Fe tem
The FE-TEM is a field emission transmission electron microscope (FE-TEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of materials at the nanoscale level. The FE-TEM utilizes a field emission electron source to generate a high-brightness electron beam, which is then focused and accelerated through the specimen using electromagnetic lenses.
Lab products found in correlation
7 protocols using fe tem
TEM Analysis of 2D Nanomaterials
TEM Imaging of Alum and PGA/Alum
Ultrastructural Analysis of Cells after rAAV Transduction
Characterization of ZrO2/Ag3PO4 Nanoparticles
Structural and Optical Characterization of Ceramic Material
Characterization of PFC/ICG Nanoemulsions
The emission and absorption spectra were obtained on a Perkin-Elmer LS-55 and a Beckman Coulter UV–VIS spectrophotometer (DU 800). The size of the PFC/ICG nanoemulsions was analyzed via dynamic light scattering using an electrophoretic light scattering photometer (ELS-Z, Otsuka Electronics, Osaka, Japan). The NIR fluorescence images of the PFC/ICG nanoemulsions were obtained using the IVIS Lumina imaging system (Caliper Life Science, MA) with an ICG filter set.
Characterization of Synthesized Nanoparticles
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