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Jsm 5300 scanning microscope

Manufactured by JEOL
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Sourced in Japan

The JSM 5300 Scanning Microscope is a high-performance electron microscope designed for materials analysis and characterization. It provides high-resolution imaging and analytical capabilities for a wide range of samples. The JSM 5300 utilizes a thermionic electron gun to generate the electron beam, which is then focused and scanned across the sample surface to produce detailed images and data.

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JSM-5300 (72 citations) JSM-5300 scanning electron microscope (21 citations) JSM-5300 microscope (4 citations)

2 protocols using jsm 5300 scanning microscope

1

Scanning Electron Microscopy of Tablet Surfaces

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In order to illustrate the difference in surface topography of successive layers, the optimized bilayer tablet was transversely sectioned and examined under the scanning electron microscope. Sections were positioned on a sample holder (JEOL JSM 5300 Scanning Microscope, Tokyo, Japan). Samples were gold coated for 30 min (JEOL JFC 1100e Sputtering device, Tokyo, Japan) and images were obtained at (25 KeV × 350, 30 KeV × 100, 30 KeV × 500).
Georgy K.R., Farid R.M., Latif R, & Bendas E.R. (2018). A new design for a chronological release profile of etodolac from coated bilayer tablets: In-vitro and in-vivo assessment. Journal of Advanced Research, 15, 37-47.
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2

Wear-Induced Structural Analysis

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After the wearing test was done, the specimens were subjected to SEM (JEOL JSM-5300 scanning microscope) to detect any change in the structure by comparing them with the samples that were not subjected to wearing.
Soliman T.A., Tubaigy K.M., Raffat E.M, & Al-Agha E.I. (2015). In Vitro Solubility and Wear Rates of Silorane and Dimethacrylate Resin Based Composite Restorative Materials under Different pH Conditions. Journal of International Oral Health : JIOH, 7(Suppl 1), 9-13.
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