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Nanosem

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The NanoSEM is a scanning electron microscope (SEM) designed for high-resolution imaging of nanoscale materials and structures. It utilizes a focused electron beam to scan the surface of a sample, producing detailed images that reveal the topography and composition of the specimen at the nanometer scale. The NanoSEM is capable of visualizing a wide range of materials, including metals, semiconductors, and biological samples, making it a valuable tool for research and development in fields such as materials science, nanotechnology, and life sciences.

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7 protocols using nanosem

1

Synthesis and Characterization of Modified and Spherical Calcium Carbonate

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A modified gas diffusion method was used to prepare mCaCO3 and sCaCO3. At first, CaCl2∙2H2O (5 mM) and TEP (3 mM) were dissolved in 40 mL anhydrate ethanol in a fresh and smooth glass bottle, which was sealed with parafilm with five pinholes. The bottle was put in a container, and then a plentiful amount of NH4HCO3 powder was evenly paved outside the bottle at the bottom of the container, and finally the container was sealed. After static incubation at room temperature for 7 days, the product mCaCO3 was collected by centrifugation, and washed with anhydrate ethanol for 3 times, and then freshly used for the preparation of porous membrane. sCaCO3 was synthesized by a similar method in the absence of TEP.
The morphologies and sizes of mCaCO3 and sCaCO3 were observed on scanning electron microscopes (Apero/Nova NanoSEM, FEI) and on a transmission electron microscope (Tecnai TF20, FEI). The composition was detected by Fourier transform infrared spectroscopy (Nexus 670, Thermo-Nicolet), Raman spectroscopy (Renishaw inVia Raman Microscope), X-ray diffraction (Ultima IV, Rigaku). The content of water was measured by thermogravimetric analysis (TGA) using a thermogravimetric analyzer (Q200, TA).
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2

Oxide Nanoflake Device Fabrication

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Oxides nanoflakes were transferred from mica to Si/SiO2 substrates via poly(methyl methacrylate)-assisted method. Then, devices were defined by standard e-beam lithography (FEI NanoSEM). 5 nm Ti and 60 nm Au were deposited by e-beam evaporation to be adopted as the contact electrodes. For vertical devices, 20 nm Au was used for bottom electrodes. Two-electrode testings were carried out on a probe station (Lakeshore TTP4) equipped with a vacuum pump and Keithley 4200 semiconductor analyzer. Magneto-transport measurements were conducted by four-probe electrical measurements in a commercial physical property measurement system (DynaCool, Quantum Design) with magnetic field vertical to the sample and temperature from 260 K to 360 K.
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3

Nanofiber Mesh Platinum Sputter Coating

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Samples of only nanofiber meshes were directly sputter coated with a thin platinum sputter coating layer (Cressington 208 HR, UK) for 120 s. All specimens were examined under the scanning electron microscope (Nova NanoSEM, FEI, USA) at an accelerating voltage of 10 kV and images were quantified by Image J software.
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4

Electron Microscopy Sample Preparation

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Electrodes were fixed in glutaraldehyde 2.5% over-night, dehydrated by immersion in a series of ethanol solutions (40, 60, 80, and 100% ethanol in ultra-pure water), critical point dried, and sputtered with gold for the observation by SEM. Samples were observed in a FEI-NOVA Nano SEM at an accelerating voltage of 5 kV.
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5

High-Resolution Scanning Electron Microscopy

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Samples were investigated with a high-resolution scanning electron microscope (Nova NanoSEM) manufactured by FEI with a nominal maximum resolution of 1 nm.
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6

Optical and Structural Characterization of Oligomer Nanoparticles

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Optical properties of oligomer
nanoparticles and silver-decorated
oligomer nanoparticles were characterized by a UV–vis spectrophotometer
(Carry, UV–vis) and a florescence spectrophotometer (Carry
Eclipse Florescent Spectrophotometer). The morphologies of oligomer
and silver nanoparticle were investigated using focused ion beam scanning
electron microscopy (FEI, NanoSEM) and transmission electron microscopy
(FEI Technai G2 F30). Determination of the size distribution and average
diameter of nanoparticles with respect to their hydrodynamic sizes
were carried out via dynamic light scattering (DLS) measurements (Malvern
Nano-ZS Zetasizer). Chemical and elemental analysis of nanoparticles
were determined using X-ray photoelectron spectroscopy (XPS) (Thermo
Fisher Scientific). Measurements were performed with a spot size of
∼400 μm, 30 eV pass energy, and 0.1 eV step size. The
powder X-ray diffraction system (X’pert pro MPD (PANalytical))
to study the XRD patterns of the hybrid materials.
All chemicals
and solvents were purchased from Sigma Aldrich Chemical
Co. (Germany), including silver nitrate salt. Detailed synthesis and
characterization of the oligomer were reported in our previous publications.30 (link),33 (link)
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7

Synthesis and Characterization of SnSe Nanoparticles

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Synthesis of SnSe NPs: SnSe NPs were grown inside a horizontal tube furnace with a 5 cm diameter quartz tube. SnSe powder (99.999%, Alfa Aesar) was placed at the center of the furnace in a quartz boat, and the freshly cleaved mica substrates were placed downstream at certain locations to maintain the deposition temperature in the range 350-450 °C. The quartz tube was pumped and refilled with ultra-pure argon gas more than three times to reduce oxygen contamination, and then the furnace was heated to 650 °C in 17 min, and kept at this temperature for 5 min with a low growth pressure and an argon flow rate of 200 standard cubic centimeters per minute (sccm).
After that, the furnace was cooled down to room temperature naturally. Angle-resolved conductivity measurement: The SnSe NPs from mica substrate were transferred to a 300 nm SiO 2 /Si substrate, where pre-patterned markers had been defined. [22] Then, PMMA (ethyl lactate, 950 kMW) of about 280 nm in thickness was spun on the substrate and baked at 170° for 5 min. Later, the star-shaped 12 electrodes (220 nm Au) were defined on a SnSe NP by electron-beam lithography (FEI NanoSEM), followed by development, thermal evaporation and lift-off processes. All electrical characterizations were performed using a Keithley 4200 semiconductor parameter analyzer.
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