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Highscore 4

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HighScore 4.1 is a software application developed by Malvern Panalytical. It is designed to analyze and interpret data from various analytical instruments, including X-ray diffraction (XRD) and X-ray fluorescence (XRF) systems. The software provides a comprehensive suite of data processing and analysis tools to help users extract meaningful information from their experimental data.

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Empyrean x ray diffractometer, by Malvern Panalytical (6 mentions)

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HighScore 4.1 softwarefrom (2 citations)

10 protocols using highscore 4

1

X-ray Diffraction Characterization of Materials

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X-ray diffraction (XRD)
measurements were performed with a PANalytical Empyrean X-ray diffractometer
equipped with a 1.8 kW Cu Kα ceramic X-ray tube (1.5418 Å)
and a PIXcel3D 2 mm × 2 mm area detector, operating
at 45 kV and 40 mA. The reflections were collected at room temperature
using a parallel-beam geometry and symmetric reflection mode, in a
2θ range of 15–70° with a step time of 450 s and
a step size of 0.1°, repeating the measurement four times to
reduce the signal noise. The XRD results were analyzed using HighScore
4.1 software (PANalytical).
Morselli D., Cataldi P., Paul U.C., Ceseracciu L., Benitez J.J., Scarpellini A., Guzman-Puyol S., Heredia A., Valentini P., Pompa P.P., Marrero-López D., Athanassiou A, & Heredia-Guerrero J.A. (2021). Zinc Polyaleuritate Ionomer Coatings as a Sustainable, Alternative Technology for Bisphenol A-Free Metal Packaging. ACS Sustainable Chemistry & Engineering, 9(46), 15484-15495.
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2

XRD Analysis of Nanocrystalline Solutions

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The XRD analysis
was performed on a PANanalytical Empyrean X-ray diffractometer, equipped
with a 1.8 kW CuKα ceramic X-ray tube and a PIXcel3D 2 × 2 area detector, operating at 45 kV and 40 mA.
Specimens for the XRD measurements were prepared by dropping a concentrated
NC solution onto a silicon zero-diffraction single crystal substrate.
The diffraction patterns were collected under ambient conditions using
a parallel beam geometry and the symmetric reflection mode. XRD data
analysis was elaborated using the HighScore 4.1 software from PANalytical.
Locardi F., Cirignano M., Baranov D., Dang Z., Prato M., Drago F., Ferretti M., Pinchetti V., Fanciulli M., Brovelli S., De Trizio L, & Manna L. (2018). Colloidal Synthesis of Double Perovskite Cs2AgInCl6 and Mn-Doped Cs2AgInCl6 Nanocrystals. Journal of the American Chemical Society, 140(40), 12989-12995.
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3

Structural Characterization by X-ray Diffraction

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X-ray diffraction (XRD) patterns
were recorded on a PANalytical Empyrean X-ray diffractometer equipped
with a 1.8 kW Cu Kα ceramic X-ray tube, PIXcel3D 2
× 2 area detector and operating at 45 kV and 40 mA. The diffraction
patterns were collected in air at room temperature using parallel-beam
(PB) geometry and symmetric reflection mode. XRD data analysis was
carried out using HighScore 4.1 software from PANalytical.
Chen L., Dilena E., Paolella A., Bertoni G., Ansaldo A., Colombo M., Marras S., Scrosati B., Manna L, & Monaco S. (2016). Relevance of LiPF6 as Etching Agent of LiMnPO4 Colloidal Nanocrystals for High Rate Performing Li-ion Battery Cathodes. ACS Applied Materials & Interfaces, 8(6), 4069-4075.
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4

X-ray Diffraction Analysis of Materials

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XRD analysis was performed
on a PANalytical Empyrean X-ray diffractometer equipped with a 1.8
kW Cu Kα ceramic X-ray tube and PIXcel3D 2 ×
2 area detector, and operating at 45 kV and 40 mA. The diffraction
patterns were collected in air at room temperature using parallel-beam
(PB) geometry and symmetric reflection mode. XRD data analysis was
carried out using HighScore 4.1 software from PANalytical.
Xie Y., Bertoni G., Riedinger A., Sathya A., Prato M., Marras S., Tu R., Pellegrino T, & Manna L. (2015). Nanoscale Transformations in Covellite (CuS) Nanocrystals in the Presence of Divalent Metal Cations in a Mild Reducing Environment. Chemistry of Materials, 27(21), 7531-7537.
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5

XRD Analysis of Nanocrystal Samples

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XRD patterns of the
NCs were collected on a PANalytical Empyrean X-ray diffractometer
equipped with a 1.8 kW Cu Kα ceramic X-ray tube, PIXcel3D 2 × 2 area detector and operating at 45 kV and 40 mA.
The samples were prepared by dropping a concentrated NC solution or
by directly depositing a powder onto a zero-diffraction silicon substrate.
The diffraction patterns were performed at ambient conditions in a
parallel-beam geometry and symmetric reflection mode over an angular
range 30°–90°, with a step size of 0.05°. High
Score 4.1 software from PANalytical was used for phase identification.
Pasquale L., Najafishirtari S., Brescia R., Scarpellini A., Demirci C., Colombo M, & Manna L. (2021). Atmosphere-Induced Transient Structural Transformations of Pd–Cu and Pt–Cu Alloy Nanocrystals. Chemistry of Materials, 33(22), 8635-8648.
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6

