The morphologies and sizes of MSNbs, GSNbs, and GNSbs were observed using surface (JEOL, JSM-7600F, Tokyo, Japan) and transmission electron microscopy (JEOL, JEM-752000EX II, Tokyo, Japan). Particle size and Zeta potential were measured via the dynamic light scattering method (DLS; Malvern Zetasizer Nano Series, ZS90, Worcestershire, UK). The MSNBs’ and GNSBs’ chemical structures were studied using Fourier transform infrared spectroscopy (Spectrum 100FT-IR Spectrometers, PerkinElmer, Waltham, MA, USA). The powder X-ray diffraction (XRD) patterns were extracted with an X-ray diffractometer (XRD, Rigaku D/max 2500 XRD, Tokyo, Japan) with Cu-k radiation and = 1.54178 Å.
D max 2500 xrd
Manufactured by Rigaku
Sourced in Japan
The D/max 2500 XRD is an X-ray diffractometer designed for materials analysis. It is capable of performing X-ray diffraction measurements to identify and characterize various crystalline materials. The device features a high-power X-ray source and advanced detection system to provide accurate and reliable results.
Automatically generated - may contain errors
Lab products found in correlation
Zetasizer nano series zs90, by Malvern Panalytical (1 mentions)
Jsm 7600f, by JEOL (1 mentions)
Mastersizer 2000, by Malvern Panalytical (1 mentions)
Jsm 5900, by JEOL (1 mentions)
Nanosem650, by Thermo Fisher Scientific (1 mentions)
Auriga fib sem, by Zeiss (1 mentions)
Libra 200, by Zeiss (1 mentions)
Escalab 250xi x ray photoelectron spectrometer, by Thermo Fisher Scientific (1 mentions)
Gemini 7, by Micromeritics (1 mentions)
Nova nanosem 230, by JEOL (1 mentions)
6 protocols using d max 2500 xrd
1
Characterization of Nanoparticle Morphologies
2
Characterization of Mussel Shell Powder
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The chemical composition of mussel seashells powder was determined by X-ray fluorescence spectrometry (XRF, ARL ADVANT’XP). In addition, the particle size distribution of the mussel shell powder was measured by using a laser particle size analyzer (Malvern, Mastersizer 2000). Rigaku D/Max-2500 XRD, Cu-Kα (1.541874 Å) was used to investigate the phase structure of the prepared samples.
The physical properties of CCNPs were tested by the following characterization: particle morphology disclosed through a scanning electron microscope (SEM, JEOL JSM-5900); and the thickness of CCNPs were considered by atomic force microscope (AFM, Veeco Autoprobe CP Research).
The physical properties of CCNPs were tested by the following characterization: particle morphology disclosed through a scanning electron microscope (SEM, JEOL JSM-5900); and the thickness of CCNPs were considered by atomic force microscope (AFM, Veeco Autoprobe CP Research).
3
Electrode Characterization by SEM and XRD
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The size and morphologies of as-prepared electrodes were characterized by a field-emission scanning electron microscope (SEM, FEI NanoSEM650) operating at 20 kV. X-ray diffraction (XRD) patterns were collected on Rigaku D/MAX-2500 XRD with Cu Kα radiation (40 kV, 40 mA, λ = 1.5418 Å), recorded with 2θ ranging from 5° to 90°, 10°/min.
4
Structural and Compositional Analysis of NiMgAl LDHs
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The crystallographic structure and phase composition of as-obtained samples were analyzed by the Rigaku D/max-2500 XRD using a Cu Kα radiation source (λ = 1.5406 Å). The morphological investigations of these samples were conducted by focused ion beam (Zeiss Auriga FIB/SEM) equipped with an energy dispersive X-ray spectrometer (EDS) attachment with an acceleration voltage of 5 kV. The lattice information on nanoscale was collected by high-resolution transmission electron microscopy (HRTEM, Zeiss Libra 200) with an acceleration voltage of 200 kV. Specific surface area and porosity of NiMgAl LDHs were determined by N2 adsorption–desorption isotherms at 77 K using micromeritics Gemini VII. The information of chemical states was analyzed by the Thermo ESCALAB 250Xi X-ray photoelectron spectrometer (Al Kα, 1486.6 eV) at the scope range from 0 to 1350 eV.
5
Crystalline Structure Analysis of Bio-Synthesized Ag-NPs
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XRD was used to examine the crystalline structure and purity of the biosynthesized Ca-AgNPs. The atoms place themselves at an appropriate distance on the crystalline plane and show a form of diffraction [41 (link)]. The experiment was carried out on an X-ray diffractometer (DMAX-2500 XRD) (Rigaku, Tokyo, Japan) using a Nickel filter and Cu Kα (1.540 A°) radiation on 40 kV and 30 mA, and a perusing assortment used between 30 and 80°.
6
Characterization of Si/void/SiO2/void/C Nanospheres
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The morphology and diameter of the Si/void/SiO2/void/C nanospheres were characterized with a scanning electron microscope (SEM, FEI Nova Nano SEM 230) and a transmission electron microscope (TEM, JEOLJEM-2100F). Powder X-ray diffraction (XRD) patterns were obtained using an X-ray diffractometer (XRD, Rigaku D/max 2500 XRD with Cu-Kα radiation, λ = 1.54178 Å). The amount of C in the Si/void/SiO2/void/C nanoparticles was confirmed by a combined differential scanning calorimetry (DSC) and thermogravimetric analysis (TGA) instrument (SDT, Q600) in air atmosphere with a heating rate of 5 °C/min. Raman (LabRam HR-800) and Fourier transform infrared spectroscopy (FTIR) (NICOLET 6700) were also conducted.
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