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Sigma 03 39 field emission scanning electron microscope

Manufactured by Zeiss
Sourced in Germany

The SIGMA 03-39 Field Emission Scanning Electron Microscope is a high-performance laboratory instrument designed for advanced imaging and analysis of materials at the nanoscale. It utilizes a field emission electron source to produce a high-brightness, high-resolution electron beam for detailed investigation of surface topography and composition.

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2 protocols using sigma 03 39 field emission scanning electron microscope

1

SEM Imaging of Lyophilized Samples

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Suspensions of lyophilized samples in distilled water were diluted, dropped onto aluminum stubs, and dried for 48 h under vacuum. In order to induce electrical conduction, samples were coated with a fine layer of gold under vacuum, using a sputter coater. Coated samples were analyzed on a ZEISS SIGMA 03-39 Field Emission Scanning Electron Microscope at 5–15 kV acceleration voltage under an argon atmosphere.
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2

SEM Characterization of Lyophilized Samples

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Lyophilized samples were re-dispersed in distilled water and a drop of each sample was placed on aluminium stubs and dried for 48 h. Solid samples were mounted on double sided carbon tape. In order to induce electrical conduction, samples were coated in a vacuum with a fine layer of gold using a sputter coater. Each sample was then analysed on a SIGMA 03-39 field emission scanning electron microscope (Zeiss, Jena, Germany) at 5–15 kV acceleration voltage under an argon atmosphere.
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