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Technics hummer 5 sputter coater

Manufactured by Anatech
Sourced in United States

The Technics Hummer V sputter coater is a laboratory equipment used for depositing thin films of materials onto various substrates. It utilizes a sputtering process to create these coatings. The core function of the Technics Hummer V is to facilitate the controlled deposition of thin films for research and analytical purposes.

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5 protocols using technics hummer 5 sputter coater

1

Characterizing Pollen Shell Interior

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To investigate the interior of the pollen shells, samples of RW pollen were mixed with dry ice to make them brittle and manually cracked in a mortar and pestle. Samples were then coated with gold and palladium (Technics Hummer V sputter coater, Anatech USA, CA, USA). The morphology of the raw and processed RW was examined by a scanning electron microscope (SEM) (Hitachi S-4300 E/N FESEM, NY, USA). Elemental analysis using PerkinElmer 2400 Series II CHNS/O Analyzer (PerkinElmer, Inc., Waltham, MA, USA) was also performed to quantify the amount of nitrogen remaining in RW. Percent nitrogen obtained from sample analysis was then multiplied by a factor of 6.25 to convert it into percent protein [1 (link)]. All measurements were conducted in triplicate.
Chemically processed RW pollens suspended in phosphate buffered saline (PBS) were counted using hemocytometer and an automated cell counter (Countess II FL automated cell counter, Thermo Fisher Scientific, Waltham, MA, USA) to determine the number of pollens present per milligram of the sample.
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2

Scanning Electron Microscopy of Ragweed Pollen

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To examine the interior of the RW shell, samples of RW pollen were manually cracked by grinding with dry ice, mounting on an aluminum stub, and coating with gold-palladium in a sputter coater (Technics Hummer V sputter coater, Anatech USA, CA, USA). The structure of RW was visualized with a scanning electron microscope (Hitachi S-4300 E/N FESEM, NY, USA). Carbon, hydrogen, and nitrogen content in the pollen samples were analyzed using PerkinElmer 2400 Series II CHNS/O Analyzer (PerkinElmer, Inc., Waltham, MA, USA). Protein percentage was calculated from total nitrogen content by multiplying it with a nitrogen-to-protein conversion factor of 6.25 (Atwe et al., 2014 (link)). All measurements were performed in triplicate.
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3

Characterizing Electrospun Fiber Scaffolds

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Electrospun fiber scaffolds were imaged via SEM to measure specimen thickness and ensure that fiber morphology was consistent among independently electrospun samples of each polymer. This was necessary since differences in fiber diameter, collection density, or alignment may confound TGA and mechanical testing results. Prior to SEM, all scaffolds were first coated with a 1-nm thick layer of gold-palladium using a Technics Hummer V sputter coater (Anatech Ltd., Denver, CO). Fibers were then imaged using a FEI Versa 3D DualBeam SEM (Hillsboro, OR) with a low accelerating voltage (2–4 kV) to avoid melting fibers while imaging.
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4

Characterizing Electrospun Fiber Scaffolds

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Electrospun fiber scaffolds were imaged via SEM to measure specimen thickness and ensure that fiber morphology was consistent among independently electrospun samples of each polymer. This was necessary since differences in fiber diameter, collection density, or alignment may confound TGA and mechanical testing results. Prior to SEM, all scaffolds were first coated with a 1-nm thick layer of gold-palladium using a Technics Hummer V sputter coater (Anatech Ltd., Denver, CO). Fibers were then imaged using a FEI Versa 3D DualBeam SEM (Hillsboro, OR) with a low accelerating voltage (2–4 kV) to avoid melting fibers while imaging.
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5

Fiber Diameter Analysis by SEM

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Since drug release from electrospun fibers can be affected by fiber diameter, scanning electron microscopy (SEM) was performed on all fiber scaffolds to characterize fiber diameter. In preparation for SEM, all electrospun fiber scaffolds were sputter coated with a 5 Å thick layer of platinum using a Technics Hummer V sputter coater (Anatech Ltd., Denver, NC). SEM was conducted using a FEI Versa 3D DualBeam SEM (Hillsboro, OR). Low accelerating voltages (2 – 5 kV) were used during SEM to prevent melting the polymer fibers while imaging. Fiber SEM images were analyzed using NIH ImageJ software (Bethesda, MD). Briefly, fiber cross-sectional diameters were measured in ImageJ, and the pixel length of this diameter was compared to the pixel length of the accompanying image scale bar to obtain a fiber diameter value. Three independently fabricated electrospun fiber scaffolds were imaged for each fiber group and 100 fiber diameters were analyzed in each fiber scaffold. Thus, a total of 300 fiber diameters were measured for each fiber treatment group.
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