Agilent SuperNova diffractometer
Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2012 ▶ ) Tmin = 0.562, Tmax = 1.000
11538 measured reflections
2135 independent reflections
1339 reflections with I > 2σ(I)
Rint = 0.024
The SuperNova diffractometerAbsorption is a versatile lab equipment designed for X-ray diffraction analysis. It provides precise measurement of X-ray absorption and scattering properties of samples. The core function of this equipment is to capture and analyze diffraction patterns generated by the interaction of X-rays with the sample material.
Agilent SuperNova diffractometer
Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2012 ▶ ) Tmin = 0.562, Tmax = 1.000
11538 measured reflections
2135 independent reflections
1339 reflections with I > 2σ(I)
Rint = 0.024
Agilent SuperNova diffractometer
Absorption correction: gaussian (CrysAlis PRO; Agilent, 2014 ▸ ) Tmin = 0.942, Tmax = 0.975
38067 measured reflections
5542 independent reflections
4362 reflections with I > 2σ(I)
Rint = 0.054
Agilent SuperNova diffractometer
Absorption correction: numerical (CrysAlis PRO; Agilent, 2012 ▶ ) Tmin = 0.772, Tmax = 0.898
2532 measured reflections
1216 independent reflections
1077 reflections with I > 2σ(I)
Rint = 0.022
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