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Fe tem

Manufactured by JEOL
Sourced in Japan

The FE-TEM is a field emission transmission electron microscope (FE-TEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of materials at the nanoscale level. The FE-TEM utilizes a field emission electron source to generate a high-brightness electron beam, which is then focused and accelerated through the specimen using electromagnetic lenses.

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7 protocols using fe tem

1

TEM Analysis of 2D Nanomaterials

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The nanosheets were further analysed using a TEM. A drop of dispersion was casted on holy carbon grid (400 mesh) for the measurement. Low-resolution TEM imaging was conducted using FE-TEM manufactured by JEOL Ltd. with the acceleration voltage of 200 kV. The upper row of Supplementary Fig. 5 shows the typical images of 2D materials. We can observe monolayer, folded mono- or bi- layer, and few layers. In addition, thickness distributions of sheets were plotted through the investigation in TEM results as shown in the lower row of Supplementary Fig. 5. Overall, about 10% of the flakes were monolayer, and about 87 % of observed flakes were thinner than 5 layers. In fact, we can know that the dispersions prepared by present method contain very thin nanosheets.
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2

TEM Imaging of Alum and PGA/Alum

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TEM images of alum and PGA/Alum were obtained using a field-emission transmission electron microscope (FE-TEM; JEOL Ltd.). For visualization, alum and PGA/Alum (100 μg/ml) solutions were dropped and dried on a formvar- and carbon-coated copper grid (Ted Pella, Inc).
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3

Ultrastructural Analysis of Cells after rAAV Transduction

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After rAAV infection, all cell media were removed by aspiration, and immediately add 250 μL of a warm (30–37 °C) 2% (vol/vol) glutaraldehyde solution by gentle pipetting. The cells were incubated at room temperature for 5 min and then placed on ice for 60 min. The cells were washed three times for ~ 1 min each time in 250 μL of cold (0–4 °C) 1 × sodium cacodylate, and then washes were performed gently, removing the liquid from the cells by aspiration. 250 μL of cold (0–4 °C) 20 mM glycine solution was added to cells for 5 min on ice and then removed by gentle aspiration and washed three times for 1 min each time in a cold buffer. After removing the buffer, 250 μL of 1 × DAB solution with 10 mM H2O2 was added for 5–45 min until a light brown stain was visible under a stereo light microscope, and then the DAB solution was removed and washed three times for 1 min each time in 1 × sodium cacodylate. Cells were pelleted via centrifugation at 1,000 rpm for 5 min and fixed with 2.5% glutaraldehyde (Sigma) for 1 day at 4 °C. The pellet was then incubated in 1% osmium tetroxide (OsO4, Sigma) for 1 h, dehydrated in a series of alcohol, and substituted with 100% propylene oxide. The cells were then embedded in the solution comprising propylene oxide and Epon812 for 24 h and solidified at 70 °C. Finally, the cells are sliced to a thickness of 70 nm and imaged by TEM (FE-TEM, JEOL).
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4

Characterization of ZrO2/Ag3PO4 Nanoparticles

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The phases and crystal structure of ZrO2/Ag3PO4 nanoparticles were determined by X-ray diffraction (XRD, Rigaku, Tokyo, Japan). SEM (TESCAN, Brno, Czech Republic) equipped with an energy-dispersive X-ray spectrometer (EDX) was utilized to study the elemental composition of ZrO2/Ag3PO4. The morphology and size of nanoparticles were determined by field emission electron microscope (FE-TEM, JEOL, Tokyo, Japan). UV-visible diffuse reflectance spectrum (DRS) was obtained on a UV-visible spectrophotometer (JASCO-V-750, Helsinki, Finland).
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5

Structural and Optical Characterization of Ceramic Material

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XRD (Bruker, D8 ADVANCE for variable temperature tests and D2 PHASER for room temperature tests) with Cu Ka radiation (λ = 1.5406 Å) and Raman spectroscopy (Renishaw inVia reflex) were used to determine the crystal structure. The microstructure was recorded by a field emission scanning electron microscope (FE‐SEM, S‐4800, Hitachi, Tokyo, Japan). Spectroscopic ellipsometry (SE) measurements was used to measure the optical dielectric constant in the photon energy range of 1.24–4.96 eV (1000–250 nm) (V‐VASE by J. A. Woollam Co., Inc.), and a three‐layer structure model (air, rough layer, and ceramics) is used to fit the spectra. The response of domains were studied by a commercial AFM systen (Jupiter XR, Oxford, UK). The selected area electron diffraction and domain morphology observation were performed using a JEM‐2100F filed‐emission transmission electron microscope (FE‐TEM, JEOL, Japan).
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6

Characterization of PFC/ICG Nanoemulsions

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To evaluate the characteristics of the PFC/ICG nanoemulsions, a JEOL FE-TEM (transmission electron microscope) was utilized, and the TEM images were captured at 200 kV using a device from Tecnai. The PFC/ICG nanoemulsions were drop-cast onto carbon-coated TEM grids preliminarily stained with 2% uranyl acetate, and the solution was dried in a vacuum oven.
The emission and absorption spectra were obtained on a Perkin-Elmer LS-55 and a Beckman Coulter UV–VIS spectrophotometer (DU 800). The size of the PFC/ICG nanoemulsions was analyzed via dynamic light scattering using an electrophoretic light scattering photometer (ELS-Z, Otsuka Electronics, Osaka, Japan). The NIR fluorescence images of the PFC/ICG nanoemulsions were obtained using the IVIS Lumina imaging system (Caliper Life Science, MA) with an ICG filter set.
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7

Characterization of Synthesized Nanoparticles

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UV-Vis spectrophotometer (UV-vis; Optizen POP; Mecasys, Daejeon, Korea) was used to confirm the reduction of metal ions and was scanned in the range of 300-800 nm. The morphology of purified nanoparticles was analysed by using field emission transmission electron microscopy (FE-TEM) with a JEM-2100F (JEOL, Tokyo, Japan) instrument operated at 200 kV. Further, the elemental mapping, selected area diffraction pattern (SAED) and energy-dispersive X-ray spectroscopy (EDS) of nanoparticles have been performed using FE-TEM (JEOL, Tokyo, Japan). The sample for FE-TEM was prepared by placing a drop of collected nanoparticles dispersed in water on carbon coated copper grid and subsequently drying at room temperature before transferring it to the microscope. The X-ray diffraction (XRD) pattern for synthesized nanoparticles was recorded using XRD, D8 Advance, (Bruker, Bremen, Germany), operated at 40 kV, 40 mA, with CuKa radiation, at a scanning rate of 6 /min, step size 0.02, over the 2h range of 20-80 . The particle size distribution and zeta potential of the nanoparticles were studied using zetasizer Nano-ZS90 (Malvern Instruments, Worcestershire, UK). The functional groups capped on surface of the AgNPs were identified using a Fourier-transform infrared (FTIR) spectroscopy (Spectrum One System, Perkin-Elmer, Waltham, MA).
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