciences). Powder X-ray diffraction (PXRD) patterns were collected at 293 K using a Rigaku SmartLab X-Ray diffractometer via Cu Kα radiation. The zeta potential and size distribution of the PCN−222@ICG nanosheets were measured using a Malvern ZEN 3600 Zetasizer. The Fourier Transform Infrared (FT-IR) spectra were obtained using a Bruker Vertex-70 IR Spectroscopy in the wavelength region of 400–4000 cm−1. Brunauer–Emmett–Teller (BET) surface area analysis was performed using a Micromeritics ASAP 2420 analyzer.
5
Hexahedral ZIF-8 and BCL-ZIF-8 Characterization
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The specific morphological structure for hexahedral, hierarchical ZIF-8 and BCL-ZIF-8 was determined by a Hitachi SU-8010, field-emission scanning electron microscope (FE-SEM) (Hitachi, Tokyo, Japan). A drop of the samples was placed in the center of the carbon-coated grids to observe the dimensions and details of the samples obtained using a Hitachi H-7000A transmission electron microscope (TEM). FTIR microscopy (Bruker VERTEX 70, Germany) was used in transmission mode utilizing the KBr pellet technique, with a range of 400−4000 cm−1. Additionally, powder X-ray diffraction (PXRD) (Empyrean PANalytical Company, Almelo, Netherlands) analyses were carried out using potassium and copper radiation (40 kV, 40 mA) to examine the crystalloid structure of the samples. Nitrogen adsorption–desorption data were recorded using a Micromeritics ASAP 2420 analyzer (Micromeritics Instrument (Shanghai), Norcross, GA, USA) at 77 K. Preceding the measurement, the sample was freed of unwanted or excess gas at 140 °C for 7 h in the line of vacuum. The specific surface area was calculated by applying the Brunauer–Emmett–Teller (BET) method in the domain of relative pressure. The pore-size was determined from the desorption branch of the isotherms using the Barrett–Joyner–Halenda (BJH) method.
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