AFM was performed on a NTEGRA Spectra (NT-MDT, Russia) in semicontact (tapping) mode using standard Si tips (RTESPA-300, Bruker, USA).
Rtespa 300
Manufactured by Bruker
Sourced in United States, France
The RTESPA-300 is a high-performance atomic force microscope (AFM) system designed for advanced nanoscale imaging and characterization. It features a closed-loop scanner with a large scan range, enabling high-resolution topographical and phase imaging of a wide variety of sample types. The RTESPA-300 is equipped with a variety of interchangeable probe types to accommodate diverse applications.
Automatically generated - may contain errors
Lab products found in correlation
Dimension icon, by Bruker (5 mentions)
Nanoscope 5 controller, by Bruker (4 mentions)
Dimension icon afm, by Bruker (3 mentions)
Multimode nanoscope 4 system, by Bruker (3 mentions)
Multimode 8, by Bruker (3 mentions)
Multimode 8 afm microscope, by Bruker (2 mentions)
Multimode afm nanoscope 4 system, by Bruker (2 mentions)
Su8010, by Hitachi (1 mentions)
Dimension 3100, by Digital Instruments (1 mentions)
Innova microscope, by Bruker (1 mentions)
Nanoscope 5, by Bruker (1 mentions)
Pfqnm smpkit 12m, by Bruker (1 mentions)
Multimode spm, by Bruker (1 mentions)
Completeease software, by J.A. Woollam Co. (1 mentions)
Scanasyst air hr probe, by Bruker (1 mentions)
Dimension icon, by Veeco (1 mentions)
Nanoscope iiia multimode afm, by Veeco (1 mentions)
Gfp trap magnetic agarose, by Proteintech (1 mentions)
Vhx 500, by Keyence (1 mentions)
Fast scan microscope, by Bruker (1 mentions)
41 protocols using rtespa 300
1
Atomic Force Microscopy Imaging
2
Atomic Force Microscopy of Corroded Surfaces
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
An MFP-3D Infinity AFM (Asylum, Oxford, Santa Barbara, CA, USA) was used for the topographical analysis of the as-made and corroded WE surfaces. An etched silicon probe (Bruker, RTESPA-300, 8 nm nominal tip radius, 40 N/m spring constant, Billerica, MA, USA) with a set point of 3 V and a scan speed of 0.3 Hz was used for tapping mode measurements.
3
Characterization of AuNP Morphology by AFM
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The samples were observed using a FE-SEM Hitachi SU8010 at 1kV. The images were collected with the SE-in lens detector.
Atomic Force Microscopy (AFM) Atomic Force Microscopy Multimode Nanoscope ӀV from Bruker (Palaiseau, France) was used to characterize the AuNP samples deposited on silicon wafers. The AuNP samples were prepared with depositions times of 20, 40, and 60s and dried. To probe the samples' topography, tapping mode in dry state was selected using etched silicon tips (RTESPA-300 from Bruker; having a spring constant "k" of around 40 Nm 1). The images were obtained preferably along the fast scan axis at a scan rate of 0.75 Hz with a resolution of 256x256 pixels. The data analysis was performed using NanoScope Analysis Software (version 1.7). The silicon wafers were previously cleaned by dipping in 50% (v/v) ethanol/water mixture for 15 min, followed by activation using a plasma cleaner for 3 min before their use.
Atomic Force Microscopy (AFM) Atomic Force Microscopy Multimode Nanoscope ӀV from Bruker (Palaiseau, France) was used to characterize the AuNP samples deposited on silicon wafers. The AuNP samples were prepared with depositions times of 20, 40, and 60s and dried. To probe the samples' topography, tapping mode in dry state was selected using etched silicon tips (RTESPA-300 from Bruker; having a spring constant "k" of around 40 Nm 1). The images were obtained preferably along the fast scan axis at a scan rate of 0.75 Hz with a resolution of 256x256 pixels. The data analysis was performed using NanoScope Analysis Software (version 1.7). The silicon wafers were previously cleaned by dipping in 50% (v/v) ethanol/water mixture for 15 min, followed by activation using a plasma cleaner for 3 min before their use.
4
AFM Tapping Mode Measurements
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The AFM measurements were performed in tapping mode (drive frequency: ~287 kHz) with a probe composed of Sb-doped Si (Bruker, RTESPA-300, tip radius: ~8 nm, spring constant of the cantilever: ~40 N/m, resistivity: ~0.01–0.025 Ωcm).
