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Uv vis spectrometer

Manufactured by Hitachi
Sourced in Japan

The UV-vis spectrometer is a laboratory instrument used to measure the absorption or transmission of light in the ultraviolet and visible regions of the electromagnetic spectrum. It consists of a light source, a monochromator, a sample compartment, and a detector. The instrument is designed to analyze the composition and concentration of various substances by measuring the interaction between the sample and the incident light.

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4 protocols using uv vis spectrometer

1

Spectrophotometric Absorption Analysis

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UV-visible absorption measurements were carried out on U-4100 spectrophotometer HITACHI UV-vis spectrometer, with a scan rate of 500 nm/min.
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2

Comprehensive Characterization of Conjugated Nanoparticles

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UV-vis spectra (400–700 nm, 1 nm resolution) of the conjugated dispersed in PBS (1 mg ml–1) were recorded in 1 cm quartz cells with a U-3000 Hitachi, UV-vis spectrometer.
Infrared spectra (from 4000 to 500 cm–1) of the samples were collected with Perkin Elmer Spectrum One with Ge/Ge UATR.
For transmission electron microscopy (TEM) characterization, a 4 μl droplet of nanoparticles suspension was placed on a plain carbon-coated copper TEM grid and allowed to evaporate in air under ambient laboratory conditions for several hours. Bright field TEM images were obtained using a TEM (Philips CM12, FEI Ltd, UK) operating at 80 kV, fitted with an X-ray microanalysis detector (EM-400 Detecting Unit, EDAX UK) utilising EDAX's Genesis software. Typical magnification of the images was ×100 000. Images were recorded using a SIS MegaView III digital camera (SIS Analytical, Germany) and analyzed with the software ImageJ; the diameter of at least 150 particles for each synthetic condition was determined.
Thermogravimetric analysis (TGA) was performed using a Stanton Redcroft, STA-780 series TGA; data were recorded from 25 to 600 °C with a constant heating rate of 10 °C per minute.
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3

Characterization of RSFC-CDs Nanoparticles

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The morphological features, structural details and atomic lattice fringes of RSFC-CDs were measured using transmission electron microscopy (TEM; Tecnai G220, FEI Company, Hillsboro, OR, USA) and high-resolution TEM (HRTEM; JEN-1230, Japan Electron Optics Laboratory, Tokyo, Japan). The X-ray diffraction (XRD) pattern was characterized with a D8 DISCOVER Plus X-ray Diffractometer (Bruker AXS, Karlsruhe, Germany) with Cu K α radiation. The fluorescent performances and ultraviolet-visible (UV-vis) absorption spectra of RSFC-CDs were studied using a fluorescence spectrophotometer (F-4500, Hitachi, Tokyo, Japan) and a UV-vis spectrometer (CECIL, Cambridge, UK). Fourier transform infrared (FTIR) spectroscopy was performed to identify characteristic chemical bonds and functional groups with a FTIR spectrophotometer (Thermo Fisher Scientific, CA, USA). Through X-ray photoelectron spectroscopy (XPS), the surface composition of RSFC-CDs was examined using an X-ray photoelectron spectrometer (ESCALAB 250Xi, Thermo Fisher Scientific, MA, USA) with a mono X-ray source Al Kα 150 W.
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4

Synthesis and Characterization of Polyester Fabrics

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Polyester fabrics (plain weave, wrap/weft density 54/48 yarn/cm) were obtained from Zhejiang Xinfa Dyeing and Finishing Company. N,N-Di(β-methoxycarbonylethyl)aniline, N,N-diacetoxyethyl-aniline, N-acetoxyethyl-N-cyanoethyl-aniline, N-benzoyloxyethyl-N-cyanoethyl-aniline, and 3-amino-5-nitro [2,1] benzisothiazole of industrial grade were obtained from Zhejiang Wanfeng Chemical Company, Shaoxing, China. Other chemicals used were obtained from the Shanghai Chemical Reagent Plant, Shanghai, China. All Chemicals were used as received without further purification.
Fourier-transformed infrared (FTIR) spectra were measured using a Spectrum Two FT-IR spectrometer (PerkinElmer Inc., Llantrisant, UK) scanning between 4000 and 500 cm−1. Proton nuclear magnetic resonance (1H-NMR) was recorded on a Bruker AV 400 (Bruker Co., Faellanden, Switzerland), using dimethylsulphoxide-d6 (DMSO-d6) as solvents at 25 °C. Visible absorption spectra were measured using a UV-vis spectrometer (Hitachi Limited, Japan). Melting points were measured using the open capillary method with a Mel-Temp capillary melting point apparatus (Shanghai Precision and Scientific Instruments, China). MS analysis was performed on a Waters XEVO-TQD QCA1056 Series LCMS system.
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