The coatings were characterized by XRD, SEM, and AFM as described. AFM (Multimode SPM; Digital Instruments) was used to quantify surface roughness and surface area for all of the coatings of interest. AFM scanning was conducted at five random places, at a scanning rate of 1 Hz, in tapping mode.
Multimode spm
Manufactured by Digital Instruments
Sourced in Germany
The Multimode SPM is a versatile scanning probe microscope that allows for high-resolution imaging and analysis of a wide range of samples. It provides users with the ability to perform various scanning probe microscopy techniques, including atomic force microscopy (AFM) and scanning tunneling microscopy (STM). The Multimode SPM is a powerful tool for researchers and scientists in fields such as material science, nanotechnology, and surface science.
Automatically generated - may contain errors
3 protocols using multimode spm
1
Characterization of Coatings by XRD, SEM, and AFM
2
Atomic Force Microscopy Imaging Protocol
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
AFM images were recorded on a Digital Instruments Multimode SPM instrument with a Nanoscope IIIa controller. This was operated in tapping mode with a “J” scanner having a lateral range of approximately 100 μm and a vertical range of 6 μm. Silicon probes (Nascatec GmbH model NST NCHFR) were used, with resonant frequencies of approximately 320 kHz. Calibration of the AFM was accomplished by scanning a 10 μm pitch with 200 nm 3D reference from Digital instruments. Contact‐mode AFM was found to be unsuitable (despite its better lateral resolution with respect to tapping‐mode AFM), as it physically removed any deposits from the area scanned.
3
Chaperone-Assisted Amyloid Aggregate Analysis
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
HypF-N oligomers were incubated in the presence of each chaperone as described above. Samples containing HypF-N oligomers incubated in isolation and in combination of increasing concentrations of each chaperone were then diluted 100-fold; 10 μl aliquots of the diluted samples were deposited on freshly cleaved mica and dried under mild vacuum. Tapping mode AFM images were acquired in air using a Multimode SPM, equipped with 'E' scanning head (maximum scan size 10 μm) and driven by a Nanoscope V controller, and a Dimension 3100 SPM, equipped with a 'G' scanning head (maximum scan size 100 μm) and driven by a Nanoscope IIIa controller (Digital Instruments, Bruker AXS GmbH, Karlsruhe, Germany). Single beam uncoated silicon cantilevers (type OMCL-AC160TS, Olympus, Tokyo, Japan) were used. The drive frequency was 290-340 kHz and the scan rate was 0.3-0.8 Hz. Aggregate sizes were estimated from heights and widths in cross section of the topographic AFM images. For aggregates obtained in the presence of chaperones, to take into account possible asymmetries in the aggregate shape, we considered both the maximum and minimum widths and the corresponding heights evaluated along the same image sections.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!