Jsm 661olv
The JSM-661OLV is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a low-vacuum (LV) mode that allows for the observation of non-conductive and hydrated specimens without the need for prior sample preparation. The JSM-661OLV is equipped with a high-performance electron optical system and advanced imaging capabilities, making it a versatile tool for various applications in materials science, life sciences, and other research fields.
Lab products found in correlation
2 protocols using jsm 661olv
Electrochemical Characterization of Fe3O4@Graphene
Uniform Dispersion of TiO2 Nanoparticles in GIC
240 V, 50/60 Hz), speed range 0- 2000 rpm was used for
mixing the GIC with TiO2 nanoparticles. A scanning electron
microscope (JEOL JSM-661 OLV, Tokyo, Japan) was used to
assess the uniform distribution of nanoparticles in GIC at Advanced
Analytical Laboratory, Andhra University, Visakhapatnam,
Andhra Pradesh, India (Figure 1). Inductively Coupled
Plasma Mass Spectrometry (ICP-MS), Andhra University, Visakhapatnam
was used for quantification of ions. Mueller
Hinton agar plate, (HI-Media lab pvt.ltd., Mumbai, India) was
used to evaluate the anti-bacterial activity for S. mutans.
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