Tecnai g2 f20 tem characterization

The size distribution of the FCDs was measured by a Tecnai G2 F20 TEM characterization (FEI, Hillsboro, OR, USA). Absorption spectra were determined on a Perkin-Elmer-Lambda 900 spectrometer (PerkinElmer, Waltham, MA, USA). FL spectra were measured on a FluoroMax-P spectrophotometer (Horiba Jobin Yvon, Paris, France). Infrared spectra (IR) were measured on a Prestige IR21 FTIR spectrometer (Shimadzu, Kyoto, Japan).

UV-Vis absorption spectra were measured on a Varian UV-Cary100 spectrophotometer (Varian Inc., Palo Alto, CA, USA). Infrared spectrum (IR) was determined on a Pristige IR21 FTIR spectrometer (Shimadzu, Kyoto, Japan). FL spectra were performed on a FluoroMax-P spectrophotometer (Horiba Jobin Yvon, Paris, France). Images of transmission electron microscopy (TEM) were collected by a Tecnai G2 F20 TEM characterization (FEI, Hillsboro, OR, USA). X-ray photoelectron spectra (XPS) were measured on a ESCALAB 250Xi (Thermo fisher Scientific, West Sussex, UK). The lifetime measurements were determined on an Edinburgh fls1000 FL spectrometer (Edinburgh Instruments Ltd, Livingston, UK). The absolute quantum yields were determined using an integrating sphere on a Japan Hamamatsu Quantum Yield Determination System C9920-02G (Hamamatsu Photonics Co., Ltd., Hamamatsu, Japan).