X-ray Diffraction Analysis of Materials

Check if the same lab product or an alternative is used in the 5 most similar protocols
XRD analysis was performed on
a PANalytical Empyrean
X-ray diffractometer equipped with a 1.8 kW Cu Kα ceramic X-ray
tube and PIXcel3D 2 × 2 area detector, and operating
at 45 kV and 40 mA. The diffraction patterns were collected in air
at room temperature using parallel-beam (PB) geometry and symmetric
reflection mode. XRD data analysis was carried out using HighScore
4.1 software from PANalytical
Palazon F., Akkerman Q.A., Prato M, & Manna L. (2015). X-ray Lithography on Perovskite Nanocrystals Films: From Patterning with Anion-Exchange Reactions to Enhanced Stability in Air and Water. ACS Nano, 10(1), 1224-1230.
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7

X-ray Diffraction Analysis of Nanocrystals

Check if the same lab product or an alternative is used in the 5 most similar protocols
The XRD analysis
was performed on a PANanalytical Empyrean X-ray diffractometer equipped
with a 1.8 kW Cu Kα ceramic X-ray tube, PIXcel3D 2
× 2 area detector and operating at 45 kV and 40 mA. Specimens
for the XRD measurements were prepared by dropping a concentrated
NCs solution onto a quartz zero-diffraction single crystal substrate.
The diffraction patterns were collected at ambient conditions using
a parallel beam geometry and symmetric reflection mode. XRD data analysis
was carried out using the HighScore 4.1 software from PANalytical.
Urso C., Barawi M., Gaspari R., Sirigu G., Kriegel I., Zavelani-Rossi M., Scotognella F., Manca M., Prato M., De Trizio L, & Manna L. (2016). Colloidal Synthesis of Bipolar Off-Stoichiometric Gallium Iron Oxide Spinel-Type Nanocrystals with Near-IR Plasmon Resonance. Journal of the American Chemical Society, 139(3), 1198-1206.
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8

X-ray Diffraction Characterization of Nanocrystals

Check if the same lab product or an alternative is used in the 5 most similar protocols
XRD patterns
were acquired with a PANanalytical Empyrean X-ray diffractometer equipped
with a 1.8 kW Cu Kα ceramic X-ray tube and a PIXcel3D 2 ×
2 area detector, operating at 45 kV and 40 mA. Specimens for XRD measurements
were prepared by dropping a concentrated NC solution onto a silicon
zero-diffraction single crystal substrate. The diffraction patterns
were collected under ambient conditions using a parallel beam geometry
and the symmetric reflection mode. XRD data analysis was conducted
using the HighScore 4.1 software from PANalytical.
Zhu D., Zaffalon M.L., Pinchetti V., Brescia R., Moro F., Fasoli M., Fanciulli M., Tang A., Infante I., De Trizio L., Brovelli S, & Manna L. (2020). Bright Blue Emitting Cu-Doped Cs2ZnCl4 Colloidal Nanocrystals. Chemistry of Materials, 32(13), 5897-5903.
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9

X-ray Diffraction Analysis of Nanocrystals

Check if the same lab product or an alternative is used in the 5 most similar protocols
XRD analysis
was performed on a PANanalytical Empyrean X-ray diffractometer, equipped
with a 1.8 kW Cu Kα ceramic X-ray tube and a PIXcel3D 2 × 2 area detector, operating at 45 kV and 40 mA. Specimens
for the XRD measurements were prepared by drop-casting a concentrated
NC solution onto a quartz zero-diffraction single crystal substrate.
The diffraction patterns were collected under ambient conditions using
parallel beam geometry and symmetric reflection mode. XRD data analysis
was conducted using the HighScore 4.1 software from PANalytical.
Imran M., Caligiuri V., Wang M., Goldoni L., Prato M., Krahne R., De Trizio L, & Manna L. (2018). Benzoyl Halides as Alternative Precursors for the Colloidal Synthesis of Lead-Based Halide Perovskite Nanocrystals. Journal of the American Chemical Society, 140(7), 2656-2664.
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10

X-ray Diffraction Analysis of Nanocrystal Solutions

Check if the same lab product or an alternative is used in the 5 most similar protocols
XRD analysis was performed
on a PANanalytical Empyrean X-ray diffractometer, equipped with a
1.8 kW Cu Kα ceramic X-ray tube and a PIXcel3D 2 × 2 area
detector, operating at 45 kV and 40 mA. Concentrated NC solutions
were drop-cast on a zero-diffraction single crystal substrate in glovebox
and then collected under ambient conditions and room temperature.
XRD data were analyzed by the HighScore 4.1 software from PANalytical.
Zhu D., Bellato F., Bahmani Jalali H., Di Stasio F., Prato M., Ivanov Y.P., Divitini G., Infante I., De Trizio L, & Manna L. (2022). ZnCl2 Mediated Synthesis of InAs Nanocrystals with Aminoarsine. Journal of the American Chemical Society, 144(23), 10515-10523.
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