5
Atomic Force Microscopy Imaging of Nanoparticles
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
A dispersion of NP (10 µL) was drop cast on freshly cleaned mica substrates and air-dried. To image the blank and loaded NPs obtained from EDE, Cyrene or PEG 400 method, a Dimension 3100 (Digital Instruments, Veeco, Santa Barbara, CA) equipped with a Nanoscope IV controller as well as a JPK-Nanowizard (JPK BioAFM, Bruker Nano, Berlin, Germany) was used. Standard tapping mode silicon cantilevers from Bruker (model RTESPA 300, Bruker, Santa Barbara, CA) with a resonance frequency around 300 kHz in air, a spring constant in the range of 20 to 80 N/m, and a tip radius of less than 10 nm (typically 7 nm) were used for height imaging.
6
Cleaved KBr Crystals for AFM Imaging
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
KBr single crystals (10 mm × 10 mm × 50 mm, International Crystal Laboratories, NJ, USA) were cleaved to 0.3–0.5 cm2 immediately prior to use. AFM imaging was conducted in tapping mode using a tip with a 40 N/m cantilever (RTESPA-300, Bruker) using as small a drive amplitude as possible to minimize tip/surface interactions. Images were processed using Gwyddion (v 2.55, http://gwyddion.net/ ) to plane flattened and row aligned (median of differences or polynomial 4) after masking crystallites. Time-lapse videos were made by creating stacks in Image J (1.47 v, http://imagej.nih.gov/ij ) and aligning by common fiducial features (plugin: NMS_fixTranslation_ver1.ijm, 2014, Nicholas M. Schneider).
7
Soft Material Surface Topography Analysis
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The surface topography on the NSs soft material was investigated by means of atomic force microscopy (Bruker Corp. INNOVA microscope) by using etched Si probes (Bruker RTESPA-300, Billerica, MA, USA) with nominal spring constant of 40
−1 and tip radius of 8 . The measurements were performed in tapping mode with a resonance frequency of 230 and scanning rate of
. The analysis of the AFM micrographs was carried out by the freeware Gwyddion. The plane inclination was corrected by fitting a plane through three points on the optically flat mesas and by setting the scale zero position at the same level.
−1 and tip radius of 8 . The measurements were performed in tapping mode with a resonance frequency of 230 and scanning rate of
. The analysis of the AFM micrographs was carried out by the freeware Gwyddion. The plane inclination was corrected by fitting a plane through three points on the optically flat mesas and by setting the scale zero position at the same level.
8
Atomic Force Microscopy of Protein Samples
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Aliquots (20 μL) of solution at different incubation periods were pipetted onto a freshly cleaved mica surface and kept for 30 min in a wet cell to avoid evaporation. Subsequently, the mica surface was rinsed twice with 20 µL Milli-Q water by first keeping the water on the mica surface for 2 min and then removal of the water using a rubber suction bulb. AFM was carried out under the dry condition in the tapping mode using Si cantilevers with a tip radius of 8–12 nm and 40 N/m force constant (model RTESPA-300, Bruker, Camarillo, CA, USA) at about 300 kHz on a Dimension ICon AFM with a Bruker Nanoscope V controller (Digital Instruments, Goleta, CA, USA).
9
Topographical Analysis of WE Surfaces
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
A topographical analysis of the as-made and corroded WE surfaces was performed using an MFP-3D Infinity AFM (Asylum, Oxford, Santa Barbara, CA, USA). Tapping mode measurements were performed using an etched silicon probe (Bruker, RTESPA-300, 8 nm nominal tip radius, 40 N/m spring constant, Billerica, MA, USA) with a set point of 3 V and a scan speed of 0.3 Hz.
10
Atomic Force Microscopy of Mucus Samples
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
AFM images of the mucus samples
were collected using multimode scanning probe microscopy with a Nanoscope
V, MultiMode 8 (Bruker), and silicon cantilevers with a nominal resonance
frequency of 300 kHz (RTESPA-300, Bruker, USA). Tapping mode with
a cantilever force constant of 30 N/m (calibrated using the Sader
method) and oscillation amplitude of approximately 14–40 nm
(some images required higher oscillation amplitudes) was used to image
the mucus samples with a scan rate of 1 Hz. The images show the topography
channel; amplitude and phase are not shown as they did not provide
relevant information. All images were obtained at room temperature.
were collected using multimode scanning probe microscopy with a Nanoscope
V, MultiMode 8 (Bruker), and silicon cantilevers with a nominal resonance
frequency of 300 kHz (RTESPA-300, Bruker, USA). Tapping mode with
a cantilever force constant of 30 N/m (calibrated using the Sader
method) and oscillation amplitude of approximately 14–40 nm
(some images required higher oscillation amplitudes) was used to image
the mucus samples with a scan rate of 1 Hz. The images show the topography
channel; amplitude and phase are not shown as they did not provide
relevant information. All images were obtained at room temperature.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!